Search results for "Microscope"
showing 10 items of 1412 documents
Single molecule imaging using a highly confined optical field at a triangular aperture
2005
We demonstrate that scanning near-field optical microscopy based on a probe with a triangular aperture is capable of imaging single fluorescent molecules with an optical resolution of 30 nm. Numerical simulations agree well with experiment.
Tuning the hole injection barrier in the intermolecular charge-transfer compoundDTBDT-F4TCNQ at metal interfaces
2014
Molecular monolayers of the charge-transfer salt dithienobenzodithiophene-tetrafluorotetracyanoquinodimethane (DTBDT-F${}_{4}$TCNQ) have been deposited on C(R$15\ifmmode\times\else\texttimes\fi{}3$)/W(110), Co/W(110), and hcp Co(0001) using molecular beam epitaxy in an ultrahigh vacuum. The integrity of the deposited molecules has been confirmed by scanning tunneling microscopy. Scanning tunneling spectroscopy has been used to determine the energetic positions of the highest occupied (HOMO) and lowest unoccupied (LUMO) molecular orbital of acceptor and donor in the pure and in the mixed phase. The mixed charge transfer phase exhibits a new HOMO close to the Fermi edge depicting a charge tra…
Scanning near-field optical microscopy (SNOM) of lithium niobate aperiodically poled during growth
2007
In the present work, aperiodically poled lithium niobate (APPLN) was grown, along the a-axis, by the off-centred Czochraski method. The domain formation has been triggered by rare earth doping, using in this case Er3+ and Yb3+ ions. The growth conditions were selected in order to obtain a modulated domain distribution. SNOM measurements have been performed with a Nanonics Imaging Ltd model MultiView 200 TM working in non-contact tapping mode.
Deformation-Free Topography from Combined Scanning Force and Tunnelling Experiments
1993
We show that by measuring force and stiffness on a constant-current scanning tunnelling microscopy (STM) contour a deformation-free topography can be extracted. With reference to mono- and bicomponent self-assembled monolayers, we find that the characteristic depression pattern and the protrusions on a multicomponent film found in STM are to a great extent due to electronic effects.
Inspection of EUVL mask blank defects and patterned masks using EUV photoemission electron microscopy
2008
We report on recent developments of an "at-wavelength" full-field imaging technique for inspection of multilayer mask blank defects and patterned mask samples for extreme ultraviolet lithography (EUVL) by EUV photoemission electron microscopy (EUV-PEEM). A bump-type line defect with a width of approximately 35nm that is buried beneath Mo/Si multilayer has been detected clearly, and first inspection results obtained from a patterned TaN absorber EUVL mask sample is reported. Different image contrast of a similar width of multilayer-covered substrate line defect and on top TaN absorber square has been observed in the EUV-PEEM images, and origin of the difference in their EUV-PEEM image contra…
Combination of Confocal Raman Spectroscopy and Electron Microscopy on the Same Individual Bundles of Single-Walled Carbon Nanotubes
2002
We report a method to investigate the same individual single-walled carbon nanotube (SWNT) bundles with both transmission electron microscopy (TEM) and Raman spectroscopy. Free-standing individual bundles are obtained by depositing a solution of suspend SWNTs on a carbon film with a regular pattern of holes, which can be localized by TEM and also by confocal Raman microscopy. While most of the TEM images predict that the bundles consist of tubes with a similar diameter, we will show that occasionally a certain tube diameter can be associated with a particular radial breathing mode frequency of the Raman spectrum. Single-walled carbon nanotubes (SWNTs) are one-dimensional molecular structure…
Photonic effect study on polystyrene 3D-photonic crystals at near-field range: dependence on the wavelength and on the lattice parameter
2007
3D-photonic crystals (opals) based on polystyrene (PS) colloidal nanospheres are being characterized by scanning near-field optical microscopy (SNOM). These crystals offer a huge potential for controlling both the spontaneous emission of embedded light sources and the propagation of light itself.
Imaging of photonic nanopatterns by scanning near-field optical microscopy
2002
We define photonic nanopatterns of a sample as images recorded by scanning near-field optical microscopy with a locally excited electric dipole as a probe. This photonic nanopattern can be calculated by use of the Green’s dyadic technique. Here, we show that scanning near-field optical microscopy images of well-defined gold triangles taken with the tetrahedral tip as a probe show a close similarity to the photonic nanopattern of this nanostructure with an electric dipole at a distance of 15 nm to the sample and tilted 45° with respect to the scanning plane.
Crystal growth of Hg1−xMnxSe for infrared detection
2007
In this work, we report on the successfully growing Hg"1"-"xMn"xSe bulk crystals using a mixed, travelling heater method and Bridgman method, two-step procedure. Firstly, and with the aim of reducing Hg high pressure related to the high temperature synthesis reaction between the components in elemental form, HgSe crystals were synthesized and grown by the cold travelling heater method. Secondly, previously sublimated Mn and Se were incorporated to complete the desired composition. Then, the Bridgman growth was carried out by heating the alloy at a temperature of about 880^oC and lowering it at rate of 1mm/h through a gradient of 25^oC/cm. The Hg"1"-"xMn"xSe crystals were characterized by sc…
Analysis of static friction and elastic forces in a nanowire bent on a flat surface: A comparative study
2014
ZnO nanowires bent to a complex shape and held in place by static friction force from supporting flat surface are investigated experimentally and theoretically. The complex shapes are obtained by bending the nanowires inside a scanning electron microscope with a sharp tip attached to a nanopositioner. Several methods previously described in the literature are applied along with author's original method to calculate the distributed friction force and stored elastic energy in the nanowires from the bending profile. This comparative study evidences the importance of the usage of appropriate models for accurate analysis of the nanowires profile. It is demonstrated that incomplete models can lea…