Search results for "Microelectronics"

showing 10 items of 234 documents

Narrow Band Solid-Liquid Composite Arrangements: Alternative Solutions for Phononic Crystal-Based Liquid Sensors

2019

Periodic elastic composite structures attract great attention. They offer the ability to design artificial properties to advance the control over the propagation of elastic/acoustic waves. In previous work, we drew attention to composite periodic structures comprising liquids. It was shown that the transmission spectrum of the structure, specifically a well-isolated peak, follows the material properties of liquid constituent in a distinct manner. This idea was realized in several liquid sensor concepts that launched the field of phononic crystal liquid sensors. In this work we introduce a novel concept&mdash

Work (thermodynamics)liquid sensorMaterials scienceField (physics)Composite numberacoustic band structure02 engineering and technologylcsh:Chemical technology01 natural sciencesBiochemistryArticleAnalytical Chemistry[SPI.MAT]Engineering Sciences [physics]/Materials010309 opticsCrystalperiodic composite structureSpeed of sound0103 physical scienceslcsh:TP1-1185Electrical and Electronic Engineering[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsInstrumentationspeed of sound[SPI.ACOU]Engineering Sciences [physics]/Acoustics [physics.class-ph]business.industryAcoustic wavedetection of fluid propertiessolid-liquid interaction021001 nanoscience & nanotechnologyphononic crystal sensorAtomic and Molecular Physics and OpticsTransmission (telecommunications)acoustic transmission spectraOptoelectronics0210 nano-technologybusinessMaterial properties
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Hardware Computation of Moment Functions in a Silicon Retina Using Binary Patterns

2006

International audience; We present in this paper a method for implementing moment functions in a CMOS retina for shape recognition applications. The method is based on the use of binary patterns and it allows the computation of different moment functions such geometric and Zernike moments of any orders by an adequate choice of the binary patterns. The advantages of the method over other methods described in the literature is that it is particularly suitable for the design of a programmable retina circuit where moment functions of different orders are obtained by simply loading the correct binary patterns into the memory devices implemented on the circuit. The moment values computed by the m…

Zernike polynomialsComputation[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsBinary number02 engineering and technologyMethod of moments (statistics)symbols.namesake[ INFO.INFO-TI ] Computer Science [cs]/Image Processing0202 electrical engineering electronic engineering information engineeringComputer visionPattern matching[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsRepresentation (mathematics)Mathematicsbusiness.industry020206 networking & telecommunicationsMoment (mathematics)[INFO.INFO-TI] Computer Science [cs]/Image Processing [eess.IV][INFO.INFO-TI]Computer Science [cs]/Image Processing [eess.IV]Pattern recognition (psychology)symbols020201 artificial intelligence & image processing[ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsArtificial intelligencebusinessAlgorithm
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Filtering and emission area identification in the Time Resolved Imaging data

2012

Abstract Time Resolved Imaging (TRI) acquisitions allow precise timing analysis of emission spots. Up to date technologies deeply challenge their isolation by hiding the weak ones, under sizing or over sizing visually detectable emission spots and finally by jeopardizing timing resolution. We report on an algorithm based on 1 and 2D signal processing tools which automates the identification of emission sites and optimizes separation between noise and useful signal, even for weak spots surrounding strong emission areas. The application of the algorithm on several sets of data from different types of devices and their results are also discussed.

[ INFO.INFO-TS ] Computer Science [cs]/Signal and Image ProcessingComputer science[INFO.INFO-TS] Computer Science [cs]/Signal and Image Processing[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[ SPI.SIGNAL ] Engineering Sciences [physics]/Signal and Image processing02 engineering and technology01 natural sciencesImaging dataSignal[INFO.INFO-TS]Computer Science [cs]/Signal and Image Processing0103 physical sciences0202 electrical engineering electronic engineering information engineeringIsolation (database systems)[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[SPI.SIGNAL] Engineering Sciences [physics]/Signal and Image processing010302 applied physicsSignal processingNoise (signal processing)business.industryPhoto EmissionStatic timing analysisPattern recognitionSizingIdentification (information)IC Failure AnalysisImage Thresholding[ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics020201 artificial intelligence & image processingArtificial intelligencebusiness[SPI.SIGNAL]Engineering Sciences [physics]/Signal and Image processing
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Spatial correction in dynamic photon emission by affine transformation matrix estimation

2014

International audience; Photon emission microscopy and Time Resolved Imaging have proved their efficiency for defect localization on VLSI. A common process to find defect candidate locations is to draw a comparison between acquisitions on a normally working device and a faulty one. In order to be accurate and meaningful, this method requires that the acquisition scene remains the same between the two parts. In practice, it can be difficult to set. In this paper, a method to correct position by affine matrix transformation is suggested. It is based on image features detection, description and matching and affine transformation estimation.

