Search results for "Micro"

showing 10 items of 23412 documents

Fast-ADT: A fast and automated electron diffraction tomography setup for structure determination and refinement.

2020

Abstract Electron crystallography has focused in the last few years on the analyses of microcrystals, mainly organic compounds, triggered by recent publications on acquisition methods based on direct detection cameras and continuous stage tilting. However, the main capability of a transmission electron microscope is the access to features at the nanometre scale. In this context, a new acquisition method, called fast and automated diffraction tomography (Fast-ADT), has been developed in form of a general application in order to get the most of the diffraction space from a TEM. It consists of two subsequent tilt scans of the goniometric stage; one to obtain a crystal tracking file and a secon…

010302 applied physicsDiffractionMaterials scienceMicroscopeElectron crystallographybusiness.industryContext (language use)02 engineering and technology021001 nanoscience & nanotechnology01 natural sciencesAtomic and Molecular Physics and OpticsElectronic Optical and Magnetic Materialslaw.inventionDiffraction tomographyOpticsElectron diffractionlawGoniometer0103 physical sciences0210 nano-technologybusinessInstrumentationPowder diffractionUltramicroscopy
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Quasi-parallel precession diffraction: Alignment method for scanning transmission electron microscopes.

2018

Abstract A general method to set illuminating conditions for selectable beam convergence and probe size is presented in this work for Transmission Electron Microscopes (TEM) fitted with µs/pixel fast beam scanning control, (S)TEM, and an annular dark field detector. The case of interest of beam convergence and probe size, which enables diffraction pattern indexation, is then used as a starting point in this work to add 100 Hz precession to the beam while imaging the specimen at a fast rate and keeping the projector system in diffraction mode. The described systematic alignment method for the adjustment of beam precession on the specimen plane while scanning at fast rates is mainly based on …

010302 applied physicsDiffractionMaterials sciencebusiness.industryDetector02 engineering and technology021001 nanoscience & nanotechnology01 natural sciencesDark field microscopyAtomic and Molecular Physics and OpticsElectronic Optical and Magnetic Materialslaw.inventionOpticsElectron diffractionProjectorlaw0103 physical sciencesPrecessionElectron microscope0210 nano-technologybusinessInstrumentationBeam (structure)Ultramicroscopy
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Superparamagnetic recoverable flowerlike Fe3O4@Bi2O3 core–shell with g-C3N4 sheet nanocomposite: synthesis, characterization, mechanism and kinetic s…

2019

In the present research study, a simple method was developed for the synthesis of three-dimensional flowerlike Fe3O4@Bi2O3 core–shell with g-C3N4 sheet nanocomposites. The X-ray diffraction, Fourier transform infrared spectroscopy, scanning electronic microscopy, transmission electron microscope, vibrating sample magnetometer, dynamic laser scattering analyzer and UV–Vis diffuse reflection spectroscopy were employed for the characterization of structure, purity and morphology of the resultant samples. The degradation of indigo carmine as a model of organic dye pollutant is applied for photo-catalytic activity. The parameters which are affecting the efficiency of various parameters, such as;…

010302 applied physicsDiffractionNanocompositeMaterials scienceKineticsAnalytical chemistryElectronCondensed Matter Physics01 natural sciencesAtomic and Molecular Physics and OpticsElectronic Optical and Magnetic Materialsflowerlike Fe3O4@Bi2O3 core-shell g-C3N4 superparamagnetic photocatalysischemistry.chemical_compoundIndigo carminechemistryTransmission electron microscopySettore CHIM/03 - Chimica Generale E Inorganica0103 physical sciencesSettore CHIM/07 - Fondamenti Chimici Delle TecnologieElectrical and Electronic EngineeringFourier transform infrared spectroscopySuperparamagnetism
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A consistent path for phase determination based on transmission electron microscopy techniques and supporting simulations.

2018

This work addresses aspects for the analysis of industrial relevant materials via transmission electron microscopy (TEM). The complex phase chemistry and structural diversity of these materials require several characterization techniques to be employed simultaneously; unfortunately, different characterization techniques often lack connection to yield a complete and consistent picture. This paper describes a continuous path, starting with the acquisition of 3D diffraction data - alongside classical high-resolution imaging techniques - and linking the structural characterization of hard metal industrial samples with energy-loss fine-structure simulations, quantitative electron energy-loss (EE…

010302 applied physicsDiffractionOffset (computer science)Hard metalGeneral Physics and AstronomyStructural diversity02 engineering and technologyCell BiologyElectron021001 nanoscience & nanotechnology01 natural sciencesHard metalsStructural BiologyTransmission electron microscopy0103 physical sciencesGeneral Materials Science0210 nano-technologySpectroscopyBiological systemMicron (Oxford, England : 1993)
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Formation of dislocations and hardening of LiF under high-dose irradiation with 5–21 MeV 12C ions

2017

R. Zabels, I. Manika, J. Maniks, and R.Grants acknowledge the national project IMIS2, and A. Dauletbekova, M. Baizhumanov, and M. Zdorovets the Ministry of Education and Science of the Republic of Kazakhstan for the financial support.

