Search results for "dynamic test"

Methodologies for the Statistical Analysis of Memory Response to Radiation

2016

International audience; Methodologies are proposed for in-depth statistical analysis of Single Event Upset data. The motivation for using these methodologies is to obtain precise information on the intrinsic defects and weaknesses of the tested devices, and to gain insight on their failure mechanisms, at no additional cost. The case study is a 65 nm SRAM irradiated with neutrons, protons and heavy ions. This publication is an extended version of a previous study.

Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

2015

International audience; Various failure scenarios may occur during irradiation testing of SRAMs, which may generate different characteristic Multiple Cell Upset (MCU) error patterns. This work proposes a method based on spatial and temporal criteria to identify them.

Base-isolated structure equipped with tuned liquid column damper: An experimental study

2019

Abstract In this study, a novel passive vibration control strategy is investigated experimentally, where a Tuned Liquid Column Damper protects a base-isolated structure. The Tuned Liquid Column Damper is attached to the base, in contrast to typical attachment points of passive energy dissipation devices in high-rise buildings at elevated levels. Experiments on a base-excited small-scale three-story shear frame are conducted in order to study effects of both control devices – base-isolation and Tuned Liquid Column Damper – on the structural model. The dynamic properties of the stand-alone shear frame and the base-isolation subsystem are derived using standard dynamic test methods based on di…

Dynamic Test Methods for COTS SRAMs

2014

International audience; In previous works, we have demonstrated the importance of dynamic mode testing of SRAM components under ionizing radiation. Several types of failures are difficult to expose when the device is tested under static (retention) mode. With the purpose of exploring and defining the most complete testing procedures and reveal the potential hazardous behaviors of SRAM devices, we present novel methods for the dynamic mode radiation testing of SRAMs. The proposed methods are based on different word address accessing schemes and data background: Fast Row, Fast Column, Pseudorandom, Adjacent (Gray) and Inverse Adjacent (Gray). These methods are evaluated by heavy ion and atmos…

Numerical scheme influence on Pseudo Dynamic tests results

2008

Global and multiple test procedures using ordered p-values—a review

2004

This paper reviews global and multiple tests for the combination ofn hypotheses using the orderedp-values of then individual tests. In 1987, Rohmel and Streitberg presented a general method to construct global level α tests based on orderedp-values when there exists no prior knowledge regarding the joint distribution of the corresponding test statistics. In the case of independent test statistics, construction of global tests is available by means of recursive formulae presented by Bicher (1989), Kornatz (1994) and Finner and Roters (1994). Multiple test procedures can be developed by applying the closed test principle using these global tests as building blocks. Liu (1996) proposed represe…

On the improvement of monumental structure safety: a case study

2006

The present paper deals with the problem of the preservation of the monumental patrimony and discusses a practical application. The analysis methodology based on modern dynamic identification techniques was used for a monumental church in the historic area of Catania (Italy). The dynamic response of the church was measured in terms of accelerations, by means of vibration tests in situ. The numerical analyses highlighted the vulnerability of the drum dome system. Hence interest focused on this part of the building. A reduced scale model of the above system was built to be subjected to dynamic tests on a shaking table at the ENEA laboratory at Casaccia (Rome). Different kinds of reversible de…

Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random-Access Memory

2018

This paper identifies the failure modes of a commercial 130-nm ferroelectric random access memory. The devices were irradiated with heavy-ion and pulsed focused X-ray beams. Various failure modes are observed, which generate characteristic error patterns, affecting isolated bits, words, groups of pages, and sometimes entire regions of the memory array. The underlying mechanisms are discussed. peerReviewed