Search results for "electronics"
showing 10 items of 4340 documents
Low energy nano diffraction (LEND) – A versatile diffraction technique in SEM
2019
Abstract Electron diffraction is a powerful characterization method that is used across different fields and in different instruments. In particular, the power of transmission electron microscopy (TEM) largely relies on the capability to switch between imaging and diffraction mode enabling identification of crystalline phases and in-depth studies of crystal defects, to name only examples. In contrast, while diffraction techniques have found their way into the realm of scanning electron microscopy (SEM) in the form of electron backscatter diffraction and related techniques, on-axis transmission diffraction is still in its infancy. Here we present a simple but versatile setup that enables a ‘…
Electron transport and the effect of current annealing in a two-point contacted hBN/graphene/hBN heterostructure device
2020
In this work, we fabricated a 2D van der Waals heterostructure device in an inert nitrogen atmosphere by means of a dry transfer technique in order to obtain a clean and largely impurity free stack of hexagonal boron nitride (hBN)-encapsulated few-layer graphene. The heterostructure was contacted from the top with gold leads on two sides, and the device’s properties including intrinsic charge carrier density, mobility, and contact resistance were studied as a function of temperature from 4 K to 270 K. We show that the contact resistance of the device mainly originates from the metal/graphene interface, which contributes a significant part to the total resistance. We demonstrate that current…
An exact method for the determination of differential leakage factors in electrical machines with non-symmetrical windings
2016
An exact and simple method for the determination of differential leakage factors in polyphase ac electrical machines with non-symmetrical windings is presented in this paper. The method relies on the properties of Gorges polygons that are used to transform an infinite series expressing the differential leakage factor into a finite sum in order to significantly simplify the calculations. Some examples are shown and discussed in order to practically demonstrate the effectiveness of the proposed method.
Novel multipactor studies in RF satellite payloads: Single-carrier digital modulated signals and ferrite materials
2017
In this work it is reviewed the most novel advances in the multipactor RF breakdown risk assessment devoted to RF satellite microwave passive devices employed in space telecommunication systems. On one side, it is studied the effect of transmitting a single-carrier digital modulated signal in the multipactor RF voltage threshold in a coaxial line. On the other hand, an analysis of the multipactor phenomenon in a parallel-plate waveguide containing a magnetized ferrite slab it is presented.
High‐Quality Si‐Doped β‐Ga 2 O 3 Films on Sapphire Fabricated by Pulsed Laser Deposition
2020
The EU Horizon 2020 project CAMART2 is acknowledged for partly supporting the project, and the Ion Technology Centre, ITC, in Sweden is acknowledged for ion beam analysis (ERDA).
Partial discharges at different voltage waveshapes: Comparison between two different acquisition systems
2018
In modern HV apparatuses the wide use of electronic converters, increase the stress on the involved insulation systems and thus affect the reliability of the whole power grid. Additionally, such non-sinusoidal voltage shapes contain high gradient flanks that create problems in the detection of partial discharge (PD) activity. The aim of this paper is to discuss the methodology on how to suitably approach PD detection in insulation systems exposed to various voltage waveshapes in general by comparing two different measuring systems. The first one, equipped with a resonant PD decoupler, designed specifically for detection at typical power electronic waveshapes and the other one, based on an a…
Determination of Core Size Dependency on the EMI Suppression in Cable Ferrites
2020
Electromagnetic Compatibility (EMC) engineering should be approached via the systems approach, considering EMC throughout the design to anticipate possible electromagnetic interferences (EMI) problems. Nevertheless, an EMI source may appear when the designed device is supplied via an external power system or it is connected to another device to communicate to it. In these both cases, the cables or interfaces that interconnect the systems could represent the EMI source. Thereby, one of the most common techniques for reducing EMI in cables is the application of an EMI suppressor such as sleeve ferrite cores to them. The advantage of this solution is that it does not involve redesign the elect…
Polarity conversion of GaN nanowires grown by plasma-assisted molecular beam epitaxy
2019
International audience; It is demonstrated that the N-polarity of GaN nanowires (NWs) spontaneously nucleated on Si (111) by molecular beam epitaxy can be reversed by intercalation of an Al-or Ga-oxynitride thin layer. The polarity change has been assessed by a combination of chemical etching, Kelvin probe force microscopy, cathodo-and photoluminescence spectroscopy and transmission electron microscopy experiments. Cathodoluminescence of the Ga-polar NW section exhibits a higher intensity in the band edge region, consistent with a reduced incorporation of chemical impurities. The polarity reversal method we propose opens the path to the integration of optimized metal-polar NW devices on any…
Atomic Layer Deposition and Properties of Lanthanum Oxide and Lanthanum-Aluminum Oxide Films
2006
Atomic layer deposition (ALD) of lanthanum oxide on glass and silicon substrates was examined using lanthanum silylamide, La[N(SiMe 3 ) 2 ] 3 , and water as precursors in the substrate temperature range of 150-250 °C. The effect of pulse times and precursor evaporation temperature on the growth rate and refractive index was investigated. The films remained amorphous regardless of the deposition conditions. The resulting La 2 O 3 films contained noticeable amounts of hydrogen and silicon and were chemically unstable while stored in ambient air. Lanthanum aluminum oxide films were achieved with stoichiometry close to that of LaAlO 3 at 225°C from La[N(SiMe 3 ) 2 ] 3 , Al(CH 3 ) 3 , and H 2 O.…
Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM
2020
International audience; In this study, static and dynamic test methods were used to define the response of a self-refresh DRAM under thermal neutron irradiation. The neutron-induced failures were investigated and characterized by event cross-sections, soft-error rate and bitmaps evaluations, leading to an identification of permanent and temporarily stuck cells, block errors, and single-bit upsets.