[ INFO.INFO-TS ] Computer Science [cs]/Signal and Image ProcessingMatching (graph theory)Computer science[INFO.INFO-TS] Computer Science [cs]/Signal and Image Processing[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics02 engineering and technology[ SPI.SIGNAL ] Engineering Sciences [physics]/Signal and Image processing[INFO.INFO-TS]Computer Science [cs]/Signal and Image ProcessingPosition (vector)020204 information systems0202 electrical engineering electronic engineering information engineeringComputer vision[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[SPI.SIGNAL] Engineering Sciences [physics]/Signal and Image processingVery-large-scale integrationHarris affine region detectorbusiness.industryProcess (computing)Affine shape adaptationTransformation (function)020201 artificial intelligence & image processing[ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsArtificial intelligenceAffine transformationbusiness[SPI.SIGNAL]Engineering Sciences [physics]/Signal and Image processing
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Cluster matching in time resolved imaging for VLSI analysis

2014

International audience; If scaling has the benefit of enabling manufacturers to design tomorrow's integrated circuits, from the failure analyst point of view it also has the drawback of making devices more complex. The test sequence for modern VLSI can be quite long, with thousands of vector. Dynamic photon emission databases can contain millions of photons representing thousands of state changes in the region of interest. Finding a candidate location where to perform physical analysis is quite challenging, especially if the fault occurs on a single vector. In this paper, we suggest a new methodology to find single vector fault in dynamic photon emission database. The process is applied at …

[ INFO.INFO-TS ] Computer Science [cs]/Signal and Image ProcessingMatching (graph theory)[INFO.INFO-TS] Computer Science [cs]/Signal and Image ProcessingComputer science[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[ SPI.SIGNAL ] Engineering Sciences [physics]/Signal and Image processing02 engineering and technologyIntegrated circuitFault (power engineering)computer.software_genre01 natural sciencesk-nearest neighbors algorithmlaw.invention[INFO.INFO-TS]Computer Science [cs]/Signal and Image Processinglaw0103 physical sciences0202 electrical engineering electronic engineering information engineeringPoint (geometry)[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsCluster analysisComputer Science::Databases[SPI.SIGNAL] Engineering Sciences [physics]/Signal and Image processing010302 applied physicsVery-large-scale integrationProcess (computing)Computer engineering[ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics020201 artificial intelligence & image processingData mining[SPI.SIGNAL]Engineering Sciences [physics]/Signal and Image processingcomputerProceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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Etude électrochimique de molécules aminées aliphatiques et hétéroaromatiques. Application aux microcapteurs de pH.

2009

The first part describes the state of the art (electrochemical synthesis, developed applications and electrochemical reaction mechanisms) of the molecules used in his work: pyrrole and ethylenediamine. A second part is dedicated to the evolution of pH measurement processes. Thus, after an explanation of the pH concept, a presentation of both conventional pH measurement technique and of recent pH measurements methods is given.Then, thin polymer films are deposited on platinum surfaces by anodic electropolymerization of pyrrole and ethylenediamine. Then, we tested different electrolyte composition to determine the influence of solvent, salt and monomer concentrations on the electro-oxidation …

[CHIM.THEO]Chemical Sciences/Theoretical and/or physical chemistry[CHIM.MATE] Chemical Sciences/Material chemistry[CHIM.THEO] Chemical Sciences/Theoretical and/or physical chemistry[CHIM.ANAL] Chemical Sciences/Analytical chemistryelectrochemistry[CHIM.ANAL]Chemical Sciences/Analytical chemistryélectrochimie[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[CHIM.MATE]Chemical Sciences/Material chemistry[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
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Reconnaissance de la Forme 3D et Estimation de la Profondeur Implémentation sur FPGA Spartan 3A d'un SoC pour la Vision 3D (Shape From Focus) Problém…

2007

Le terme de « vision 3D » ou « de numérisation 3D », est apparu à la fin des années 1990, pour désigner des techniques d'acquisition de mesures tridimensionnelle sur des surfaces, techniques ayant la caractéristique de donner des nuages de points denses et importants dont l'ordre de grandeur est de quelques dizaines à plusieurs millions de points. Le nuage de points représente en fait l'information de l'image de profondeur et selon des différents traitements à l'image on peut aboutir à un ordre de précision de la reconstitution de l'objet ou scène en 3D. La vision 3D demeure une méthodologie de base pour réassurer le mécanisme de reconstitution des images tridimensionnelles. Outre les besoi…

