Search results for "CRO"

showing 10 items of 40106 documents

C-switches: Increasing switch radix with current integration scale

2011

In large switch-based interconnection networks, increasing the switch radix results in a decrease in the total number of network components, and consequently the overall cost of the network can be significantly reduced. Moreover, high-radix switches are an attractive option to improve the network performance in terms of latency, since hop count is also reduced. However, there are some problems related to the integration scale to design such single-chip switches. In this paper we discuss key issues and evaluate an interesting alternative for building high-radix switches going beyond the integration scale bounds. The idea basically consists in combining several current smaller single-chip swi…

010302 applied physicsInterconnectionComputer sciencebusiness.industry02 engineering and technologyKey issues01 natural sciencesPort (computer networking)020202 computer hardware & architectureHop (networking)0103 physical sciences0202 electrical engineering electronic engineering information engineeringElectronic engineeringNetwork performanceCrossbar switchbusinessComputer network
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Silicon Surface Passivation by ALD-Ga2O3: Thermal vs. Plasma-Enhanced Atomic Layer Deposition

2020

Silicon surface passivation by gallium oxide (Ga2O3) thin films deposited by thermal- and plasma-enhanced atomic layer deposition (ALD) over a broad temperature range from 75 °C to 350 °C is investigated. In addition, the role of oxidant (O3 or O-plasma) pulse lengths insufficient for saturated ALD-growth is studied. The material properties are analyzed including the quantification of the incorporated hydrogen. We find that oxidant dose pulses insufficient for saturation provide for both ALD methods generally better surface passivation. Furthermore, different Si surface pretreatments are compared (HF-last, chemically grown oxide, and thermal tunnel oxide). In contrast to previous reports, t…

010302 applied physicsKelvin probe force microscopeMaterials sciencePassivationSiliconAnnealing (metallurgy)OxideAnalytical chemistrychemistry.chemical_element02 engineering and technology021001 nanoscience & nanotechnologyCondensed Matter Physics01 natural sciencesElectronic Optical and Magnetic MaterialsAtomic layer depositionchemistry.chemical_compoundchemistry0103 physical sciencesElectrical and Electronic EngineeringThin film0210 nano-technologyUltraviolet photoelectron spectroscopyIEEE Journal of Photovoltaics
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Determination of Contact Potential Difference by the Kelvin Probe (Part II) 2. Measurement System by Involving the Composite Bucking Voltage

2016

Abstract The present research is devoted to creation of a new low-cost miniaturised measurement system for determination of potential difference in real time and with high measurement resolution. Furthermore, using the electrode of the reference probe, Kelvin method leads to both an indirect measurement of electronic work function or contact potential of the sample and measurement of a surface potential for insulator type samples. The bucking voltage in this system is composite and comprises a periodically variable component. The necessary steps for development of signal processing and tracking are described in detail.

010302 applied physicsKelvin probe force microscopeMaterials sciencesurface potentialbusiness.industrySystem of measurementPhysicsQC1-999Composite numberGeneral EngineeringGeneral Physics and Astronomy02 engineering and technology021001 nanoscience & nanotechnology01 natural sciencesOpticscontact potential differencekelvin probe0103 physical sciences0210 nano-technologybusinessVolta potentialVoltageLatvian Journal of Physics and Technical Sciences
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Polarity conversion of GaN nanowires grown by plasma-assisted molecular beam epitaxy

2019

International audience; It is demonstrated that the N-polarity of GaN nanowires (NWs) spontaneously nucleated on Si (111) by molecular beam epitaxy can be reversed by intercalation of an Al-or Ga-oxynitride thin layer. The polarity change has been assessed by a combination of chemical etching, Kelvin probe force microscopy, cathodo-and photoluminescence spectroscopy and transmission electron microscopy experiments. Cathodoluminescence of the Ga-polar NW section exhibits a higher intensity in the band edge region, consistent with a reduced incorporation of chemical impurities. The polarity reversal method we propose opens the path to the integration of optimized metal-polar NW devices on any…

010302 applied physicsKelvin probe force microscopePolarity reversalMaterials sciencePhysics and Astronomy (miscellaneous)Polarity (physics)business.industryNanowireCathodoluminescence02 engineering and technology021001 nanoscience & nanotechnology01 natural sciences7. Clean energyIsotropic etching[SPI.MAT]Engineering Sciences [physics]/MaterialsNanolithography0103 physical sciences[PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci][SPI.OPTI]Engineering Sciences [physics]/Optics / PhotonicOptoelectronics[PHYS.COND]Physics [physics]/Condensed Matter [cond-mat]0210 nano-technologybusinessMolecular beam epitaxy
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Object size effect on the contact potential difference measured by scanning Kelvin probe method

2010

International audience; Contact potential difference (CPD) was measured by macroscopic Kelvin probe instrument and scanning Kelvin probe microscope on Al, Ni and Pt on ITO substrates at ambient conditions. CPD values measured by scanning Kelvin probe microscope and macroscopic Kelvin probe are close within the error of about 10-30% for large studied objects, whereas scanning Kelvin probe microscope signal decreases, when the object size becomes smaller than 1.4 m. CPD and electric field signals measured using many-pass technique allowed us to estimate the influence of electrostatic field disturbance, especially, in the case of small objects.

