Search results for "radiation effects"

showing 10 items of 97 documents

Meiosis in translocation heterozygotes in the mosquito Culex pipiens.

1971

Adult Culex pipiens males irradiated with both X-rays and neutrons were crossed to untreated females and F1-egg rafts were checked for dominant lethality. F1-progenies were outcrossed with normal individuals in order to obtain lines with inherited semisterility. From a total of 120 lines that showed a certain amount of sterility 12 lines were studied cytologically. 10 lines showed reciprocal chromosome exchanges.—At late pachytene and diplotene cross configurations with large asynaptic regions at the center of the cross are obligatory. Bivalents, chains of three, chains of four, and ring configurations are present at metaphase and anaphase I. The different frequencies of the occurrence of s…

MaleHeterozygoteBiometryMitosisInterference (genetic)ChromosomesMeiosisCulex pipiensCentromereGeneticsAnimalsCrossing Over GeneticMetaphaseGenetics (clinical)Crosses GeneticAnaphaseGenes DominantGeneticsChromosome AberrationsNeutronsbiologyChromosomebiology.organism_classificationChiasmaRadiation EffectsCulexMeiosisInfertilityFemaleGenes LethalChromosoma
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The role of impurities in the irradiation induced densification of amorphous SiO(2).

2011

In a recent work (Buscarino et al 2009 Phys. Rev. B 80 094202), by studying the properties of the (29)Si hyperfine structure of the E'(γ) point defect, we have proposed a model able to describe quantitatively the densification process taking place upon electron irradiation in amorphous SiO(2) (a-SiO(2)). In particular, we have shown that it proceeds heterogeneously, through the nucleation of confined densified regions statistically dispersed into the whole volume of the material. In the present experimental investigation, by using a similar approach on a wider set of materials, we explore how this process is influenced by impurities, such as OH and Cl, typically involved in relevant concent…

Materials scienceNucleationCondensed Matter PhysicsCrystallographic defectAmorphous solidlaw.inventionChemical engineeringImpuritylawamorphous silicon dioxide sio2 irradiation effects electron irradiation point defects electron paramagnetic resonance densityElectron beam processingGeneral Materials ScienceIrradiationElectron paramagnetic resonanceHyperfine structureJournal of physics. Condensed matter : an Institute of Physics journal
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Positron lifetime measurements on neutron‐irradiated InP crystals

1996

Neutron‐irradiated InP single crystals have been investigated by positron‐lifetime measurements. The samples were irradiated with thermal neutrons at different fluences yielding concentrations for Sn‐transmuted atoms between 2×1015 and 2×1018 cm−3. The lifetime spectra have been analyzed into one exponential decay component. The mean lifetimes show a monotonous increase with the irradiation dose from 246 to 282 ps. The increase in the lifetime has been associated to a defect containing an Indium vacancy. Thermal annealing at 550 °C reduces the lifetime until values closed to those obtained for the as‐grown and conventionally doped InP crystals. navarrof@evalvx.ific.uv.es ; Jose.Ferrero@uv.es

Materials sciencePhysics::Instrumentation and DetectorsPhysics::Medical PhysicsAnalytical chemistryGeneral Physics and Astronomychemistry.chemical_elementDefect StructureMonocrystalsSpectral lineCondensed Matter::Materials Science:FÍSICA [UNESCO]Vacancy defectNeutronIrradiationIndium Phosphides ; Radiation Effects ; Thermal Neutrons ; Monocrystals ; Positron Probes ; Lifetime ; Defect StructureExponential decayPositron ProbesDopingRadiochemistryUNESCO::FÍSICANeutron temperatureRadiation EffectschemistryIndium PhosphidesThermal NeutronsLifetimeIndiumJournal of Applied Physics
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Incident angle effect on heavy ion induced reverse leakage current in SiC Schottky diodes

2016

Heavy-ion induced degradation in the reverse leakage current of SiC Schottky power diodes shows distinct dependence on the angle of incidence. TCAD simulations have been used to study the physical mechanisms involved.