[INFO.INFO-AI] Computer Science [cs]/Artificial Intelligence [cs.AI][INFO.INFO-CV] Computer Science [cs]/Computer Vision and Pattern Recognition [cs.CV][SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[SPI.TRON] Engineering Sciences [physics]/Electronics[INFO.INFO-ES] Computer Science [cs]/Embedded Systems[INFO.INFO-PL] Computer Science [cs]/Programming Languages [cs.PL]
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Terpyridine-based metallopolymer thin films as active layer in ammonia sensor device

2016

International audience; A metal-containing polymer has been prepared by electropolymerization of an homoleptic Ru(II)-terpyridine complex bearing pyrrole heterocycles. The polymer is obtained as a thinfilm at the surface ofelectrodes, and has been characterized by electrochemical measurements, XPS and microscopy. It hasbeen shown that this polymer acts as an active gas sensitive layer since it enables the detection of anammonia gasflow through layer’s resistivity measurements.

[INFO.INFO-DS]Computer Science [cs]/Data Structures and Algorithms [cs.DS]Nanotechnology02 engineering and technology010402 general chemistry01 natural sciences[SPI.AUTO]Engineering Sciences [physics]/Automatic[SPI.MAT]Engineering Sciences [physics]/Materialschemistry.chemical_compoundX-ray photoelectron spectroscopyMaterials ChemistryThin filmHomoleptic[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronicschemistry.chemical_classification[SPI.ACOU]Engineering Sciences [physics]/Acoustics [physics.class-ph]ChemistryMechanical EngineeringMetals and AlloysPolymer021001 nanoscience & nanotechnologyCondensed Matter Physics0104 chemical sciencesElectronic Optical and Magnetic MaterialsActive layerChemical engineeringMechanics of MaterialsElectrodeTerpyridine0210 nano-technology[PHYS.ASTR]Physics [physics]/Astrophysics [astro-ph]Layer (electronics)
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SNOM signal near plasmonic nanostructures: an analogy with fluorescence decays channels

2008

International audience; Scanning Near-field Optical Microscope (SNOM) is based on local excitations of nanostructures deposited on a substrate (illumination mode). Ideally, the local source behaves like a dipolar emitter so that the SNOM signal is strongly similar to the fluorescence decay rates of an excited molecule that would be located at the SNOM tip position. We present here how the SNOM signal near plasmonic nanostructures can be used to analyze radiative and non-radiative contribution to the fluorescence decay rate.

[PHYS.PHYS.PHYS-OPTICS] Physics [physics]/Physics [physics]/Optics [physics.optics]HistologyMaterials science[SPI.OPTI] Engineering Sciences [physics]/Optics / Photonic[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsPhysics::Optics02 engineering and technologySubstrate (electronics)01 natural sciencesSignalPathology and Forensic Medicinelaw.inventionGOLD NANORODSplasmonOpticsOptical microscopelaw0103 physical sciencesRadiative transferMODE[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics010306 general physicsPlasmon[PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics][ PHYS.PHYS.PHYS-OPTICS ] Physics [physics]/Physics [physics]/Optics [physics.optics]business.industryGreen's dyadic021001 nanoscience & nanotechnologyFluorescenceSantennaDENSITY[SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic[ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsNear-field scanning optical microscopeNanorod[ SPI.OPTI ] Engineering Sciences [physics]/Optics / Photonicfluorescence decay rateSNOM0210 nano-technologybusiness
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Surface plasmon routing in dielectric-loaded surface plasmon polariton waveguides - art. no. 70330S

2008

International audience; Waveguiding by dielectric-loaded surface plasmon-polaritons (DLSPP) structures are numerically and experimentally investigated. We used the effective index model to understand the influence of basic waveguide parameters such as width and thickness on the properties of the surface plasmon guided modes. A waveguide was fabricated and experimentally studied. The effective indices of the modes supported by the waveguide and their propagation length are evaluated by leakage radiation microscopy in both the Fourier and imaging planes. Several excitation schemes were tested including surface plasmon coupling by diascopic or episcopic illumination as well as defect-mediated …

[PHYS.PHYS.PHYS-OPTICS] Physics [physics]/Physics [physics]/Optics [physics.optics]INTERFERENCE[PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics][ PHYS.PHYS.PHYS-OPTICS ] Physics [physics]/Physics [physics]/Optics [physics.optics][SPI.OPTI] Engineering Sciences [physics]/Optics / Photonic[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[SPI.OPTI]Engineering Sciences [physics]/Optics / PhotonicPhysics::Optics[ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[ SPI.OPTI ] Engineering Sciences [physics]/Optics / Photonic[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsOPTICS
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