Search results for "THICKNESS"

showing 10 items of 307 documents

Reliability of manual segmentation of cornea, contact lens and tear film using a high-resolution OCT

2015

In this study, we aimed to evaluate the intra/inter-session and intra/inter-observer variability of manual segmentation of thickness of the pre-lens tear film, contact lens (CL), post-lens tear film, epithelium, bowman’s layer, stroma and the whole cornea and CLs with a flat and a steep fit, using a commercial high-resolution spectral domain optical coherence tomographer (OCT). Two different observers obtained three repeated measures in two separate sessions. A high correlation was found between the values obtained by the two different observers, except for the thinner layers, epithelium, and Bowman’s layer. Inter-observer analysis showed a high consistency in the measurements obtained by b…

Materials scienceManual layer segmentationOpticsCLs upper limitsOptical coherence tomographyCorneamedicineEpithelial thicknessRepeatabilityScience & Technologymedicine.diagnostic_testOptical coherence tomographybusiness.industryResolution (electron density)RepeatabilityAtomic and Molecular Physics and Opticseye diseasesTear film thicknessContact lensCorneal thicknessmedicine.anatomical_structureManual segmentationsense organsbusinessBiomedical engineering
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3D multispectral light propagation model for subcutaneous veins imaging

2008

In this paper, we describe a new 3D light propagation model aimed at understanding the effects of various physiological properties on subcutaneous vein imaging. In particular, we build upon the well known MCML (Monte Carlo Multi Layer) code and present a tissue model that improves upon the current state-of-the-art by: incorporating physiological variation, such as melanin concentration, fat content, and layer thickness; including veins of varying depth and diameter; using curved surfaces from real arm shapes; and modeling the vessel wall interface. We describe our model, present results from the Monte Carlo modeling, and compare these results with those obtained with other Monte Carlo metho…

Materials scienceOpticsLight propagationFat contentbusiness.industryQuantitative Biology::Tissues and OrgansTissue ModelMonte Carlo methodMultispectral imageVisible radiationbusinessLayer thicknessMulti layerSPIE Proceedings
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Investigation on passivity of titanium under steady-state conditions in acidic solutions

2011

Abstract The passivity of titanium was studied using potentiostatic polarization combined with Mott–Schottky analysis in acidic solutions. The oxide layer was characterized as an n-type semiconducting, oxygen deficient oxide (TiO1.993–1.996) with a donor density in the range of 1019–1020 cm−3 depending on electrode potential and electrolyte pH. The calculated thickness for the inner oxide layer was in the range of 1–4 nm, increasing linearly with applied potential and exponentially with electrolyte pH. The potential- and pH-dependence of the inner oxide thickness was interpreted by a modified point defect model for the migration-controlled oxide growth, in which the rate-determining step in…

Materials sciencePassivityInorganic chemistryOxidechemistry.chemical_elementEquivalent oxide thicknessElectrolyteCondensed Matter Physicschemistry.chemical_compoundchemistryLattice (order)General Materials SciencePolarization (electrochemistry)Electrode potentialTitaniumMaterials Chemistry and Physics
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Size self-filtering effect in vertical stacks of InAs/InP self-assembled quantum wires

2003

3 páginas, 2 figuras.-- PACS: 73.21.Hb; 78.55.Cr; 78.67.Lt.-- Proceedings of the International Conference on Superlattices, Nano-structures and Nano-devices ICSNN 2002.

Materials sciencePhotoluminescenceCondensed matter physicsbusiness.industryQuantum wiresPhysics::OpticsCondensed Matter::Mesoscopic Systems and Quantum Hall EffectCondensed Matter PhysicsLayer thicknessAtomic and Molecular Physics and OpticsElectronic Optical and Magnetic MaterialsSelf assembledCondensed Matter::Materials ScienceHomogeneity (physics)Physics::Accelerator PhysicsOptoelectronicsVertical stacksbusinessQuantumPhotoluminescenceMolecular beam epitaxy
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Photoelectrochemical and XPS characterisation of oxide layers on 316L stainless steel grown in high-temperature water

2015

Passive films on AISI 316L stainless steel were grown by exposure in high temperature (300 °C and 150 bar) water. X-ray photoelectron spectroscopy was employed to study their composition as a function of immersion time. A photoelectrochemical investigation, supported by electrochemical and impedance measurements, allowed to get information on the solid-state properties of the investigated layers. The experimental results suggest the formation of a stratified layer with an outer iron-rich layer and an inner Cr-rich oxide layer, whose relative thickness and composition are dependent on the immersion time.

Materials sciencePressurised water reactorMetallurgyOxidePressurised water reactorCondensed Matter PhysicCondensed Matter PhysicsElectrochemistryStainless steelchemistry.chemical_compoundSettore ING-IND/23 - Chimica Fisica ApplicatachemistryChemical engineeringRelative thicknessX-ray photoelectron spectroscopyImmersion (virtual reality)Photocurrent spectroscopyXPSElectrochemistryGeneral Materials ScienceMaterials Science (all)Electrical and Electronic Engineering
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Interfacial reaction during MOCVD growth revealed by in situ ARXPS.