Materials scienceSchottky barrierchemistry.chemical_elementSchottky diodes01 natural sciencesIonpower semiconductor devicesReverse leakage currentchemistry.chemical_compoundXenonsilicon carbide0103 physical sciencesSilicon carbidecurrent-voltage characteristicsDiode010302 applied physicsta114ta213010308 nuclear & particles physicsbusiness.industrySchottky diodeAngle of incidencemodelingchemistryOptoelectronicsbusinession radiation effects
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Impact of Gamma Radiation on Dynamic RDSON Characteristics in AlGaN/GaN Power HEMTs

2019

GaN high-electron-mobility transistors (HEMTs) are promising next-generation devices in the power electronics field which can coexist with silicon semiconductors, mainly in some radiation-intensive environments, such as power space converters, where high frequencies and voltages are also needed. Its wide band gap (WBG), large breakdown electric field, and thermal stability improve actual silicon performances. However, at the moment, GaN HEMT technology suffers from some reliability issues, one of the more relevant of which is the dynamic on-state resistance (R) regarding power switching converter applications. In this study, we focused on the drain-to-source on-resistance (R) characteristic…

Materials scienceassurance testingRadiation effects02 engineering and technologyHigh-electron-mobility transistorradiation hardness01 natural scienceslcsh:Technologylaw.inventiontotal ionizing dose (TID)lawPower electronics0103 physical sciencesGeneral Materials Sciencelcsh:MicroscopyHigh-electron-mobility transistor (HEMT)Radiation hardeningLeakage (electronics)lcsh:QC120-168.85010302 applied physicsRadiation hardnessAssurance testinghigh-electron-mobility transistor (HEMT)lcsh:QH201-278.5business.industrylcsh:TTransistorWide-bandgap semiconductor021001 nanoscience & nanotechnologyThreshold voltageSemiconductorlcsh:TA1-2040Gallium nitride (GaN)adiation effectsradiation effectsOptoelectronicslcsh:Descriptive and experimental mechanicslcsh:Electrical engineering. Electronics. Nuclear engineeringTotal ionizing dosegallium nitride (GaN)0210 nano-technologybusinesslcsh:Engineering (General). Civil engineering (General)lcsh:TK1-9971Materials
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Production of mass-separated Erbium-169 towards the first preclinical in vitro investigations

2021

The β−-particle-emitting erbium-169 is a potential radionuclide toward therapy of metastasized cancer diseases. It can be produced in nuclear research reactors, irradiating isotopically-enriched 168Er2O3. This path, however, is not suitable for receptor-targeted radionuclide therapy, where high specific molar activities are required. In this study, an electromagnetic isotope separation technique was applied after neutron irradiation to boost the specific activity by separating 169Er from 168Er targets. The separation efficiency increased up to 0.5% using resonant laser ionization. A subsequent chemical purification process was developed as well as activity standardization of the radionuclid…

Medicine (General)Health Physics and Radiation Effectselectromagnetic isotope separationEr-169030218 nuclear medicine & medical imagingIsotope separationlaw.invention03 medical and health sciencesR5-9200302 clinical medicineErbium-169lawLASER RESONANCE IONIZATIONIonizationEr-169; activity standardization; electromagnetic isotope separation; in vitro studies; lanthanide-separation; laser resonance ionizationNeutron irradiationOriginal Researchin vitro studiesRadionuclideChemistryRadiochemistryGeneral MedicineLANTHANIDE-SEPARATIONIn vitroELECTROMAGNETIC ISOTOPE SEPARATIONER-169030220 oncology & carcinogenesisRadionuclide therapyMedicinelanthanide-separationactivity standardizationSpecific activitylaser resonance ionizationACTIVITY STANDARDIZATIONIN VITRO STUDIESFrontiers in Medicine
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Technology Impact on Neutron-Induced Effects in SDRAMs : A Comparative Study

