Search results for "silicon"

showing 10 items of 1391 documents

Luminescent silicon nanocrystals produced by near-infrared nanosecond pulsed laser ablation in water

2014

Abstract We report the investigation of luminescent nanoparticles produced by ns pulsed Nd:YAG laser ablation of silicon in water. Combined characterization by AFM and IR techniques proves that these nanoparticles have a mean size of ∼3 nm and a core–shell structure consisting of a Si-nanocrystal surrounded by an oxide layer. Time resolved luminescence spectra evidence visible and UV emissions; a band around 1.9 eV originates from Si-nanocrystals, while two bands centered at 2.7 eV and 4.4 eV are associated with oxygen deficient centers in the SiO 2 shell.

Materials scienceSiliconCore–shellmedicine.medical_treatmentOxideAnalytical chemistryGeneral Physics and Astronomychemistry.chemical_elementNanoparticleSpectral lineAtomic force microscopychemistry.chemical_compoundmedicineSi nanocrystalLaser ablationLaser ablation;Si nanocrystal;Silica;Core–shell;Time-resolved luminescence;Atomic force microscopy;Micro-Raman;IR absorptionNear-infrared spectroscopyTime-resolved luminescenceSilicaSurfaces and InterfacesGeneral ChemistryCondensed Matter PhysicsAblationLaser ablationSurfaces Coatings and FilmsMicro-RamanchemistryLuminescenceIR absorption
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Intrinsic defect formation in amorphousSiO2by electronic excitation: Bond dissociation versus Frenkel mechanisms

2008

Two competing mechanisms of intrinsic defect formation in amorphous ${\text{SiO}}_{2}$ $(a{\text{-SiO}}_{2})$, i.e., the vacancy-interstitial (Frenkel) mechanism and Si-O bond dissociation to form silicon and oxygen dangling bonds, were compared under $\ensuremath{\gamma}$-ray electronic excitation. The Frenkel mechanism was found to be dominant. The concentrations of both kinds of defects strongly correlate with the degree of the structural disorder of $a{\text{-SiO}}_{2}$, providing experimental evidence that both types of intrinsic defect pairs are formed mainly from the strained Si-O-Si bonds. The bond dissociation mechanism is more susceptible to the structural disorder than the vacanc…

Materials scienceSiliconDangling bondchemistry.chemical_elementCondensed Matter PhysicsDissociation (chemistry)Electronic Optical and Magnetic MaterialsAmorphous solidCrystallographychemistryKröger–Vink notationFrenkel defectAtomic physicsExcitationPhysical Review B
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3D modeling of doping from the atmosphere in floating zone silicon crystal growth

2017

Abstract Three-dimensional numerical simulations of the inert gas flow, melt flow and dopant transport in both phases are carried out for silicon single crystal growth using the floating zone method. The mathematical model allows to predict the cooling heat flux density at silicon surfaces and realistically describes the dopant transport in case of doping from the atmosphere. A very good agreement with experiment is obtained for the radial resistivity variation profiles by taking into account the temperature dependence of chemical reaction processes at the free surface.

Materials scienceSiliconDopantDopingchemistry.chemical_element02 engineering and technology021001 nanoscience & nanotechnologyCondensed Matter Physics01 natural sciences010305 fluids & plasmasInorganic ChemistryMonocrystalline siliconHeat fluxchemistryElectrical resistivity and conductivityChemical physicsCondensed Matter::SuperconductivityFree surface0103 physical sciencesMaterials Chemistry0210 nano-technologyInert gasJournal of Crystal Growth
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Silicon-based light-emitting devices: Properties and applications of crystalline, amorphous and er-doped nanoclusters

2006

In this paper, we summarize the results of an extensive investigation on the properties of MOS-type light-emitting devices based on silicon nanostructures. The performances of crystalline, amorphous, and Er-doped Si nanostructures are presented and compared. We show that all devices are extremely stable and robust, resulting in an intense room temperature electroluminescence (EL) at around 900 nm or at 1.54 μm. Amorphous nanoclusters are more conductive than the crystalline counterpart. In contrast, nonradiative processes seem to be more efficient for amorphous clusters resulting in a lower quantum efficiency. Erbium doping results in the presence of an intense EL at 1.54 μm with a concomit…

