Search results for "ohutkalvo"

Phosphites as precursors in atomic layer deposition thin film synthesis

2021

We here demonstrate a new route for deposition of phosphorous based materials by atomic layer deposition (ALD) using the phosphites Me3PO3 or Et3PO3 as precursors. These contain phosphorous in the oxidation state (III) and are open for deposition of reduced phases by ALD. We have investigated their applicability for the synthesis of LiPO and AlPO materials and characterized their growth by means of in situ quartz crystal microbalance. Phosphites are good alternatives to the established phosphate-based synthesis routes as they have high vapor pressure and are compatible with water as a coreactant during deposition. The deposited materials have been characterized using XPS, x-ray fluorescence…

Domain wall induced modulation of low field H-T phase diagram in patterned superconductor-ferromagnet stripes

2019

We present a systematic study of the magnetic domain wall induced modulation of superconducting transition temperature (Tc) in Nb/Ni bilayer stripes. By varying the thickness of the Ni layer from 20 nm to 100 nm we have been able to measure the low field Tc-H phase diagram spanning the Neel domain wall and Bloch domain wall range of thicknesses. Micromagnetic simulations and magnetic force microscopy measurements confirmed a stronger out-of-plane stray field in the Bloch domain walls compared to the Neel walls. A suppression in Tc was observed in the magnetization reversal region of the Ni film, the magnitude of which followed linearly to the strength of the out-of-plane stray field due to …

Blistering mechanisms of atomic-layer-deposited AlN and Al2O3 films

2017

Blistering of protective, structural, and functional coatings is a reliability risk pestering films ranging from elemental to ceramic ones. The driving force behind blistering comes from either excess hydrogen at the film-substrate interface or stress-driven buckling. Contrary to the stress-driven mechanism, the hydrogen-initiated one is poorly understood. Recently, it was shown that in the bulk Al-Al2O3 system, the blistering is preceded by the formation of nano-sized cavities on the substrate. The stress-and hydrogen-driven mechanisms in atomic-layer-deposited (ALD) films are explored here. We clarify issues in the hydrogen-related mechanism via high-resolution microscopy and show that at…

Cellulose-inorganic hybrids of strongly reduced thermal conductivity

2022

Abstract The employment of atomic layer deposition and spin coating techniques for preparing inorganic-organic hybrid multilayer structures of alternating ZnO-CNC layers was explored in this study. Helium ion microscopy and X-ray reflectivity showed the superlattice formation for the nanolaminate structures and atomic force microscopy established the efficient control of the CNCs surface coverage on the Al-doped ΖnO by manipulating the concentration of the spin coating solution. Thickness characterization of the hybrid structures was performed via both ellipsometry and X-ray reflectivity and the thermal conductivity was examined by time domain thermoreflectance technique. It appears that ev…

Properties of atomic layer deposited nanolaminates of zirconium and cobalt oxides

2018

Producción Científica

Heavy ion induced Ti X-ray satellite structure for Ti, TiN, and TiO2 thin films

2018

Energy of dendritic avalanches in thin-film superconductors

2018

A method for calculating stored magnetic energy in a thin superconducting film based on quantitative magneto-optical imaging is developed. Energy and magnetic moment are determined with these calculations for full hysteresis loops in a thin film of the superconductor NbN. Huge losses in energy are observed when dendritic avalanches occur. Magnetic energy, magnetic moment, sheet current and magnetic flux distributions, all extracted from the same calibrated magneto-optical images, are analyzed and discussed. Dissipated energy and the loss in moment when dendritic avalanches occur are related to each other. Calculating these losses for specific spatially-resolved flux avalanches is a great ad…

Thermal atomic layer deposition of AlOxNy thin films for surface passivation of nano-textured flexible silicon

2019

Abstract Aluminum oxynitride (AlOxNy) films with different nitrogen concentration are prepared by thermal atomic layer deposition (ALD) for flexible nano-textured silicon (NT-Si) surface passivation. The AlOxNy films are shown to exhibit a homogeneous nitrogen-doping profile and the presence of an adequate amount of hydrogen, which is investigated by Time-of-Fight Elastic Recoil Detection Analysis (ToF-ERDA). The effective minority carrier lifetimes are measured after the NT-Si surface passivation; the minimum surface recombination velocity (SRV) of 5 cm-s−1 is achieved with the AlOxNy film in comparison to the Al2O3 and AlN films (SRV of 7–9 cm-s−1). The better SRV with AlOxNy film is due …

Monte Carlo -simulaatioiden käyttö rekyylispektrometrimittausten analysoinnissa

2010

Strong absorption and ultrafast localisation in NaBiS2 nanocrystals with slow charge-carrier recombination.

2022

Funder: AiF Project, no: ZIM-KK5085302DF0