Search results for " Memories"

showing 10 items of 30 documents

Threshold Voltage Variability of NROM Memories After Exposure to Ionizing Radiation

2012

Threshold voltage (V-th) behavior of nitride readonly memories (NROMs) was studied after irradiation with photons (gamma-and X-rays), light and heavy ions. Both programmed and nonprogrammed single cells were investigated. The data suggest that two main physical phenomena are contributing to V-th variation and that the V-th loss and the variability can be modeled by a Weibull statistics with a shape parameter k similar to 2.2 regardless of the irradiation species and total dose. The same peculiarities were found in large memory arrays, confirming the results from single-cell studies but with significantly larger statistics. Hence, once the irradiation dose is known, the V-th loss distributio…

Materials sciencePhotonbusiness.industryoxide-nitride-oxide (ONO)radiation hardnessFlash memoriesShape parameterElectronic Optical and Magnetic MaterialsThreshold voltageIonizing radiationNon-volatile memoryFlash memories nitride read-only memories (NROMs) oxide–nitride–oxide (ONO) radiation hardness.nitride read-only memories (NROMs)OptoelectronicsIrradiationElectrical and Electronic EngineeringbusinessRadiation hardeningWeibull distribution
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Effects of partial self-ordering of Si dots formed by chemical vapor deposition on the threshold voltage window distribution of Si nanocrystal memori…

2006

We study the role that the denuded zone around Si nanocrystals obtained by chemical vapor deposition plays on the fluctuations of the dot surface coverage. In fact, the capture mechanism of the silicon adatoms in the proximity of existing dots restricts the number of possible nucleation sites, the final dot size, and the dot position, thus driving the process toward partial self-order. We numerically evaluate the relative dispersion of surface coverage for several gate areas and compare the results to the fully random case. The coverage dispersion is related to the fluctuations from bit to bit of the threshold voltage window (Δ Vth) distribution of nanocrystal memories. The evaluations, com…

Materials scienceSiliconQuantum dotsbusiness.industryNucleationGeneral Physics and Astronomychemistry.chemical_elementWindow (computing)NanotechnologyChemical vapor depositionCondensed Matter::Mesoscopic Systems and Quantum Hall EffectSettore ING-INF/01 - Elettronicanon volatile memoriesSettore FIS/03 - Fisica Della Materiachemical vapor depositionThreshold voltageDistribution (mathematics)chemistryNanocrystalnanoelectronic devicesscaling lawsDispersion (optics)OptoelectronicsbusinessJournal of Applied Physics
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Memory cell structure integrated on semiconductor

2004

This invention relates to a memory cell Which comprises a capacitor having a ?rst electrode and a second electrode separated by a dielectric layer. Such dielectric layer com prises a layer of a semi-insulating material Which is fully enveloped by an insulating material and in Which an electric charge is permanently present or trapped therein. Such electric charge accumulated close to the ?rst or to the second electrode, depending on the electric ?eld betWeen the electrodes,therebyde?ningdifferentlogiclevels.

NULLMemory cellSi nanostructuresSilicon rich oxideSettore ING-INF/01 - ElettronicaCMOS technologynon volatile memories
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Distribution of the threshold voltage window in nanocrystal memories with Si dots formed by chemical vapor deposition: Effect of partial self-ordering

2004

Non volatile memories based on Si nanocrystals (Si-ncs) offer an important alternative to conventional floating gate devices, for the numerous potential advantages associated with the discrete-trap structures [1]. Isolated Si-ncs can be obtained by chemical vapor deposition (CVD) through a fully compatible CMOS process. So far, the main limitation for scaling the CVD Si-nc memories at sub-90 nm node is related to the expected fluctuation, from bit to bit, in the device threshold voltage (VTH), due to the spread in the sur- face fraction (Rdot) covered with Si dots [2]. The reason is the assumption that the dot position and the relative distance are fully random. It will be shown that the nu…

Non volatile memoriesSettore ING-INF/01 - Elettronica
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Ionizing radiation effects on Non Volatile Read Only Memory cells

2012

Threshold voltage (V-th) and drain-source current (I-DS) behaviour of nitride read only memories (NROM) were studied both in situ during irradiation or after irradiation with photons and ions. V-th loss fluctuations are well explained by the same Weibull statistics regardless of the irradiation species and total dose. Results of drain current measurements in-situ during irradiation with photons and ions reveal a step-like increase of I-DS with the total irradiation dose. A brief physical explanation is also provided.

