Search results for "Engineering sciences"

showing 10 items of 2347 documents

Discrete wavelet transform implementation in Fourier domain for multidimensional signal

2002

Wavelet transforms are often calculated by using the Mallat algorithm. In this algorithm, a signal is decomposed by a cascade of filtering and downsampling operations. Computing time can be important but the filtering operations can be speeded up by using fast Fourier transform (FFT)-based convolutions. Since it is necessary to work in the Fourier domain when large filters are used, we present some results of Fourier-based optimization of the sampling operations. Acceleration can be obtained by expressing the samplings in the Fourier domain. The general equations of the down- and upsampling of digital multidimensional signals are given. It is shown that for special cases such as the separab…

Non-uniform discrete Fourier transformDiscrete-time Fourier transformMathematical analysisPrime-factor FFT algorithm020206 networking & telecommunications02 engineering and technologyAtomic and Molecular Physics and OpticsFractional Fourier transformDiscrete Fourier transformComputer Science ApplicationsMultidimensional signal processingDiscrete Fourier series0202 electrical engineering electronic engineering information engineering020201 artificial intelligence & image processingElectrical and Electronic EngineeringHarmonic wavelet transformAlgorithm[SPI.SIGNAL]Engineering Sciences [physics]/Signal and Image processingComputingMilieux_MISCELLANEOUSMathematics
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Artificial driving cycles for the evaluation of energetic needs of electric vehicles

2012

International audience; This article presents a novel method to simulate artificial driving cycles that have the same significant characteristics as measured driving cycles. The driving cycles are based on only two different easily accessible parameters namely mean velocity and mean positive acceleration as well as their standard variations. Those parameters allow to adapt the driving cycles to different cycle types (urban, extra urban, highway), length and duration. Other than know drive cycle simulators, the approach is based on normal distribution of velocities and accelerations, thus needing to analyze only few cycles for the initialization.

Normal distributionEngineeringAcceleration[SPI]Engineering Sciences [physics]business.industryInitializationDuration (project management)PropulsionbusinessSimulationAutomotive engineeringDriving cycle
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Normalization of T2W-MRI Prostate Images using Rician a priori

2016

International audience; Prostate cancer is reported to be the second most frequently diagnosed cancer of men in the world. In practise, diagnosis can be affected by multiple factors which reduces the chance to detect the potential lesions. In the last decades, new imaging techniques mainly based on MRI are developed in conjunction with Computer-Aided Diagnosis (CAD) systems to help radiologists for such diagnosis. CAD systems are usually designed as a sequential process consisting of four stages: pre-processing, segmentation, registration and classification. As a pre-processing, image normalization is a critical and important step of the chain in order to design a robust classifier and over…

Normalization (statistics)Computer scienceNormalization (image processing)T2W-MRI02 engineering and technology[ SPI.SIGNAL ] Engineering Sciences [physics]/Signal and Image processing030218 nuclear medicine & medical imaging03 medical and health sciencesProstate cancer0302 clinical medicineProstateRician fading0202 electrical engineering electronic engineering information engineeringmedicineComputer visionSegmentation[SPI.SIGNAL] Engineering Sciences [physics]/Signal and Image processingpre-processingProstate cancermedicine.diagnostic_testbusiness.industryCancerMagnetic resonance imagingImage segmentationmedicine.diseasemedicine.anatomical_structurenormalizationComputer-aided diagnosisA priori and a posteriori020201 artificial intelligence & image processingcomputer-aided diagnosisArtificial intelligencebusiness[SPI.SIGNAL]Engineering Sciences [physics]/Signal and Image processing
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Optimal control design of preparation pulses for contrast optimization in MRI

2017

Abstract This work investigates the use of MRI radio-frequency (RF) pulses designed within the framework of optimal control theory for image contrast optimization. The magnetization evolution is modeled with Bloch equations, which defines a dynamic system that can be controlled via the application of the Pontryagin Maximum Principle (PMP). This framework allows the computation of optimal RF pulses that bring the magnetization to a given state to obtain the desired contrast after acquisition. Creating contrast through the optimal manipulation of Bloch equations is a new way of handling contrast in MRI, which can explore the theoretical limits of the system. Simulation experiments carried out…