Materials scienceSiliconElectroluminescent devicechemistry.chemical_elementNanocrystalQUANTUM DOTSElectroluminescenceSettore ING-INF/01 - ElettronicaSettore FIS/03 - Fisica Della MateriaNanoclustersErbiumIntegrated optoelectronicElectroluminescence (EL)Light-emitting deviceOptical interconnectionElectrical and Electronic Engineeringbusiness.industryDopingOPTICAL-PROPERTIESAtomic and Molecular Physics and OpticsAmorphous solid1.54 MU-MchemistryNanocrystalOptoelectronicsQuantum efficiencySI NANOCRYSTALSENERGY-TRANSFERbusinessErbium
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Cathodoluminescence of crystalline and amorphous SiO2 and GeO2

2001

Abstract Cathodoluminescence (CL) and its temperature-dose behaviour are presented for different crystalline and amorphous modifications of SiO 2 and GeO 2 as well as for Ge-doped SiO 2 layers. The crystalline samples include four-fold coordinated Si and Ge in hexagonal quartz and quartz-like crystals, respectively, as well six-fold coordinated atoms in tetragonal rutile-like crystals. The detected luminescence bands, in general, are attributed to three optical active luminescence centres: the two-fold coordinated silicon (=Si:) and germanium (=Ge:) centre, respectively, the non-bridging oxygen hole centre (NBOHC) and the self trapped exciton (STE). The first ones, the oxygen deficient cent…

Materials scienceSiliconExcitonMineralogychemistry.chemical_elementCathodoluminescenceGermaniumCondensed Matter PhysicsElectronic Optical and Magnetic MaterialsAmorphous solidTetragonal crystal systemCrystallographychemistryMaterials ChemistryCeramics and CompositesLuminescenceQuartzJournal of Non-Crystalline Solids
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The effects of ion implantation damage to photonic crystal optomechanical resonators in silicon

2021

Abstract Optomechanical resonators were fabricated on a silicon-on-insulator substrate that had been implanted with phosphorus donors. The resonators’ mechanical and optical properties were then measured (at 6 K and room temperature) before and after the substrate was annealed. All measured resonators survived the annealing and their mechanical linewidths decreased while their optical and mechanical frequencies increased. This is consistent with crystal lattice damage from the ion implantation causing the optical and mechanical properties to degrade and then subsequently being repaired by the annealing. We explain these effects qualitatively with changes in the silicon crystal lattice struc…

Materials scienceSiliconFOS: Physical sciencesPhysics::Opticschemistry.chemical_element02 engineering and technology01 natural sciencesCondensed Matter::Materials ScienceResonatorMesoscale and Nanoscale Physics (cond-mat.mes-hall)0103 physical sciencesion implantation010306 general physicsPhotonic crystalCondensed Matter - Materials ScienceCondensed Matter - Mesoscale and Nanoscale Physicsbusiness.industrytechnology industry and agricultureMaterials Science (cond-mat.mtrl-sci)silicon021001 nanoscience & nanotechnologyoptomechanicsIon implantationchemistryOptoelectronics0210 nano-technologybusinessnanomechanical resonatorphotonic crystalOptics (physics.optics)Physics - OpticsMaterials for Quantum Technology
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Stress-induced dislocation generation in large FZ- and CZ-silicon single crystals—numerical model and qualitative considerations

2001

When growing silicon crystals with higher diameter (presently up to 300 mm) the thermal stresses and possible dislocation generation in single crystals become a serious problem for both FZ- and CZ-methods. A two-dimensional problem oriented code for the FEM-package ANSYS has been developed to calculate the temperature field in the growing crystal considering radiation exchange with reflectors and environment and thermal stresses. Comparing calculated stresses with critical stresses, the dislocated zone is determined. A qualitative concept for the occurrence of dislocations using the metastable state is developed. In a parametric study for different thermal boundary conditions and crystal ge…

