6533b830fe1ef96bd1297c55

RESEARCH PRODUCT

Depth profiles of aggregate centers and nanodefects in LiF crystals irradiated with 34 MeV 84Kr, 56 MeV 40Ar and 12 MeV 12C ions

Maxim V. ZdorovetsAlma DauletbekovaAbdirash AkilbekovM. BaizhumanovR. ZabelsA. VolkovI. ManikaN. KirilkinVladimir A. SkuratovJanis ManiksA. Seitbayev

subject

IONSMaterials sciencePhotoluminescenceF2 AND F3^+ CENTERSDislocationsAGGREGATESFLUORINE COMPOUNDS02 engineering and technologyETCHING7. Clean energy01 natural sciencesFluenceENERGY DISSIPATIONIonIRRADIATION EXPERIMENTSLIF CRYSTALION BOMBARDMENT0103 physical sciencesF2 and F3 + centersMaterials Chemistry:NATURAL SCIENCES:Physics [Research Subject Categories]IrradiationLUMINESCENCE INTENSITYPhotoluminescenceLITHIUM COMPOUNDS010302 applied physicsLiF crystalsNANOHARDNESSDISLOCATIONS (CRYSTALS)Surfaces and InterfacesGeneral ChemistryNanoindentation021001 nanoscience & nanotechnologyCondensed Matter PhysicsIsotropic etchingSurfaces Coatings and FilmsLASER SCANNING CONFOCAL MICROSCOPYNANOINDENTATION TECHNIQUESIon irradiationCOLOR CENTERSHardeningELECTRONIC ENERGY LOSSAtomic physicsDislocationLUMINESCENCE SIGNALS0210 nano-technologyLuminescenceDamage depth profiles

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I. Manika, J. Maniks and R. Zabels acknowledge the national project IMIS2. A. Dauletbekova, A. Akilbekov, M. Zdorovets and A. Seitbayev acknowledge the GF AP05134257of Ministry of Education and Science the Republic of Kazakhstan.

10.1016/j.surfcoat.2018.03.096https://dspace.lu.lv/dspace/handle/7/52548