Nuclear and High Energy PhysicsComputer science[SDV.IB.IMA]Life Sciences [q-bio]/Bioengineering/ImagingComputationRF pulsesBiophysics010402 general chemistry01 natural sciencesBiochemistry030218 nuclear medicine & medical imaging03 medical and health sciencesMagnetizationMice0302 clinical medicineOpticsRobustness (computer science)Image Interpretation Computer-AssistedImage Processing Computer-AssistedAnimalsComputer SimulationGray MatterMuscle Skeletal[ SDV.IB.IMA ] Life Sciences [q-bio]/Bioengineering/Imagingbusiness.industryPhantoms ImagingContrast (statistics)BrainReproducibility of ResultsContrastCondensed Matter PhysicsOptimal controlImage EnhancementBloch equationsMagnetic Resonance ImagingWhite Matter0104 chemical sciencesWeightingRatsOptimal control[SPI.ELEC]Engineering Sciences [physics]/ElectromagnetismOptimal control designBloch equations[ SPI.ELEC ] Engineering Sciences [physics]/ElectromagnetismFemalebusinessAlgorithmAlgorithms
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Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory

2018

International audience; This paper identifies the failure modes of a commercial 130-nm ferroelectric random access memory. The devices were irradiated with heavy-ion and pulsed focused X-ray beams. Various failure modes are observed, which generate characteristic error patterns, affecting isolated bits, words, groups of pages, and sometimes entire regions of the memory array. The underlying mechanisms are discussed.

Nuclear and High Energy PhysicsComputer sciencekäyttömuistit02 engineering and technologysingle-event effect01 natural sciencesMemory arrayElectronic mailX-ray0103 physical sciencesElectronic engineering[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsElectrical and Electronic Engineeringstatic testComputingMilieux_MISCELLANEOUSdynamic testEvent (probability theory)Random access memoryta114ta213010308 nuclear & particles physicsbusiness.industrySEFImuistit (tietotekniikka)021001 nanoscience & nanotechnologyFerroelectricityheavy ionsingle-event upsetNon-volatile memoryFRAMsäteilyfysiikkaNuclear Energy and EngineeringSingle event upsetPhotonics0210 nano-technologybusinessIEEE Transactions on Nuclear Science
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Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

2015

International audience; Various failure scenarios may occur during irradiation testing of SRAMs, which may generate different characteristic Multiple Cell Upset (MCU) error patterns. This work proposes a method based on spatial and temporal criteria to identify them.

Nuclear and High Energy PhysicsEngineeringcomputer.software_genreUpsetCross section (physics)Static testingCluster of bit flipsStatic random-access memoryElectrical and Electronic Engineeringradiation testingstatic testCluster analysisdynamic test[PHYS]Physics [physics]single event upset (SEU)ta213ta114Cross sectionbusiness.industrySEFImultiple cell upset (MCU)SRAM[SPI.TRON]Engineering Sciences [physics]/ElectronicsRAMRadiation testingMicrocontrollerMCUNuclear Energy and EngineeringSEU clusterData miningbusinesscomputerDynamic testing
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Optical frequency domain reflectometer distributed sensing using microstructured pure silica optical fibers under radiations

2016

International audience; We investigated the capability of micro-structured optical fibers to develop multi-functional, remotely-controlled, Optical Frequency Domain Reflectometry (OFDR) distributed fiber based sensors to monitor temperature in nuclear power plants or high energy physics facilities. As pure-silica-core fibers are amongst the most radiation resistant waveguides, we characterized the response of two fibers with the same microstructure, one possessing a core elaborated with F300 Heraeus rod representing the state-of-the art for such fiber technology and one innovative sample based on pure sol-gel silica. Our measurements reveal that the Xray radiations do not affect the capaci…