2006

International audience; Angle-resolved X-ray photoelectron spectroscopy (ARXPS) experiments were performed to study in situ the reaction at the film–substrate interface during metal organic chemical vapor deposition (MOCVD) growth of TiO2 thin films deposited on the silicon substrate. The in-depth distribution of chemical species was determined using several ARXPS thickness calculation models considering either single or bilayer systems. By the comparison of two single-layermodels, the presence of a second layer composed of silicon oxidewas evidenced. High-resolution transmission electron microscopy (HRTEM) observations confirmed the stratification of the film in two layers, as well as the …

Materials scienceSiliconthickness measurementthin filmAnalytical chemistrychemistry.chemical_elementARXPS02 engineering and technologyChemical vapor deposition01 natural sciencesX-ray photoelectron spectroscopy0103 physical sciencesMaterials ChemistryTiO2Thin filmSilicon oxideHigh-resolution transmission electron microscopy010302 applied physicsBilayer[CHIM.MATE]Chemical Sciences/Material chemistrySurfaces and InterfacesGeneral Chemistry021001 nanoscience & nanotechnologyCondensed Matter PhysicsSurfaces Coatings and Filmschemistry[ CHIM.MATE ] Chemical Sciences/Material chemistryMOCVDinterfaceWetting0210 nano-technology
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Angle resolved X-ray photoemission spectroscopy double layer model for in situ characterization of metal organic chemical vapour deposition nanometri…

2007

International audience; In situ Angle Resolved X-ray Photoemission Spectroscopy (ARXPS) characterizations of TiO2 thin films grown on silicon by Metal Organic Chemical Vapour Deposition were performed in order to get information on interfacial reactions at the first stages of the growth, one of the aims being to understand the influence of deposition conditions. Thickness measurements were also carried out from ARXPS analyses. As the real structure of the films was shown to be a double layer system such as TiO2/SiO2/Si, an ARXPS model of thickness and surface coverage determination was applied to each layer independently. However, the application of this model to very thin films underestima…

Materials scienceThickness measurementSiliconPhotoemission spectroscopyAnalytical chemistrychemistry.chemical_elementARXPS02 engineering and technologySubstrate (electronics)Chemical vapor deposition01 natural sciences0103 physical sciencesMaterials ChemistryTiO2Metalorganic vapour phase epitaxyThin filmThin filmSilicon oxide010302 applied physicsMetals and AlloysSurfaces and InterfacesInterface021001 nanoscience & nanotechnologySurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialschemistryMOCVD0210 nano-technologyLayer (electronics)
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Thickness-dependent properties of ultrathin bismuth and antimony chalcogenide films formed by physical vapor deposition and their application in ther…

2021

This work was supported by the European Regional Development Fund (ERDF) project No 1.1.1.1/16/A/257. J. A. acknowledges the ERDF project No. 1.1.1.2/1/16/037. Institute of Solid State Physics, University of Latvia, Latvia as the Center of Excellence has received funding from the European Union's Horizon 2020 Framework Programme H2020-WIDESPREAD-01-2016-2017 TeamingPhase2 under grant agreement No. 739508, project CAMART2 . The raw/processed data required to reproduce these findings cannot be shared at this time as the data also form a part of an ongoing study.

Materials scienceThickness-dependent thermoelectric propertiesChalcogenideMaterials Science (miscellaneous)Energy Engineering and Power Technologychemistry.chemical_element02 engineering and technology010402 general chemistry7. Clean energy01 natural sciencesBismuthlaw.inventionchemistry.chemical_compoundUltrathin filmlawSeebeck coefficientBismuth chalcogenide:NATURAL SCIENCES:Physics [Research Subject Categories]Thin filmFused quartzAntimony tellurideRenewable Energy Sustainability and the Environmentbusiness.industryAntimony telluride021001 nanoscience & nanotechnology0104 chemical sciencesFuel TechnologyNuclear Energy and EngineeringchemistryPhysical vapor depositionOptoelectronics0210 nano-technologybusinessMolecular beam epitaxyNarrow band gap layered semiconductor
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Interactive multiobjective optimization system NIMBUS applied to nonsmooth structural design problems

1996

We shortly describe an interactive method, called NIMBUS, for multiobjective optimization involving nondifferentiable and nonconvex functions. We illustrate the functioning of NIMBUS by numerical examples in the area of structural design. We consider a beam with varying thickness and our aim is to find a thickness distribution in such a way that the resulting structure is as good as possible.

Mathematical optimizationDistribution (mathematics)Structure (category theory)Varying thicknessMulti-objective optimizationMathematics
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Heterogeneous structures studied by an interphase elasto-plastic damaging model

2013

Heterogeneous materials present a mechanical response strongly dependent on the static and kinematic phenomena occurring in the constituents and at their joints. At the mesoscopic level the interaction between the units is simulated by mean of apposite mechanical devices such as the zero thickness interface model where contact tractions and displacement discontinuities are the primary static and kinematic variables respectively. In heterogeneous materials the response also depends on joint internal stresses. The introduction of internal stresses brings to the interphase model or an enhancement of the classical zero-thickness interface. With the term 'interphase' we shall mean a layer separa…

Mechanical responseMaterials scienceHeterogeneous materialMultilayer structureElasto plasticDisplacement discontinuityInterphaseZero-thickness interfacesComposite materialKinematic variableSettore ICAR/08 - Scienza Delle CostruzioniHeterogeneous structureFinite element analysis program
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