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RESEARCH PRODUCT

Polymer/metal hybrid multilayers modified Schottky devices

V. TorrisiFrancesco RuffinoFrancesco RuffinoIsodiana CrupiMaria Grazia GrimaldiGiovanni MarlettaG. Li DestriG. IsgròG. Isgrò

subject

Ideality factorMaterials sciencePhysics and Astronomy (miscellaneous)Layered systemNanoparticleSilicon GoldNanotechnologySingle-crystal substrates DepositionSubstrate (electronics)Poly-3-hexylthiopheneSettore ING-INF/01 - ElettronicaSettore FIS/03 - Fisica Della MateriaNanoparticleSputteringPolymer; Au nanoparticles; Schottky devicePolymerHybrid multilayerConductive polymerSpin coatingbusiness.industryBarrier heightSchottky diodeSputter depositionCurrent-voltage measurementSemiconducting siliconSchottky deviceOptoelectronicsSelf-assemblybusinessAu nanoparticles

description

Insulating, polymethylmethacrylate (PMMA), and semiconducting, poly(3-hexylthiophene) (P3HT), nanometer thick polymers/Au nanoparticles based hybrid multilayers (HyMLs) were fabricated on p-Si single-crystal substrate. An iterative method, which involves, respectively, spin-coating (PMMA and P3HT deposition) and sputtering (Au nanoparticles deposition) techniques to prepare Au/HyMLs/p-Si Schottky device, was used. The barrier height and the ideality factor of the Au/HyMLs/p-Si Schottky devices were investigated by current-voltage measurements in the thickness range of 1-5 bilayers. It was observed that the barrier height of such hybrid layered systems can be tuned as a function of bilayers number and its evolution was quantified and analyzed. © 2013 AIP Publishing LLC.

yearjournalcountryeditionlanguage
2013-11-04
10.1063/1.4829532http://www.scopus.com/record/display.url?eid=2-s2.0-84889785062&origin=inward