Search results for " microscopy"
showing 10 items of 1617 documents
Applications of near-field optics to the characterization of optoelectronics components
1997
In the race towards purely optical communications, the necessity of producing integrated components is linked to the requirement for the precise characteriza-tion of optoelectronic components. Near-field detection techniques meet this requirement, AFM (Atomic Force Microscopy), for instance, can provide the topography of a given sample. In conjunction with these new tools, several different kinds of near-field optical microscopes (NFOM) have appeared. They enable the characteriza-tion of the components with a resolution better than that imposed by the Rayleigh criterion. This is primarily due to the fact that they are sensitive to the evanescent waves. This document presents several areas r…
Single-shot slightly off-axis digital holographic microscopy with add-on module based on beamsplitter cube
2019
Slightly off-axis digital holographic microscopy (SO-DHM) has recently emerged as a novel experimental arrangement for quantitative phase imaging (QPI). It offers improved capabilities in conventional on-axis and off-axis interferometric configurations. In this contribution, we report on a single-shot SO-DHM approach based on an add-on module adapted to the exit port of a regular microscope. The module employs a beamsplitter (BS) cube interferometer and includes, in addition, a Stokes lens (SL) for astigmatism compensation. Each recorded frame contains two fields of view (FOVs) of the sample, where each FOV is a hologram which is phase shifted by π rads with respect to the other. These two …
Flexible drift-compensation system for precise 3D force mapping in severe drift environments
2011
The acquisition of dense 3D data sets is of great importance, but also a challenge for scanning probe microscopy (SPM). Thermal drift often induces severe distortions in the data, which usually constrains the acquisition of dense data sets to experiments under ultra-high vacuum and low-temperature conditions. Atom tracking is an elegant approach to compensate for thermal drift and to position the microscope tip with highest precision. Here, we present a flexible drift compensation system which can easily be connected to existing SPM hardware. Furthermore, we describe a 3D data acquisition and position correction protocol, which is capable of handling large and non-linear drift as typically …
Analysis of Optical Systems, Contrast Depth, and Measurement of Electric and Magnetic Field Distribution on the Object's Surface in Mirror Electron M…
2011
Abstract The contrast depth is analyzed as well, that is the sensitivity of electron mirror microscope to disorders of homogeneity on the object (local magnetic and electric fields, surface relief). Because of the latter ones, electron trajectories feel disturbances (electrons acquire additional increment velocity in radial and azimuthal directions), which leads to the shift of the observed point on the screen and, as a consequence, to the image contrast. Since the electron energy, when reflected, tends to zero, electrons are influenced by heterogeneities for a long time. It causes high sensitivity to heterogeneities, up to the crossing of electron trajectories (caustics are generated). The…
Common-path phase-shifting digital holographic microscopy: A way to quantitative phase imaging and superresolution
2008
We present an experimental setup useful for complex amplitude evaluation and phase image quantification of three-dimensional (3-D) samples in digital holographic microscopy (DHM). It is based on a common-path interferometric configuration performed by dividing the input plane in two contiguous regions and by placing a translation grating near to the Fourier plane. Then, complex amplitude distribution of the sample under test is recovered with phase-shifting standard method obtained by moving the grating using a linear motion stage. Some experimental results of an USAF resolution test are presented for different numerical aperture (NA) microscope lenses. In a second part, the proposed setup …
SMIM in reflection imaging mode
2019
We present reflective SMIM (initials incoming from Spatially-Multiplexed Interferometric Microscopy) as an extremely simple and low cost way to convert a standard white-light microscope into a holographic one working under reflection imaging mode.
Hilbert-Huang single-shot spatially multiplexed interferometric microscopy.
2018
Hilbert-Huang single-shot spatially multiplexed interferometric microscopy (H2S2MIM) is presented as the implementation of a robust, fast, and accurate single-shot phase estimation algorithm with an extremely simple, low-cost, and highly stable way to convert a bright field microscope into a holographic one using partially coherent illumination. Altogether, H2S2MIM adds high-speed (video frame rate) quantitative phase imaging capability to a commercially available nonholographic microscope with improved phase reconstruction (coherence noise reduction). The technique has been validated using a 20×/0.46 NA objective in a regular Olympus BX-60 upright microscope for static, as well as dynamic…
Aberration compensation for objective phase curvature in phase holographic microscopy: comment
2014
In a recent Letter by Seo et al. [Opt. Lett. 37, 4976 (2012)], the numerical correction of the quadratic phase distortion introduced by the microscope objective in digital holographic microscopy (DHM) has been presented. In this comment, we would like to draw to the attention of the authors and the readers in general that this approach could not be the optimal solution for maintaining the accuracy of the quantitative phase via DHM. We recall that the use of telecentric imaging systems in DHM simplifies the numerical processing of the phase images and produces more accurate measurements.
Resolution improvements in integral microscopy with Fourier plane recording
2016
Abstract: Integral microscopes (IMic) have been recently developed in order to capture the spatial and the angular information of 3D microscopic samples with a single exposure. Computational post-processing of this information permits to carry out a 3D reconstruction of the sample. By applying conventional algorithms, both depth and also view reconstructions are possible. However, the main drawback of IMic is that the resolution of the reconstructed images is low and axially heterogeneous. In this paper, we propose a new configuration of the IMic by placing the lens array not at the image plane, but at the pupil (or Fourier) plane of the microscope objective. With this novel system, the spa…
Shift-variant digital holographic microscopy: inaccuracies in quantitative phase imaging
2013
Inaccuracies introduced in quantitative phase digital holographic microscopy by the use of nontelecentric imaging systems are analyzed. Computer modeling of the experimental result shows that even negligible errors in the radius and center of curvature of the numerical compensation needed to get rid of the remaining quadratic phase factor introduce errors in the phase measurements; these errors depend on the position of the object in the field-of-view. However, when a telecentric imaging system is utilized for the recording of the holograms, the numerical modeling and experimental results show the shift-invariant behavior of the quantitative-phase digital holographic microscope.