Nuclear and High Energy PhysicsPhotonMaterials sciencebusiness.industrynitride read-only memories (NROM)Nitrideradiation hardnessFlash memoriesFlash memoryIonizing radiationThreshold voltageIonoxide/nitride/oxide (ONO)Terms—Flash memories nitride read-only memories (NROM) oxide/nitride/oxide (ONO) radiation hardness.Nuclear Energy and EngineeringOptoelectronicsIrradiationElectrical and Electronic EngineeringbusinessRadiation hardening
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Being Moved by Unfamiliar Sad Music Is Associated with High Empathy

2016

The paradox of enjoying listening to music that evokes sadness is yet to be fully understood. Unlike prior studies that have explored potential explanations related to lyrics, memories, and mood regulation, we investigated the types of emotions induced by unfamiliar, instrumental sad music, and whether these responses are consistently associated with certain individual difference variables. One hundred and two participants were drawn from a representative sample to minimize self-selection bias. The results suggest that the emotional responses induced by unfamiliar sad music could be characterized in terms of three underlying factors: Relaxing sadness, Moving sadness, and Nervous sadness. Re…

PREFERENCEPoison controlEmotional contagionAUTOBIOGRAPHICAL MEMORIES0302 clinical medicineindividual differencesbeing movedPsychologyGeneral Psychologyta515media_commonOriginal ResearchPERSONALITY05 social sciencesbeing moved3142 Public health care science environmental and occupational healthSadnessEMOTIONSFeelingta6131behavior and behavior mechanismsPsychologySocial psychologysadnesspsychological phenomena and processes515 Psychologymedia_common.quotation_subjectlcsh:BF1-990musiikkiENJOYMENTemotionEmpathyINDIVIDUAL-DIFFERENCESbehavioral disciplines and activities050105 experimental psychology03 medical and health sciencestunteetempatiamental disorders0501 psychology and cognitive sciencesmusicValence (psychology)empathyindividual differencesAutobiographical memoryfelt experienceNEGATIVE AFFECTMoodlcsh:Psychologyfelt experiencesMOODEXPERIENCE030217 neurology & neurosurgeryFrontiers in Psychology
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Key Contributions to the Cross Section of NAND Flash Memories Irradiated With Heavy Ions

2008

Heavy-ion irradiation of NAND flash memories under operating conditions leads to errors with complex, data-dependent signatures. We present upsets due to hits in the floating gate array and in the peripheral circuitry, discussing their peculiarities in terms of pattern dependence and annealing. We also illustrate single event functional interruptions, which lead to errors during erase and program operations. To account for all the phenomena we observe during and after irradiation, we propose an ldquoeffective cross section,rdquo which takes into account the array and peripheral circuitry contributions to the SEU sensitivity, as well as the operating conditions.

PhysicsNuclear and High Energy PhysicsHardware_MEMORYSTRUCTURESNAND FlashNAND gateHardware_PERFORMANCEANDRELIABILITYsingle event effectsHeavy ion irradiationradiation effects; single event effects; Floating gate memories; NAND FlashIonNuclear Energy and EngineeringGate arrayFloating gate memoriesradiation effectsElectronic engineeringIrradiationElectrical and Electronic EngineeringIEEE Transactions on Nuclear Science
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Direct evidence of secondary recoiled nuclei from high energy protons

2008

The production of secondary recoiled particles from interactions between high energy protons and microelectronics devices was investigated. By using NAND Flash memories, we were able to directly obtain analog information on recoil characteristics. While our results qualitatively confirm the role of nuclear reactions, in particular of those with tungsten, a quantitative model based on Monte Carlo and device-level simulations cannot describe the observed results in terms of recoils from proton-W reactions. © 2006 IEEE.

PhysicsNuclear reactionNuclear and High Energy Physicsbusiness.industryDirect evidencePhysics::Instrumentation and DetectorsMonte Carlo methodNAND gatechemistry.chemical_elementHigh energy protonsSingle event effectsTungstenFlash memorySpace radiationNuclear physicsRecoilNuclear Energy and EngineeringchemistryFloating gate memoriesMicroelectronicsElectrical and Electronic EngineeringAtomic physicsbusinessNuclear Experiment
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L'ape iblea dalla zagara all'edelweiss.Miscellanea per Giovanni Saverio Santangelo

2020

Il volume raccoglie testimonianze e scritti in memoria di Giovanni Saverio Santangelo, comparatista e francesista.

Settore L-FIL-LET/14 - Critica Letteraria E Letterature ComparateSettore L-LIN/03 - Letteratura FranceseComparative Literature Memories Literary StudiesSettore L-LIN/10 - Letteratura Inglese
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Autobiogrāfisko atmiņu par laulību dzimumatšķirības pēc laulības šķiršanas

2016

Pētījuma „Autobiogrāfisko atmiņu par laulību dzimumatšķirības pēc laulības šķiršanas” mērķis bija izpētīt autobiogrāfiskās atmiņas sievietēm un vīriešiem pēc laulības šķiršanas un atklāt, vai pastāv būtiskas atšķirības starp autobiogrāfiskajām atmiľām sievietēm un vīriešiem. Pētījumā piedalījās 60 respondenti, 30 sievietes un 30 vīrieši, kuriem ir šķirta laulība ar Latvijas Civillikuma Ģimenes tiesību daļas noteikumiem vai kuri ir laulības šķiršanas procesā, vecumā no 30 līdz 45 gadiem (M=38,13; SD= 4,47). Pētījumā piedalījās sievietes un vīrieši ar dažādu izglītības līmeni un dažādu nodarbinātību. Izlase tika veidota, pamatojoties uz respondentu pieejamību. Šī pētījuma veikšanai tika izman…

autobiogrāfiskās atmiņasdzimumatšķirībasgender differencesautobiographical memoriesPsiholoģijalaulības šķiršana
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