6533b82afe1ef96bd128b877
RESEARCH PRODUCT
Progress in HAXPES performance combining full-field k-imaging with time-of-flight recording
S. ChernovYu. MatveyevG. SchoenhenseKaterina MedjanikH. J. ElmersChristoph SchlueterAndrei GloskovskiiW. DrubeD. VasilyevS. BabenkovB. Schönhensesubject
time-of-flight microscopeDiffractionNuclear and High Energy PhysicsMaterials scienceMicroscopePhoton550530 Physics02 engineering and technologyKinetic energy01 natural scienceslaw.inventionOpticslaw0103 physical sciencesddc:550HAXPES010306 general physicsInstrumentationMonochromatorRadiationk-spacebusiness.industry021001 nanoscience & nanotechnology530 PhysikResearch PapersBrillouin zoneWavelengthTime of flightBrillouin zone0210 nano-technologybusinessX-ray photoelectron diffractiondescription
Journal of synchrotron radiation 26(6), 1996-2012 (2019). doi:10.1107/S1600577519012773
year | journal | country | edition | language |
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2019-11-01 |