Search results for "Microscopy"
showing 10 items of 3390 documents
Accessing fast magnetization dynamics by XPEEM: Status and perspectives
2006
Abstract Being already well established as a versatile technique for high-resolution static magnetic domain imaging, X-ray photoemission electron microscopy (XPEEM) is now also capturing the field of time-resolved magnetic investigations. Using appropriate operation modes at synchrotron radiation sources, a time resolution of 10 ps and less can be achieved in recent magnetodynamics studies, giving access even to phenomena involving precessional processes.
Applications of near-field optics to the characterization of optoelectronics components
1997
In the race towards purely optical communications, the necessity of producing integrated components is linked to the requirement for the precise characteriza-tion of optoelectronic components. Near-field detection techniques meet this requirement, AFM (Atomic Force Microscopy), for instance, can provide the topography of a given sample. In conjunction with these new tools, several different kinds of near-field optical microscopes (NFOM) have appeared. They enable the characteriza-tion of the components with a resolution better than that imposed by the Rayleigh criterion. This is primarily due to the fact that they are sensitive to the evanescent waves. This document presents several areas r…
Single-shot slightly off-axis digital holographic microscopy with add-on module based on beamsplitter cube
2019
Slightly off-axis digital holographic microscopy (SO-DHM) has recently emerged as a novel experimental arrangement for quantitative phase imaging (QPI). It offers improved capabilities in conventional on-axis and off-axis interferometric configurations. In this contribution, we report on a single-shot SO-DHM approach based on an add-on module adapted to the exit port of a regular microscope. The module employs a beamsplitter (BS) cube interferometer and includes, in addition, a Stokes lens (SL) for astigmatism compensation. Each recorded frame contains two fields of view (FOVs) of the sample, where each FOV is a hologram which is phase shifted by π rads with respect to the other. These two …
Pattern projection for subpixel resolved imaging in microscopy.
2006
In this paper, we present a new approach providing super resolved images exceeding the geometrical limitation given by the detector pixel size of the imaging camera. The concept involves the projection of periodic patterns on top of the sample, which are then investigated under a microscope. Combining spatial scanning together with proper digital post-processing algorithm yields the improved geometrical resolution enhancement. This new method is especially interesting for microscopic imaging when the resolution of the detector is lower than the resolution due to diffraction.
Flexible drift-compensation system for precise 3D force mapping in severe drift environments
2011
The acquisition of dense 3D data sets is of great importance, but also a challenge for scanning probe microscopy (SPM). Thermal drift often induces severe distortions in the data, which usually constrains the acquisition of dense data sets to experiments under ultra-high vacuum and low-temperature conditions. Atom tracking is an elegant approach to compensate for thermal drift and to position the microscope tip with highest precision. Here, we present a flexible drift compensation system which can easily be connected to existing SPM hardware. Furthermore, we describe a 3D data acquisition and position correction protocol, which is capable of handling large and non-linear drift as typically …
Transmission Microscopy with Nanometer Resolution Using a Deterministic Single Ion Source.
2015
We realize a single particle microscope by using deterministically extracted laser-cooled ^{40}Ca^{+} ions from a Paul trap as probe particles for transmission imaging. We demonstrate focusing of the ions to a spot size of 5.8±1.0 nm and a minimum two-sample deviation of the beam position of 1.5 nm in the focal plane. The deterministic source, even when used in combination with an imperfect detector, gives rise to a fivefold increase in the signal-to-noise ratio as compared with conventional Poissonian sources. Gating of the detector signal by the extraction event suppresses dark counts by 6 orders of magnitude. We implement a Bayes experimental design approach to microscopy in order to ma…
Analysis of Optical Systems, Contrast Depth, and Measurement of Electric and Magnetic Field Distribution on the Object's Surface in Mirror Electron M…
2011
Abstract The contrast depth is analyzed as well, that is the sensitivity of electron mirror microscope to disorders of homogeneity on the object (local magnetic and electric fields, surface relief). Because of the latter ones, electron trajectories feel disturbances (electrons acquire additional increment velocity in radial and azimuthal directions), which leads to the shift of the observed point on the screen and, as a consequence, to the image contrast. Since the electron energy, when reflected, tends to zero, electrons are influenced by heterogeneities for a long time. It causes high sensitivity to heterogeneities, up to the crossing of electron trajectories (caustics are generated). The…
Common-path phase-shifting digital holographic microscopy: A way to quantitative phase imaging and superresolution
2008
We present an experimental setup useful for complex amplitude evaluation and phase image quantification of three-dimensional (3-D) samples in digital holographic microscopy (DHM). It is based on a common-path interferometric configuration performed by dividing the input plane in two contiguous regions and by placing a translation grating near to the Fourier plane. Then, complex amplitude distribution of the sample under test is recovered with phase-shifting standard method obtained by moving the grating using a linear motion stage. Some experimental results of an USAF resolution test are presented for different numerical aperture (NA) microscope lenses. In a second part, the proposed setup …
Four channels multi-illumination single-holographic-exposure lensless Fresnel (MISHELF) microscopy
2018
Abstract MISHELF microscopy [Opt. Express 23, 21352 (2015)] has been recently reported as the background technology of a new concept of compact, cost-effective and field-portable lensless microscope [Sci. Rep. 7, 43291 (2017)] based on wavelength multiplexing and a fast and robust algorithm for twin image minimization and noise reduction. In this manuscript, MISHELF microscopy is expanded beyond its actual configuration by considering 4 illumination/detection channels while retaining its working principle concerning single-shot, twin image mitigation and noise averaging. Proof of principle validation of the proposed improvement is conducted through experiments with a resolution test target …
SMIM in reflection imaging mode
2019
We present reflective SMIM (initials incoming from Spatially-Multiplexed Interferometric Microscopy) as an extremely simple and low cost way to convert a standard white-light microscope into a holographic one working under reflection imaging mode.