2021

International audience; This study analyses the response of synchronous dynamic random access memories to neutron irradiation. Three different generations of the same device with different node sizes (63, 72, and 110 nm) were characterized under an atmospheric-like neutron spectrum at the ChipIr beamline in the Rutherford Appleton Laboratories, UK. The memories were tested with a reduced refresh rate to expose more single-event upsets and under similar conditions provided by a board specifically developed for this type of study in test facilities. The board has also been designed to be used as a nanosatellite payload in order to perform similar tests. The neutron-induced failures were studi…

NeutronsComputer sciencePayloadkäyttömuistitStuck Bitsneutronitmuistit (tietotekniikka)Technology impactSEERefresh rate[SPI.TRON]Engineering Sciences [physics]/ElectronicsRadiation EffectsBeamlinesäteilyfysiikkaNeutronNode (circuits)[INFO.INFO-ES]Computer Science [cs]/Embedded Systems[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsSDRAMNeutron irradiationSimulationRandom accessavaruustekniikka
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Effects of high-energy electrons in advanced NAND flash memories

2016

We study the effects of high-energy electrons on advanced NAND Flash memories with multi-level and single-level cell architecture. We analyze the error rate in floating gate cells as a function of electron energy, evaluate the impact of total ionizing dose, and discuss the physical origin of the observed behavior.

NeutronsHigh energyRadiationElectron energy010308 nuclear & particles physicsComputer sciencebusiness.industryNAND gateAlpha Particles; Flash; Neutrons; Radiation Effects; Single Event Upset; Electrical and Electronic Engineering; RadiationElectronAlpha Particles01 natural sciencesThreshold voltageRadiation EffectsFlash (photography)Error analysisAbsorbed dose0103 physical sciencesElectronic engineeringOptoelectronicsElectrical and Electronic EngineeringFlashbusinessSingle Event Upset2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
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Methodologies for the Statistical Analysis of Memory Response to Radiation

2016

International audience; Methodologies are proposed for in-depth statistical analysis of Single Event Upset data. The motivation for using these methodologies is to obtain precise information on the intrinsic defects and weaknesses of the tested devices, and to gain insight on their failure mechanisms, at no additional cost. The case study is a 65 nm SRAM irradiated with neutrons, protons and heavy ions. This publication is an extended version of a previous study.

Nuclear and High Energy PhysicsEngineeringHardware_PERFORMANCEANDRELIABILITYRadiation[PHYS.NEXP]Physics [physics]/Nuclear Experiment [nucl-ex]01 natural sciencesstatistical analysis0103 physical sciencesStatic testingElectronic engineeringmemory responseStatistical analysisSensitivity (control systems)Static random-access memoryElectrical and Electronic Engineeringstatic testCluster of bit-flipsdynamic test010302 applied physicsSingle event upset SEURandom access memoryta114ta213010308 nuclear & particles physicsbusiness.industrymultiple cell upset (MCU)säteilySRAMReliability engineeringradiationNuclear Energy and EngineeringSingle event upsetradiation effectsbusiness[MATH.MATH-NA]Mathematics [math]/Numerical Analysis [math.NA]Dynamic testing
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Application and development of ion-source technology for radiation-effects testing of electronics

2017

Abstract Studies of heavy-ion induced single event effect (SEE) on space electronics are necessary to verify the operation of the components in the harsh radiation environment. These studies are conducted by using high-energy heavy-ion beams to simulate the radiation effects in space. The ion beams are accelerated as so-called ion cocktails, containing several ion beam species with similar mass-to-charge ratio, covering a wide range of linear energy transfer (LET) values also present in space. The use of cocktails enables fast switching between beam species during testing. Production of these high-energy ion cocktails poses challenging requirements to the ion sources because in most laborat…

Nuclear and High Energy PhysicsIon beamNuclear engineeringCyclotron01 natural sciencesElectron cyclotron resonance010305 fluids & plasmasIonlaw.inventionion sourcesacceleratorsPhysics::Plasma Physicslaw0103 physical sciencesNuclear ExperimentInstrumentationRange (particle radiation)ta114010308 nuclear & particles physicsChemistryIon sourcebeam cocktailsradiation effectsCathode rayPhysics::Accelerator PhysicsAtomic physicsBeam (structure)Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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