6533b85ffe1ef96bd12c1b4d
RESEARCH PRODUCT
Current Transport Mechanism for Heavy-Ion Degraded SiC MOSFETs
Yacine KadiThomas ZiemannArto JavanainenRoger StarkCorinna MartinellaRuben Garcia AliaUlrike Grossnersubject
Nuclear and High Energy PhysicsMaterials scienceSiC power MOSFETsheavy ion irradiationComputerApplications_COMPUTERSINOTHERSYSTEMS01 natural scienceselektroniikkakomponentitchemistry.chemical_compoundMOSFETgate leakageGate oxidesilicon carbide0103 physical sciencesMOSFETSilicon carbideIrradiationElectrical and Electronic EngineeringPower MOSFETLeakage (electronics)leakage currentsionit010308 nuclear & particles physicsbusiness.industryionisoiva säteilysingle event effectspilaantuminenNuclear Energy and EngineeringchemistrysäteilyfysiikkaLogic gatelogic gatesradiation effectstransistoritOptoelectronicsbusinessAND gatedescription
IEEE Transactions on Nuclear Science, 66 (7)
year | journal | country | edition | language |
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2019-07-01 |