Search results for "SCOPE"

showing 10 items of 2420 documents

Template-based synthesis of nickel oxide

2015

Nanocrystalline NiO has been produced using a facile template-based synthesis from nickel nitrate solutions using cellulose as a template. Thus obtained oxides were studied by scanning electron microscopy, x-ray diffraction, Raman scattering spectroscopy, photoluminescence spectroscopy and confocal spectromicroscopy. The filamentary/coral morphology of the samples has been evidenced and is built up of agglomerated nanocrystallites with a size in the range of about 26-36 nm. The presence of two-magnon contribution in Raman scattering spectra suggests the existence of antiferromagnetic ordering at room temperature. Finally, the observed near-infrared photoluminescence band at 850 nm has been …

DiffractionNickelCrystallographyPhotoluminescenceMaterials sciencechemistryScanning electron microscopeNickel oxideNon-blocking I/OAnalytical chemistrychemistry.chemical_elementSpectroscopyNanocrystalline materialIOP Conference Series: Materials Science and Engineering
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Effect of gamma radiation on thermostimulated exoelectron emission from Gd2O3 films

2020

Abstract The effect of gamma irradiation on Gd2O3 films was studied using the thermostimulated exoelectron emission (TSEE) technique. The films were deposited on a glass and Si/SiO2 substrates using an extraction-pyrolytic method. Crystalline structure, chemical composition, film thickness and surface morphology were characterized by means of X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM) and atomic force microscopy (AFM). The films were irradiated by 10 MeV gamma photons and TSEE was measured from the irradiated films. It was found that gamma irradiation decreases TSEE intensity and the area below TSEE spectral curves. A linear correlati…

DiffractionNuclear and High Energy PhysicsRange (particle radiation)Materials scienceX-ray photoelectron spectroscopyScanning electron microscopeAnalytical chemistryIrradiationElectronRadiationInstrumentationExoelectron emissionNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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Speckle random coding for 2D super resolving fluorescent microscopic imaging.

2006

In this manuscript we present a novel super resolving approach based upon projection of a random speckle pattern onto samples observed through a microscope. The projection of the speckle pattern is created by coherent illumination of the inspected pattern through a diffuser. Due to local interference of the coherent wave front with itself, a random speckle pattern is superimposed on the sample. This speckle pattern can be scanned over the object. A super-resolved image can be extracted from a temporal sequence of images by appropriate digital processing of the image stream. The resulting resolution is significantly higher than the diffraction limitation of the microscope objective. The new …

DiffractionPhysicsMicroscopebusiness.industryResolution (electron density)General Physics and AstronomySpeckle noiseCell BiologyNumerical aperturelaw.inventionSpeckle patternOpticsStructural BiologylawElectronic speckle pattern interferometryGeneral Materials ScienceProjection (set theory)businessMicron (Oxford, England : 1993)
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High-resolution hard-x-ray photoelectron diffraction in a momentum microscope—the model case of graphite

2019

New journal of physics 21(11), 113031 - (2019). doi:10.1088/1367-2630/ab51fe

DiffractionPhysicsMomentum (technical analysis)MicroscopeX-rayGeneral Physics and AstronomyHigh resolution530law.inventionlawHard X-raysddc:530GraphiteAtomic physics
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Center-to-limb variation of the area covered by magnetic bright points in the quiet Sun

2011

CONTEXT: The quiet Sun magnetic fields produce ubiquitous bright points (BPs) that cover a significant fraction of the solar surface. Their contribution to the total solar irradiance (TSI) is so-far unknown. AIMS: To measure the center-to-limb variation (CLV) of the fraction of solar surface covered by quiet Sun magnetic bright points. The fraction is referred to as 'fraction of covered surface', or FCS. METHODS: Counting of the area covered by BPs in G-band images obtained at various heliocentric angles with the 1-m Swedish Solar Telescope on La Palma. Through restoration, the images are close to the diffraction limit of the instrument (~0.1 arcsec). RESULTS: The FCS is largest at disk cen…

DiffractionPhysicsPhotosphereFOS: Physical sciencesAstronomy and AstrophysicsContext (language use)AstrophysicsSolar irradianceMagnetic fieldSolar telescopeAstrophysics - Solar and Stellar AstrophysicsSpace and Planetary ScienceQUIETPhysics::Space PhysicsAstrophysics::Solar and Stellar AstrophysicsAstrophysics::Earth and Planetary AstrophysicsVariation (astronomy)Solar and Stellar Astrophysics (astro-ph.SR)Astronomy & Astrophysics
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Electromagnetic Singularities and Resonances in Near-Field Optical Probes

2007

Over the last two decades scanning near-field optical microscopy (SNOM) has demonstrated its ability to provide optical resolution significantly better than the diffraction limit (<20 nm). The general principle of SNOM relies on the approach of a nanometer-sized object in the optical near-field of a sample to be studied. This nano-object (NO) is usually the extremity of a probe. Regardless of the nature of the observed SNOM signal (inelastic scattering, fluorescence, etc.), the detection of the light is achieved in the far-field regime where the NO acts as a mediator between the optical near-field and the detector. Figure 1 is a schematic illustration of the SNOM principle.

