Search results for "Diffraction"
showing 10 items of 1584 documents
LiCrO2 Under Pressure: In-Situ Structural and Vibrational Studies
2018
The high-pressure behaviour of LiCrO2, a compound isostructural to the battery compound LiCoO2, has been investigated by synchrotron-based angle-dispersive X-ray powder diffraction, Raman spectroscopy, and resistance measurements up to 41, 30, and 10 Gpa, respectively. The stability of the layered structured compound on a triangular lattice with R-3m space group is confirmed in all three measurements up to the highest pressure reached. The dependence of lattice parameters and unit-cell volume with pressure has been determined from the structural refinements of X-ray diffraction patterns that are used to extract the axial compressibilities and bulk modulus by means of Birch&ndash
CuInS2 Films for Photovoltaic Applications Deposited by a Low-Cost Method.
2006
We report an atmospheric-pressure deposition method for preparing well-adhered and compact CuInS 2 films. The precursor film is obtained by a solution-coating technique and is subjected to a low-cost and safe one-step reduction-sulfurization treatment. A maximum thickness of 300 nm is achieved per layer, and up to three layers were sulfurized at a time. The obtained films were characterized by X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM) and visible-near-infrared (vis-NIR) spectrophotometry.
CADEM: calculate X-ray diffraction of epitaxial multilayers
2017
This article presents a powerful yet simple program, based on the general one-dimensional kinematic X-ray diffraction (XRD) theory, which calculates the XRD patterns of tailor-made multilayers and thus enables quantitative comparison of measured and calculated XRD data. As the multilayers are constructed layer by layer, the final material stack can be entirely arbitrary.
Finite element analysis of laser shock peening of 2050-T8 aluminum alloy
2015
Laser shock processing is a recently developed surface treatment designed to improve the mechanical properties and fatigue performance of materials, by inducing a deep compressive residual stress field. The purpose of this work is to investigate the residual stress distribution induced by laser shock processing in a 2050-T8 aeronautical aluminium alloy with both X-ray diffraction measurements and 3D finite element simulation. The method of X-ray diffraction is extensively used to characterize the crystallographic texture and the residual stress crystalline materials at different scales (macroscopic, mesoscopic and microscopic).Shock loading and materials’ dynamic response are experimentally…
Degree of coherence: a lensless measuring technique.
2009
We present a technique for measuring the degree of coherence that is based on the self-imaging phenomenon. The technique is lensless, has multiplexing capabilities, and can work with high light throughput. Experimental verifications are given.
A step further in the comprehension of the magnetic coupling in gadolinium(III)-based carboxylate complexes
2013
Three new gadolinium(III) complexes of formula [Gd4(bta) 3(H2O)16]n·12nH2O (1), [Gd4(bta)3(H2O)12] n·18nH2O (2) and [Gd2(H 2bta)(bta)(H2O)2]n·4nH 2O (3) (H4bta = 1,2,4,5-benzenetetracarboxylic acid) have been synthesized and their structures determined by X-ray diffraction. 1 and 3 are three-dimensional compounds whereas 2 exhibits a two-dimensional structure. The ability of the bta4- to adopt different coordination modes accounts for these high dimensionalities although it precludes a rational structural design. The structures of 1-3 have in common the double oxo-carboxylate bridge between gadolinium(III) ions (μ-O: κ2O,O′) either as a discrete units (1 and 2) or as a chain (3) and one (3)…
<title>Laser-pulse-induced chemical reactions and surface patterning in Co-Si and Co-Ti-Si films: investigations by x-ray diffraction and atomi…
2001
X-ray diffraction patterns reflected from the laser treated crystalline CoSi2 layer, the measurements of surface electrical resistance and atomic force microscopy micrographs confirm the 'generation-diffusion-deformational instabilities' model of formation of defect ordered structures of various types. The CO2 laser induced decrease of the thermal coefficient of resistance to zero in Co-Ti-Si films is realized. X-ray diffraction studies of the treated films confirm that the obtained (alpha) changes with number of laser pulses are caused due to solid phase reaction Co + 2Si equals CoSi2 and 5Ti + 3Si equals Ti5Si3.© (2001) COPYRIGHT SPIE--The International Society for Optical Engineering. Do…
White-light-modified Talbot array illuminator with a variable density of light spots.
2008
A flexible array illuminator, comprising only two conventional optical elements, with a variable density of bright white-light spots is presented. The key to our method is to obtain with a single diffractive lens an achromatic version of different fractional Talbot images, produced by free-space propagation, of the amplitude distribution at the back focal plane of a periodic refractive microlens array under a broadband point-source illumination. Some experimental results of our optical procedure are also shown.
An XRD, TEM and Raman study of experimentally annealed natural monazite
2002
The healing of radiation damage in natural monazite has been experimentally studied in annealing experiments using XRD, TEM, Raman microprobe and cathodoluminescence analysis. The starting material was a chemically homogeneous monazite from a Brazilian pegmatite with a concordant U–Pb age of 474 ± 1 Ma and a U–Th/He age of 479 Ma. The monazite shows nm-scale defects induced by radioactive decay. The Xray pattern of the unheated starting material revealed two distinct monazite ''phases'' A and B with slightly different lattice parameters. Monazite A shows sharp reflections of high amplitudes and slightly expanded lattice parameters (1% in volume) compared to a standard monazite. Phase B exhi…
Investigating the performance of reconstruction methods used in structured illumination microscopy as a function of the illumination pattern's modula…
2016
Surpassing the resolution of optical microscopy defined by the Abbe diffraction limit, while simultaneously achieving optical sectioning, is a challenging problem particularly for live cell imaging of thick samples. Among a few developing techniques, structured illumination microscopy (SIM) addresses this challenge by imposing higher frequency information into the observable frequency band confined by the optical transfer function (OTF) of a conventional microscope either doubling the spatial resolution or filling the missing cone based on the spatial frequency of the pattern when the patterned illumination is two-dimensional. Standard reconstruction methods for SIM decompose the low and hi…