Materials scienceSiliconField (physics)Mineralogychemistry.chemical_elementMechanicsCondensed Matter PhysicsFinite element methodInorganic ChemistryStress (mechanics)CrystalchemistryMetastabilityThermalMaterials ChemistryDislocationJournal of Crystal Growth
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Structural evolution of CO2 filled pure silica LTA zeolite under high-pressure high-temperature conditions

2017

[EN] The crystal structure of CO2-filled pure-SiO2 LTA zeolite has been studied at high pressures and temperatures using synchrotron-based X-ray powder diffraction. Its structure consists of 13 CO2 guest molecules, 12 of them accommodated in the large alpha-cages and one in the beta-cages, giving a SiO2/CO2 stoichiometric ratio smaller than 2. The structure remains stable under pressure up to 20 GPa with a slight pressure-dependent rhombohedral distortion, indicating that pressure-induced amorphization is prevented by the insertion of guest species in this open framework. The ambient temperature lattice compressibility has been determined. In situ high-pressure resistive-heating experiments…

Materials scienceSiliconGeneral Chemical EngineeringAnalytical chemistrychemistry.chemical_elementFOS: Physical sciences02 engineering and technologyCrystal structure010402 general chemistry01 natural sciencesChemical reactionNegative thermal expansionPhysics - Chemical PhysicsMaterials ChemistryMoleculeZeoliteChemical Physics (physics.chem-ph)Condensed Matter - Materials ScienceMaterials Science (cond-mat.mtrl-sci)General Chemistry021001 nanoscience & nanotechnology0104 chemical sciencesCrystallographychemistry0210 nano-technologyStoichiometryPowder diffraction
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Evaluation of the Performance of Published Point Defect Parameter Sets in Cone and Body Phase of a 300 mm Czochralski Silicon Crystal

2021

Prediction and adjustment of point defect (vacancies and self-interstitials) distribution in silicon crystals is of utmost importance for microelectronic applications. The simulation of growth processes is widely applied for process development and quite a few different sets of point defect parameters have been proposed. In this paper the transient temperature, thermal stress and point defect distributions are simulated for 300 mm Czochralski growth of the whole crystal including cone and cylindrical growth phases. Simulations with 12 different published point defect parameter sets are compared to the experimentally measured interstitial–vacancy boundary. The results are evaluated for stand…

Materials scienceSiliconGeneral Chemical EngineeringPhase (waves)chemistry.chemical_element02 engineering and technology01 natural sciencesInorganic ChemistryCrystalMonocrystalline silicon0103 physical sciencesheat transfercomputer simulationpoint defectsGeneral Materials SciencePoint (geometry)010302 applied physicsEquilibrium pointCrystallographyCzochralskisilicon021001 nanoscience & nanotechnologyCondensed Matter PhysicsCrystallographic defectthermal stressComputational physicschemistryQD901-999Heat transfer0210 nano-technologyCrystals
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Dense Mosi2 produced by reactive flash sintering: Control of Mo/Si agglomerates prepared by high-energy ball milling

2011

The objective of this work is to determine the influence of the agglomeration state of the MA mixture on the microstructure and the chemical composition of SPS end-products. In order to produce MoSi2 with a microstructure and a density perfectly controlled via reactive sintering implying an SHS reaction, the characteristics of Mo/Si mechanically activated (MA) powder mixtures were investigated. Indeed, the MA powders have been characterized in terms of their surface specific area, size, phase composition and microstructure. The high-energy milling allows the formation of agglomerates (0.8 to 800 μm) composed of nanometric crystallites of molybdenum and silicon, as a consequence of a continu…

Materials scienceSiliconGeneral Chemical EngineeringSinteringMineralogySpark plasma sinteringchemistry.chemical_elementMicrostructurechemistryChemical engineeringAgglomerateSpecific surface areaCrystalliteBall millPowder Technology
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