Search results for "sputtering"

showing 10 items of 136 documents

Synthesis and characterization of cobalt silicide films on silicon

2006

Cobalt silicide has emerged as a leading contact material in silicon technology due to its low resistivity, high stability and small lattice mismatch. In this study, 0.2-0.4 mu m thick Co films were deposited on Si(100) wafers by RF magnetron sputtering at room temperature, and annealed at temperatures from 600 to 900 degrees C in vacuum. As-deposited and annealed samples were characterized by Rutherford backscattering spectrometry (RBS), nuclear reaction analysis (NRA), X-ray diffraction (XRD) and scanning electron microscopy (SEM). Although the Si substrates were sputter cleaned before the deposition, all the samples showed a thin oxide layer at the Si/Co interfaces. Annealing up to 700 d…

Nuclear and High Energy PhysicsMaterials scienceSiliconScanning electron microscopeAnnealing (metallurgy)Analytical chemistrychemistry.chemical_elementSputter depositionRutherford backscattering spectrometrychemistrySputteringElectrical resistivity and conductivityNuclear reaction analysisInstrumentationNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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Corrosion processes and their inhibition as studied by Mössbauer conversion and other electron spectroscopies

1989

To study corrosion processes of iron and steel and measures of their inhibition, a detailed knowledge of the phase composition and of phase transformations in very thin layers close to the attacked surface of the material is necessary. The information depths of integral (ICEMS) and depth selective (DCEMS) conversion electron Mossbauer spectroscopy are well suited for such investigations, but some effort is necessary if technical samples, i.e. nonenriched in57Fe, are to be studied. In many cases of practical importance, full information on the corroded surfaces cannot be got from Mossbauer spectra only, and a combination with Auger and photoelectron spectroscopies, in-including scanning and …

Nuclear and High Energy PhysicsThin layersMaterials scienceAnalytical chemistryElectronCondensed Matter PhysicsAtomic and Molecular Physics and OpticsAugerCorrosionConversion electron mössbauer spectroscopySputteringPhase (matter)Mössbauer spectroscopyPhysical and Theoretical ChemistryHyperfine Interactions
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Molecular dynamics simulation of the damage production in Al (110) surface with slow argon ions

1986

We have developed a molecular dynamics simulation program to gain more insight into the sputtering process, especially the damage produced by it. We have studied the sputtering of aluminium (110) surface with argon ions. The Morse pair potentail was used for Al−Al interaction, the Lennard-Jones potential for Ar−Ar interaction and both the Moliere potential and the universal potential of Ziegler et al. for Ar−Al interaction. An electronic friction term proportional to the particle velocities was also used. The studied incident argon ion energies and angles were 200 and 400 eV and 0° (normal), 25°, 45° and 75°, respectively. The calculated sputtering yield and the overall shape and the mean d…

Nuclear and High Energy PhysicsYield (engineering)Argonchemistry.chemical_elementIonCondensed Matter::Materials ScienceMolecular dynamicschemistryPhysics::Plasma PhysicsAluminiumSputteringVacancy defectParticleAtomic physicsInstrumentationNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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Measuring the isotope effect on the gross beryllium erosion in JET

2022

Abstract The isotope effect, hydrogen (H) versus deuterium (D), on the gross beryllium (Be) erosion yield has been measured in ohmic limiter plasmas in JET tokamak by spectroscopic means. A simplified method to extract the effective sputtering yield from the quotient of the radiances of the D α or D γ and the Be II lines at 527 nm was applied. A clear isotope effect has been found, the erosion yield of D being about a factor of 2 larger compared to H in the whole explored plasma density range. This is in agreement with physical sputtering data obtained with H+ and D+ ion beams and also with material surface computer simulations. The already published contribution of chemically assisted phys…

Nuclear and High Energy PhysicsspectroscopyJETsputteringddc:620Condensed Matter Physicsberylliumerosionisotopelimiter
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Ion beam development for the needs of the JYFL nuclear physics programme

2008

The increased requirements towards the use of higher ion beam intensities motivated us to initiate the project to improve the overall transmission of the K130 cyclotron facility. With the facility the transport efficiency decreases rapidly as a function of total beam intensity extracted from the JYFL ECR ion sources. According to statistics, the total transmission efficiency is of the order of 10% for low beam intensities (I(total)or =0.7 mA) and only about 2% for high beam intensities (I(total)1.5 mA). Requirements towards the use of new metal ion beams for the nuclear physics experiments have also increased. The miniature oven used for the production of metal ion beams at the JYFL is not …

Nuclear physicsCryostatMaterials scienceIon beamlawSputteringCyclotronBremsstrahlungInstrumentationBeam (structure)Ion sourcelaw.inventionIonReview of Scientific Instruments
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Versatile use of ion beams for diffusion studies by the modified radiotracer technique

2004

Abstract In the modified radiotracer technique ion beams within a broad energy range are employed. They include energetic light particles ensuring radioactive isotope production via nuclear reactions, keV-ion implantation of radiotracers and sputtering by low energy heavy ions for depth profiling. If the involved ion–solid interactions are properly taken into account, the technique provides an effective means for solid-state diffusion studies under demanding conditions. The various aspects related to the modified radiotracer technique are surveyed and discussed. The reliability of the procedure is demonstrated by comparisons with corresponding profiles obtained by secondary ion mass spectro…

Nuclear reactionNuclear and High Energy PhysicsRange (particle radiation)PhotonIon beamChemistryAnalytical chemistry010403 inorganic & nuclear chemistry01 natural sciences7. Clean energy0104 chemical sciencesIonSecondary ion mass spectrometrySputtering0103 physical sciencesDiffusion (business)010306 general physicsInstrumentationNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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Mechanical behavior and limits to the microhardness testing of hard multilayer coatings on soft substrates

2000

Multilayer coatings of (Ti, Al) N x , (Ti, C)N x and (Nb, C)N x with bilayer thickness of 0.8-8 nm have been deposited by reactive sputtering on stainless steel substrates. Vickers microhardness measurements in the load range of 3.10 -3 to 1 N were performed using a self-adjusting tester. It has been shown that in order to obtain the true hardness of multilayer coatings on a softer substrate, the indentation depth should not exceed about 10% of the coating thickness. Indentation criteria for polycrystalline, amorphous and nanostructured multilayer coatings are compared. The obtained criterion for multilayer coatings is close to that for amorphous films.

Optical coatingMaterials scienceCoatingSputteringIndentationMetallurgyVickers hardness testengineeringengineering.materialSputter depositionIndentation hardnessAmorphous solidSPIE Proceedings
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Sputtered cuprous oxide thin films and nitrogen doping by ion implantation

2016

Abstract The structural, optical and electrical properties of sputtered cuprous oxide thin films have been optimized through post-deposition thermal treatments. Moreover we have studied the effects of nitrogen doping introduced by ion implantation followed by the optimized oxidant thermal annealing. Three concentrations have been used, 0.6 N%, 1.2 N%, and 2.5 N%. Along with the preservation of the Cu 2 O phase, a slight optical band gap narrowing and a significant conductivity enhancement has been observed with respect to the undoped samples. These results can be justified by the absence of further oxygen vacancies promoted by dopant introduction and by the substitution of O atoms by N ones…

OxidantPostimplantation annealingLattice configurationMaterials scienceBand gapAnnealing (metallurgy)NitrogenInorganic chemistryOxidePhotovoltaic application02 engineering and technology01 natural sciencesOxygen vacancieSettore ING-INF/01 - ElettronicaSettore FIS/03 - Fisica Della Materiachemistry.chemical_compoundSputtering0103 physical sciencesMaterials ChemistryDopingSemiconductor dopingConductivity enhancementDoping (additives)Thin filmIonDepositionOxide film010302 applied physicsDopantDopingMetals and AlloysSputteringSurfaces and Interfaces021001 nanoscience & nanotechnologyOut of equilibriumSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsEnergy gapOptical and electrical propertieIon implantationchemistryIon implantationThermal-annealing0210 nano-technologyCopperCuprous oxide
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Formation and evolution of self-organized Au nanorings on indium-tin-oxide surface

2011

This work reports on the formation of Au nanoclusters and on their evolution in nanoring structures on indium-tin-oxide surface by sputtering deposition and annealing processes. The quantification of the characteristics of the nanorings (surface density, depth, height, and width) is performed by atomic force microscopy. The possibility to control these characteristics by tuning annealing temperature and time is demonstrated establishing relations which allow to set the process parameters to obtain nanostructures of desired morphological properties for various technological applications. © 2011 American Institute of Physics.

PLASMON RESONANCEMaterials scienceNanostructureNanoringPhysics and Astronomy (miscellaneous)Annealing (metallurgy)NanotechnologySputter depositionAu; Nanoring; Atomic force microscopySettore ING-INF/01 - ElettronicaIndium tin oxideNanoclustersAtomic force microscopyNanolithographyITO THIN-FILMSSputteringGOLD NANOPARTICLESAuNanoring
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Étude par microscopie électronique et spectroscopie de films minces catalytiques pour micro piles à combustibles

2016

Předložená dizertační práce se zabývá studiem nových katalyzátorů na bázi kov-oxid vhodných pro použití v palivových článcích na straně anody. Platinou dopovaný oxid ceru připravený magnetronovým naprašováním ve formě tenkých vrstev na uhlíkových mezivrstvách nesených křemíkovým substrátem byl zkoumán prostřednictvím mikroskopických a spektroskopických metod. Vliv složení uhlíkového nosiče (a-C a CNx filmy), depozičního času CeOx vrstvy a dalších depozičních parametrů, např. depoziční rychlosti, složení pracovní atmosféry a Pt koncentrace na morfologii Pt-CeOx vrstev byl studován převážně pomocí transmisní elektronové mikroskopie (TEM). Získané výsledky ukazují, že vhodnou kombinací depozič…

Palivové článkyFuel cellTransmisní elektronový mikroskopCer oxidCerium oxidePulvérisation cathodique magnétron[CHIM.THEO] Chemical Sciences/Theoretical and/or physical chemistryMagnetronové naprašováníOxyde de cériumPlatinePile à combustiblePlatinaTransmission Electron MicroscopyMicroscopie électronique en transmissionMagnetron sputteringPlatinum
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