Search results for "Atomic Force Microscopy"

showing 10 items of 208 documents

Direct measurement of forces between particles and bubbles

1999

One of the elementary stages of the flotation process is the formation of an aggregate between the particle and a bubble. This aggregate formation is governed by hydrodynamic, capillary and interparticle forces. During the last four years, techniques have been developed to measure directly the force between a colloidal particle and a bubble. These techniques are closely related to the development of atomic force microscopy. Advantages and possibilities, as well as limits and drawbacks are described.

Condensed Matter::Soft Condensed MatterAggregate (composite)Geochemistry and PetrologyColloidal particleChemistryAtomic force microscopyCapillary actionBubbleAnalytical chemistryParticleMechanicsGeotechnical Engineering and Engineering GeologyMeasure (mathematics)International Journal of Mineral Processing
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Towards the origin of the shear force in near-field microscopy

2001

The shear force from a gold or a graphite sample acting on an approaching near-field optical probe is studied in detail. The adiabatic and dissipative contributions to the force are clearly distinguished by monitoring the amplitude as well as the phase of the tip vibration when the tip approaches the surfaces. We also take into account that not only the damping and the resonance frequency but also the mass of the system changes when the tip approaches the surface. The relative strength of the contributions to the force varies differently but characteristically with the distance of the two samples, starting at a much larger distance in the case of graphite. The adiabatic contribution is lar…

Condensed matter physicsbusiness.industryChemistryElectrostatic force microscopeShear forceGeneral EngineeringGeneral Physics and AstronomyAtomic force acoustic microscopyConductive atomic force microscopyOpticsAmplitudeNear-field scanning optical microscopeAdiabatic processbusinessNon-contact atomic force microscopy
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Metal/Semiconductor Barrier Properties of Non-Recessed Ti/Al/Ti and Ta/Al/Ta Ohmic Contacts on AlGaN/GaN Heterostructures

2019

This paper compares the metal/semiconductor barrier height properties of non-recessed Ti/Al/Ti and Ta/Al/Ta contacts on AlGaN/GaN heterostructures. Both contacts exhibited a rectifying behavior after deposition and after annealing at temperatures up to 550 &deg

Control and OptimizationMaterials scienceAnnealing (metallurgy)Analytical chemistryEnergy Engineering and Power Technology02 engineering and technologylcsh:Technology01 natural sciencesCondensed Matter::Materials ScienceAlGaN/GaNTa/Al/TaTi/Al/Ti0103 physical sciencesElectrical and Electronic EngineeringEngineering (miscellaneous)Ohmic contact010302 applied physicslcsh:TBarrier heightRenewable Energy Sustainability and the Environmentbusiness.industryContact resistanceohmic contactsHeterojunctionConductive atomic force microscopyCondensed Matter::Mesoscopic Systems and Quantum Hall Effect021001 nanoscience & nanotechnologyMicrostructureOhmic contactSemiconductor0210 nano-technologybusinessEnergy (miscellaneous)HillockEnergies
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Early bone healing around implant surfaces treated with variations in the resorbable blasting media method. A study in rabbits.

2010

Objective: this study aimed to histomorphologically and histomorphometrically evaluate the in vivo response to three variations in the resorbable blasting media (RBM) surface processing in a rabbit femur model. Study Design: screw root form implants with 3.75 mm in diameter by 8 mm in length presenting four surfaces (n=8 each): alumina-blasted/acid-etched (AB/AE), bioresorbable ceramic blasted (TCP), TCP + acid etching, and AB/AE + TCP were characterized by scanning electron microscopy (SEM) and atomic force microscopy (AFM). The implants were placed at the distal femur of 8 New Zeland rabbits, remaining for 2 weeks in vivo. After sacrifice, the implants were nondecalcified processed to 30 …

Dental ImplantsMaterials scienceSurface PropertiesScanning electron microscopeAtomic force microscopymedicine.medical_treatmentBone healing:CIENCIAS MÉDICAS [UNESCO]OtorhinolaryngologyUNESCO::CIENCIAS MÉDICASDental EtchingMicroscopy Electron ScanningmedicineAnimalsSurgeryFemurFemurRabbitsDental EtchingImplantDental implantGeneral DentistryRock blastingBiomedical engineeringMedicina Oral Patología Oral y Cirugia Bucal
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Complex Ordering in Thin Films of Di- and Trifunctionalized Hexaalkoxytriphenylene Derivatives

1997

We have used pressure−area isotherms, X-ray diffraction, atomic force microscopy, and infrared dichroism to study Langmuir and Langmuir−Blodgett films of 2,3,6,7,10,11-hexaalkoxytriphenylenes which...

DiffractionCrystallographyLangmuirColloid and Surface ChemistryInfrared dichroismAtomic force microscopyChemistryGeneral ChemistryThin filmBiochemistryCatalysisJournal of the American Chemical Society
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Electric and dielectric properties of nanostructured stoichiometric and excess-iron Ni–Zn ferrites

2013

In this paper, we report a study of the effect of excess iron on structural, microstructural, electric and dielectric properties of the nanostructured Ni–Zn ferrites Ni1−xZnxFe2+zO4−δ of different compositions with x = 0, 0.3, 0.5, 0.7, 1 and z = 0, 0.1. The structural and microstructural properties are estimated from x-ray diffraction and atomic force microscopy (AFM) data. The average grain size, evaluated from AFM topographical analysis, is found to be below 70 nm. The samples exhibit low values of dielectric constant and dielectric loss and a high resistivity. Contrary to earlier conclusions regarding microstructured Ni–Zn ferrites, in nanostructured Ni–Zn ferrites sintered at relativel…

DiffractionMaterials scienceElectrical resistivity and conductivityAtomic force microscopyAnalytical chemistryDissipation factorDielectric lossDielectricCondensed Matter PhysicsMathematical PhysicsAtomic and Molecular Physics and OpticsStoichiometryGrain sizePhysica Scripta
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Preliminary results on the electrostatic double-layer force between two surfaces with high surface potentials

1998

Abstract The aim of this study is to measure interaction forces between surfaces with high electric potentials in aqueous electrolyte solutions. Therefore the force between a gold sample and a gold sphere attached to the end of an atomic force microscope cantilever was measured. Gold sample and sphere were electrically connected and served as the working electrode. A potential was applied via a platinized platinum electrode. Experimental results are compared to forces approximated with the Poisson-Boltzmann theory.

Double layer (biology)CantileverWorking electrodePhysics::Instrumentation and DetectorsAtomic force microscopyElectrostatic force microscopeSurface forceAnalytical chemistrychemistry.chemical_elementMolecular physicsColloid and Surface ChemistrychemistryElectrodePlatinumColloids and Surfaces A: Physicochemical and Engineering Aspects
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The thin and medium filters of the EPIC camera on-board XMM-Newton: measured performance after more than 15 years of operation

2016

After more than 15 years of operation of the EPIC camera on board the XMM-Newton X-ray observatory, we have reviewed the status of its Thin and Medium filters. We have selected a set of Thin and Medium back-up filters among those still available in the EPIC consortium and have started a program to investigate their status by different laboratory measurements including: UV/VIS transmission, Raman scattering, X-Ray Photoelectron Spectroscopy, and Atomic Force Microscopy. Furthermore, we have investigated the status of the EPIC flight filters by performing an analysis of the optical loading in the PN offset maps to gauge variations in the optical and UV transmission. We both investigated repea…

EPIC01 natural sciencesfilters; X-rays: instrumentation; X-rays: XMM-Newton; Astronomy and Astrophysics; Space and Planetary Science [X-rays]symbols.namesakeApparent magnitudeOpticsSettore FIS/05 - Astronomia E AstrofisicaObservatory0103 physical sciencesX-rays: XMM-NewtonStatistical analysis010306 general physics010303 astronomy & astrophysicsRemote sensingX-rays: instrumentationPhysicsbusiness.industryAtomic force microscopyX-rays: filterDetectorAstronomy and AstrophysicsAstronomy and AstrophysicOn boardSpace and Planetary SciencesymbolsbusinessRaman scattering
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Nanofabrication of TaS2 conducting layers nanopatterned with Ta2O5 insulating regions via AFM

2013

It is demonstrated how local oxidation nanolithography performed with an atomic force microscope (AFM-LON) may be successfully employed for the nanopatterning of insulating regions of Ta2O5 on TaS2 ultrathin metallic layers. This provides a simple approach for the fabrication of electronic devices, such as single-electron transistors, at the nanoscale.

FabricationNanolithographyMaterials sciencelawAtomic force microscopyTransistorMaterials ChemistryNanotechnologyGeneral ChemistryElectronicsLocal oxidation nanolithographyNanoscopic scalelaw.inventionJournal of Materials Chemistry C
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Nanomanufacturing/Nanotechnology

2008

This chapter provides comprehensive knowledge regarding the fabrication of nanoproducts and element of micro-electromechanical systems using various techniques and processes. Both well-established techniques, such as nanomachining (ultra-precision) and new trends in improving nanoprocesses taking into account AFM, laser beam machining, electron beam machining processes are overviewed. The background of nanomachining processes, including typical machining operations such as turning, milling and grinding and different construction materials (metallic and nonmetallic), is outlined. The physical mechanisms responsible for the transition from brittle to ductile regime machining are explained. Mo…

FabricationNanomanufacturingElectron beam machiningMachiningAtomic force microscopyComputer scienceSystem of measurementLaser beam machiningNanotechnologyGrinding
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