010302 applied physicsKelvin probe force microscopeScanning Hall probe microscopeMicroscopeChemistrybusiness.industry02 engineering and technology021001 nanoscience & nanotechnologyCondensed Matter Physics01 natural sciencesSignalElectronic Optical and Magnetic Materialslaw.inventionScanning probe microscopyOpticslawElectric field0103 physical sciencesPhysical Sciences0210 nano-technologybusinessInstrumentationVolta potential
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Determination of Contact Potential Difference by the Kelvin Probe (Part I) I. Basic Principles of Measurements

2016

Abstract Determination of electric potential difference using the Kelvin probe, i.e. vibrating capacitor technique, is one of the most sensitive measuring procedures in surface physics. Periodic modulation of distance between electrodes leads to changes in capacitance, thereby causing current to flow through the external circuit. The procedure of contactless, non-destructive determination of contact potential difference between an electrically conductive vibrating reference electrode and an electrically conductive sample is based on precise control measurement of Kelvin current flowing through a capacitor. The present research is devoted to creation of a new low-cost miniaturised measuremen…

010302 applied physicsKelvin probe force microscopesurface potentialMaterials scienceCondensed matter physicsPhysicsQC1-999General EngineeringGeneral Physics and Astronomy01 natural sciencescontact potential differencekelvin probe0103 physical sciences010306 general physicsVolta potentialLatvian Journal of Physics and Technical Sciences
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Metallurgical Strategies for the Joining of Titanium Alloys with Steels

2018

010302 applied physicsMaterials science0103 physical sciencesMetallurgyTitanium alloyGeneral Materials Science02 engineering and technology021001 nanoscience & nanotechnology0210 nano-technologyCondensed Matter PhysicsMicrostructure01 natural sciencesAdvanced Engineering Materials
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Physical properties and microstructure characteristics of (1–x)BaTiO3–xCaTiO3 systems

2018

The study investigates the microstructure, thermal and mechanical properties of (1–x)BaTiO3–xCaTiO3 ((1–x)BT–xCT)) (x = 0.01, 0.04, 0.08) samples. The BT–CT system to be tested was formed as a soli...

010302 applied physicsMaterials science0103 physical sciencesThermalGeneral Materials Science02 engineering and technologyDielectricComposite material021001 nanoscience & nanotechnology0210 nano-technologyMicrostructure01 natural sciencesInstrumentationPhase Transitions
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Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM

2020

International audience; In this study, static and dynamic test methods were used to define the response of a self-refresh DRAM under thermal neutron irradiation. The neutron-induced failures were investigated and characterized by event cross-sections, soft-error rate and bitmaps evaluations, leading to an identification of permanent and temporarily stuck cells, block errors, and single-bit upsets.

010302 applied physicsMaterials science010308 nuclear & particles physicsNuclear engineering01 natural sciencesNeutron temperature[SPI.TRON]Engineering Sciences [physics]/Electronics0103 physical sciences[INFO.INFO-ES]Computer Science [cs]/Embedded SystemsNeutronIrradiation[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsDramBlock (data storage)Dynamic testing2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS)
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2018

CrN thin films with an N/Cr ratio of 95% were deposited by reactive magnetron sputtering onto (0 0 0 1) sapphire substrates. X-ray diffraction and pole figure texture analysis show CrN (1 1 1) epitaxial growth in a twin domain fashion. By changing the nitrogen versus argon gas flow mixture and the deposition temperature, thin films with different surface morphologies ranging from grainy rough textures to flat and smooth films were prepared. These parameters can also affect the CrN x system, with the film compound changing between semiconducting CrN and metallic Cr2N through the regulation of the nitrogen content of the gas flow and the deposition temperature at a constant deposition pressur…

010302 applied physicsMaterials scienceAcoustics and Ultrasonics02 engineering and technologyPole figure021001 nanoscience & nanotechnologyCondensed Matter PhysicsMicrostructure01 natural sciencesSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsElectrical resistivity and conductivitySputteringSeebeck coefficient0103 physical sciencesThermoelectric effectsense organsTexture (crystalline)Thin filmComposite material0210 nano-technologyJournal of Physics D: Applied Physics
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