010302 applied physicsEnergy lossMaterials sciencePhysics::Instrumentation and DetectorsAtomic force microscopyAstrophysics::High Energy Astrophysical PhenomenaPhysics::Medical Physicsmacromolecular substances02 engineering and technologyGeneral ChemistryNanoindentation021001 nanoscience & nanotechnology01 natural sciencesMolecular physicsIsotropic etchingElastic collisionIonPhysics::Plasma Physics0103 physical sciences:NATURAL SCIENCES:Physics [Research Subject Categories]Hardening (metallurgy)General Materials ScienceIrradiationAtomic physics0210 nano-technologyApplied Physics A
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Novel multipactor studies in RF satellite payloads: Single-carrier digital modulated signals and ferrite materials

2017

In this work it is reviewed the most novel advances in the multipactor RF breakdown risk assessment devoted to RF satellite microwave passive devices employed in space telecommunication systems. On one side, it is studied the effect of transmitting a single-carrier digital modulated signal in the multipactor RF voltage threshold in a coaxial line. On the other hand, an analysis of the multipactor phenomenon in a parallel-plate waveguide containing a magnetized ferrite slab it is presented.

010302 applied physicsEngineeringComputer simulationbusiness.industryElectrical engineering01 natural sciencesElectronic mailThreshold voltage0103 physical sciencesDigital modulationOptoelectronicsCoaxial lineFerrite (magnet)Ferrite materialsRadio frequencybusinessMicrowaveVoltageMultipactor
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Recent improvements on micro-thermocouple based SThM

2017

The scanning thermal microscope (SThM) has become a versatile tool for local surface temperature mapping or measuring thermal properties of solid materials. In this article, we present recent improvements in a SThM system, based on a micro-wire thermocouple probe associated with a quartz tuning fork for contact strength detection. Some results obtained on an electrothermal micro-hotplate device, operated in active and passive modes, allow demonstrating its performance as a coupled force detection and thermal measurement system.

010302 applied physicsHistoryMicroscopeMaterials scienceSystem of measurementQuartz tuning forkNanotechnologyContact strength02 engineering and technologySolid material021001 nanoscience & nanotechnology01 natural sciencesComputer Science ApplicationsEducationlaw.inventionThermocouplelaw0103 physical sciencesThermal0210 nano-technologyTemperature mappingJournal of Physics: Conference Series
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Silicon Surface Passivation by ALD-Ga2O3: Thermal vs. Plasma-Enhanced Atomic Layer Deposition

2020

Silicon surface passivation by gallium oxide (Ga2O3) thin films deposited by thermal- and plasma-enhanced atomic layer deposition (ALD) over a broad temperature range from 75 °C to 350 °C is investigated. In addition, the role of oxidant (O3 or O-plasma) pulse lengths insufficient for saturated ALD-growth is studied. The material properties are analyzed including the quantification of the incorporated hydrogen. We find that oxidant dose pulses insufficient for saturation provide for both ALD methods generally better surface passivation. Furthermore, different Si surface pretreatments are compared (HF-last, chemically grown oxide, and thermal tunnel oxide). In contrast to previous reports, t…

010302 applied physicsKelvin probe force microscopeMaterials sciencePassivationSiliconAnnealing (metallurgy)OxideAnalytical chemistrychemistry.chemical_element02 engineering and technology021001 nanoscience & nanotechnologyCondensed Matter Physics01 natural sciencesElectronic Optical and Magnetic MaterialsAtomic layer depositionchemistry.chemical_compoundchemistry0103 physical sciencesElectrical and Electronic EngineeringThin film0210 nano-technologyUltraviolet photoelectron spectroscopyIEEE Journal of Photovoltaics
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Determination of Contact Potential Difference by the Kelvin Probe (Part II) 2. Measurement System by Involving the Composite Bucking Voltage

2016

Abstract The present research is devoted to creation of a new low-cost miniaturised measurement system for determination of potential difference in real time and with high measurement resolution. Furthermore, using the electrode of the reference probe, Kelvin method leads to both an indirect measurement of electronic work function or contact potential of the sample and measurement of a surface potential for insulator type samples. The bucking voltage in this system is composite and comprises a periodically variable component. The necessary steps for development of signal processing and tracking are described in detail.

010302 applied physicsKelvin probe force microscopeMaterials sciencesurface potentialbusiness.industrySystem of measurementPhysicsQC1-999Composite numberGeneral EngineeringGeneral Physics and Astronomy02 engineering and technology021001 nanoscience & nanotechnology01 natural sciencesOpticscontact potential differencekelvin probe0103 physical sciences0210 nano-technologybusinessVolta potentialVoltageLatvian Journal of Physics and Technical Sciences
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Polarity conversion of GaN nanowires grown by plasma-assisted molecular beam epitaxy

2019

International audience; It is demonstrated that the N-polarity of GaN nanowires (NWs) spontaneously nucleated on Si (111) by molecular beam epitaxy can be reversed by intercalation of an Al-or Ga-oxynitride thin layer. The polarity change has been assessed by a combination of chemical etching, Kelvin probe force microscopy, cathodo-and photoluminescence spectroscopy and transmission electron microscopy experiments. Cathodoluminescence of the Ga-polar NW section exhibits a higher intensity in the band edge region, consistent with a reduced incorporation of chemical impurities. The polarity reversal method we propose opens the path to the integration of optimized metal-polar NW devices on any…

010302 applied physicsKelvin probe force microscopePolarity reversalMaterials sciencePhysics and Astronomy (miscellaneous)Polarity (physics)business.industryNanowireCathodoluminescence02 engineering and technology021001 nanoscience & nanotechnology01 natural sciences7. Clean energyIsotropic etching[SPI.MAT]Engineering Sciences [physics]/MaterialsNanolithography0103 physical sciences[PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci][SPI.OPTI]Engineering Sciences [physics]/Optics / PhotonicOptoelectronics[PHYS.COND]Physics [physics]/Condensed Matter [cond-mat]0210 nano-technologybusinessMolecular beam epitaxy
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