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RESEARCH PRODUCT
Hard X-ray resonant electronic spectroscopy in transition metal oxides
Jacques JupilleAkio KotaniP. Le FèvreD. ChandesrisTakayuki UozumiAntoine BarbierSylvie BourgeoisHélène MagnanW. Drubesubject
PhysicsNuclear and High Energy PhysicsAuger electron spectroscopyX-ray absorption spectroscopyValence (chemistry)XASOxidesElectronic structureElectron spectroscopyAuger spectroscopyCondensed Matter::Materials ScienceX-ray photoelectron spectroscopy32.80.Hd; 61.10.Ht; 71.20.BeCondensed Matter::Strongly Correlated ElectronsElectron configurationAtomic physicsValence electronPhotoemissionInstrumentationdescription
K-edge X-ray absorption and 2p-XPS spectra of 3d-element oxides present spectral features which cannot be explained within a simple one-electron model. These features reveal the fine electronic structure of transition metal (TM) oxides valence states resulting from hybridized TM-3d and O-2p states, and the correlations between these valence electrons. In this paper, we show how resonant electronic spectroscopy (resonant Auger or resonant photoelectron spectroscopy) around the TM K-edge can be used to interpret the structures of the threshold and, with the help of theoretical calculation, to determine the electronic configuration of the excited ion. Quadrupolar transitions towards localized 3d orbitals are hence detected and quantitatively characterized in the titanium K-edge prepeaks in TiO2 and in the Ni K-edge prepeaks in NiO by angular-dependent resonant KLL Auger measurements. Valuable information also seems to be available in the resonant behavior of 2p-XPS spectra of NiO and Fe2O3.
year | journal | country | edition | language |
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2005-07-01 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment |