0000000000075519
AUTHOR
Yacine Kadi
showing 7 related works from this author
Impact of Terrestrial Neutrons on the Reliability of SiC VD-MOSFET Technologies
2021
Accelerated terrestrial neutron irradiations were performed on different commercial SiC power MOSFETs with planar, trench and double-trench architectures. The results were used to calculate the failure cross-sections and the failure in time (FIT) rates at sea level. Enhanced gate and drain leakage were observed in some devices which did not exhibit a destructive failure during the exposure. In particular, a different mechanism was observed for planar and trench gate MOSFETs, the first showing a partial gate rupture with a leakage path mostly between drain and gate, similar to what was previously observed with heavy-ions, while the second exhibiting a complete gate rupture. The observed fail…
Neutron capture cross section measurements for nuclear astrophyisics at CERN n_TOF
2005
A series of neutron capture cross section measurements of interest to nuclear astrophysics have been recently performed at n_TOF, the neutron spallation source operating at CERN. The low repetition frequency of the proton beam driver, the extremely high instantaneous neutron flux, and the low background conditions in the experimental area are optimal for capture cross section measurements on low-mass or radioactive samples. An overview of the measurements performed during the two experimental campaigns in 2002 and 2003 is presented with special emphasis on the measurement of the capture cross sections of the Os isotopes relevant for the cosmochronology based on the Re/Os clock. http://www.s…
Heavy-Ion Microbeam Studies of Single-Event Leakage Current Mechanism in SiC VD-MOSFETs
2020
Heavy-ion microbeams are employed for probing the radiation-sensitive regions in commercial silicon carbide (SiC) vertical double-diffused power (VD)-MOSFETs with micrometer accuracy. By scanning the beam spot over the die, a spatial periodicity was observed in the leakage current degradation, reflecting the striped structure of the power MOSFET investigated. Two different mechanisms were observed for degradation. At low drain bias (gate and source grounded), only the gate-oxide (at the JFET or neck region) is contributing in the ion-induced leakage current. For exposures at drain–source bias voltages higher than a specific threshold, additional higher drain leakage current is observed in t…
Combined Temperature Radiation Effects and Influence of Drawing Conditions on Phosphorous‐Doped Optical Fibers
2018
International audience; This work focuses on the effects of high dose ionizing radiation, up to 10 MGy(SiO2), on P‐doped multimode optical fibers (OF) at different irradiation temperatures. The investigation is based on two complementary experimental techniques: radiation‐induced attenuation (RIA) measurements and electron paramagnetic resonance (EPR). The latter technique allows measuring the P1, P2, metastable‐POHC and stable‐POHC defects. Three OF samples are drawn from the same preform to evaluate the influence of changing their drawing conditions of the OFs on the radiation responses. This first study is performed under X‐rays at room temperature. The results are compared with the ones…
Heavy-ion induced single event effects and latent damages in SiC power MOSFETs
2022
The advantages of silicon carbide (SiC) power MOSFETs make this technology attractive for space, avionics and high-energy accelerator applications. However, the current commercial technologies are still susceptible to Single Event Effects (SEEs) and latent damages induced by the radiation environment. Two types of latent damage were experimentally observed in commercial SiC power MOSFETs exposed to heavy-ions. One is observed at bias voltages just below the degradation onset and it involves the gate oxide. The other damage type is observed at bias voltages below the Single Event Burnout (SEB) limit, and it is attributed to alterations of the SiC crystal-lattice. Focused ion beam (FIB) and s…
Current Transport Mechanism for Heavy-Ion Degraded SiC MOSFETs
2019
IEEE Transactions on Nuclear Science, 66 (7)
First operational experience of HIE-ISOLDE
2016
The High Intensity and Energy ISOLDE project (HIE-ISOLDE)* is a major upgrade of the ISOLDE facility at CERN. The energy range of the post-accelerator will be extended from 2.85 MeV/u to 9.3 MeV/u for beams with A/q = 4.5 (and to 14.3 MeV/u for A/q = 2.5) once all the cryomodules of the superconducting accelerator are in place. The project has been divided into different phases, the first of which (phase 1a) finished in October 2015 after the hardware and beam commissioning were completed**. The physics campaign followed with the delivery of both radioactive and stable beams to two different experimental stations. The characteristics of the beams (energies, intensities, time structure and b…