DiffractionPhysicsbusiness.industryResolution (electron density)DetectorPhysics::OpticsNear and far fieldInelastic scatteringlaw.inventionOpticsOptical microscopelawNear-field scanning optical microscopeScanning tunneling microscopebusiness
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The Effects of 3d Admixtures on Properties of Relaxor PLZT8/65/35 Ceramics

2012

A study of the effects of the 3d dopants Mn, Fe, Co, Ni, and Cu on relaxor behavior and other properties of the ferroelectric PLZT8/65/35(La8) ceramic compound by X-ray diffraction, electron microscopy and other techniques is reported. The complex dielectric permittivity ϵ* = ϵ′-iϵ′′ is measured in the 20–400°C range of temperature at frequencies within the range of 102 – 106 Hz. Essential changes caused by the admixtures in the behavior of dielectric permittivity with frequency and temperature are observed along with changes in the XRD SEM patterns are observed. The mechanisms of the phenomena are discussed.

DiffractionRange (particle radiation)Materials scienceDopantDielectric permittivityCondensed Matter PhysicsFerroelectricityElectronic Optical and Magnetic Materialslaw.inventionlawvisual_artvisual_art.visual_art_mediumCeramicComposite materialElectron microscopeFerroelectrics
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Vapor growth of Hg1−xCdxI2 on glass using CdTe buffer

2001

Abstract Vapor phase epitaxy (VPE) of Hg1−xCdxI2 layers on glass substrates covered by a CdTe buffer layer has been studied. The buffer layers of 2–4 μm thickness were formed by VPE using polycrystalline CdTe and Cd metal sources. The Hg1−xCdxI2 layers were grown using a (Hg1−yCdy)1−z(I2)z polycrystalline source, with a composition in the range of y=0.1–0.5 and z=0.5–0.8. Scanning electron microscopy and X-ray diffraction studies have shown that the composition and structure of Hg1−xCdxI2 layers depend strongly on the VPE conditions. Varying the growth time and source composition, it has been possible to obtain Hg1−xCdxI2 layers with the composition x in the range from approximately 0 (HgI2…

DiffractionScanning electron microscopeChemistrybusiness.industryMetals and AlloysAnalytical chemistrySurfaces and InterfacesEpitaxyCadmium telluride photovoltaicsSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsMetalTetragonal crystal systemOpticsvisual_artMaterials Chemistryvisual_art.visual_art_mediumCrystallitebusinessLayer (electronics)Thin Solid Films
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X-ray diffraction line broadening on vibrating dry-milled Two Crows sepiolite

2006

A reference sample of sepiolite and products of its comminution by vibrating dry-milling have been studied using X-ray diffraction (XRD) line-broadening analysis, complementary field emission scanning electron microscopy (FESEM) images and surface area measurements. The apparent crystallite sizes determined via XRD are in agreement with observations on FESEM images. The sepiolite aggregates consist of lath-shaped agglutinations of prisms and pinacoids elongated along [001], each lath including several crystallites in that direction. The surface area magnitudes are in the range of previous experimental measurements of other sepiolites. The results obtained show the effectiveness of vibro-mil…

DiffractionScanning electron microscopeCrystalline Lattice StrainSepioliteAnalytical chemistrySoil ScienceMineralogyLathengineering.materialchemistry.chemical_compoundReference ClayGeochemistry and PetrologyNevada SepioliteEarth and Planetary Sciences (miscellaneous)Crystallite SizeWater Science and TechnologySepioliteX-ray DiffractionLine BroadeningSurface AreaSilicatechemistryX-ray crystallographyengineeringCrystalliteComminutionGeologyClays and Clay Minerals
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Investigation of Silicon Carbide Polytypes by Raman Spectroscopy

2014

Abstract Polytypes of colourless and coloured single crystals of silicon carbide (SiC) grown on SiC substrates by chemical vapour deposition are studied using Raman spectroscopy supplemented by scanning electron microscopy (SEM) and X-ray diffraction (XRD) analyses. The SEM analysis of the defect stacking faults, inclusions of defects and their distribution has shown that they correlate with the peak positions of the obtained Raman spectra and with the XRD data on the crystal structure

DiffractionScanning electron microscopePhysicsQC1-999General EngineeringStackingAnalytical chemistryGeneral Physics and AstronomySem analysisChemical vapor depositionCrystal structurex-ray diffraction (xrd)silicon carbide (sic)symbols.namesakechemistry.chemical_compoundraman spectroscopychemistrysymbolsSilicon carbidepolytypesRaman spectroscopyLatvian Journal of Physics and Technical Sciences
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