Nuclear and High Energy PhysicsMaterials scienceOptical fiberOptical time-domain reflectometerRayleigh scattering01 natural scienceslaw.invention010309 opticsOpticsZero-dispersion wavelengthlaw0103 physical sciencesRayleighElectrical and Electronic EngineeringNuclear and High Energy Physic[PHYS]Physics [physics]RadiationOptical fiber sensor010308 nuclear & particles physicsbusiness.industryOptical fiber sensorsOptique / photoniqueMicrostructured optical fiberDistributed acoustic sensingradiationNuclear Energy and EngineeringFiber optic sensor[SPI.OPTI]Engineering Sciences [physics]/Optics / PhotonicOptoelectronicsbusinessHard-clad silica optical fiberPhotonic-crystal fiber
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Radiation Characterization of Optical Frequency Domain Reflectometry Fiber-Based Distributed Sensors

2016

International audience; We studied the responses of fiber-basedtemperature and strain sensors related to Optical FrequencyDomain Reflectometry (OFDR) and exposed to high γ-ray dosesup to 10 MGy. Three different commercial fiber classes areused to investigate the evolution of OFDR parameters withdose, thermal treatment and fiber core/cladding composition.We find that the fiber coating is affected by both thermal andradiation treatments and this modification results in anevolution of the internal stress distribution inside the fiber that influences its temperature and strain Rayleigh coefficients. These two environmental parameters introduce a relative error up to 5% on temperature and strain…

Nuclear and High Energy PhysicsMaterials scienceRadiation effects02 engineering and technologyThermal treatmentRadiation01 natural sciencesTemperature measurementsymbols.namesake020210 optoelectronics & photonics0103 physical sciencesThermal0202 electrical engineering electronic engineering information engineeringElectroniqueRayleigh scatteringElectrical and Electronic EngineeringReflectometryNuclear and High Energy PhysicTemperature measurement010308 nuclear & particles physicsbusiness.industryOptical fiber sensorsCladding (fiber optics)[SPI.TRON]Engineering Sciences [physics]/ElectronicsNuclear Energy and EngineeringFiber optic sensorsymbolsOptoelectronicsStrain measurementbusiness
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Impact of Electrical Stress and Neutron Irradiation on Reliability of Silicon Carbide Power MOSFET

2020

International audience; The combined effects of electrical stress and neutron irradiation of the last generation of commercial discrete silicon carbide power MOSFETs are studied. The single-event burnout (SEB) sensitivity during neutron irradiation is analyzed for unstressed and electrically stressed devices. For surviving devices, a comprehensive study of the breakdown voltage degradation is performed by coupling the electrical stress and irradiation effects. In addition, mutual influences between electrical stress and radiative constraints are investigated through TCAD modeling.

Nuclear and High Energy PhysicsMaterials scienceRadiation effectsSilicon carbide[PHYS.NEXP]Physics [physics]/Nuclear Experiment [nucl-ex]Stress01 natural sciencesNeutron effectsSilicon carbide (SiC)Stress (mechanics)Semiconductor device modelschemistry.chemical_compoundMOSFETReliability (semiconductor)0103 physical sciencesMOSFETSilicon carbideBreakdown voltageSemiconductor device breakdownSilicon compoundsSingle Event BurnoutNeutronIrradiationElectrical and Electronic EngineeringPower MOSFETPower MOSFETComputingMilieux_MISCELLANEOUSElectric breakdownNeutrons[PHYS]Physics [physics]010308 nuclear & particles physicsbusiness.industryLogic gatesWide band gap semiconductorsSemiconductor device reliability[SPI.TRON]Engineering Sciences [physics]/ElectronicsNuclear Energy and Engineeringchemistry13. Climate actionSingle-event burnout (SEB)Atmospheric neutronsOptoelectronicsbusinessTechnology CAD (electronics)
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Heavy-Ion-Induced Degradation in SiC Schottky Diodes : Incident Angle and Energy Deposition Dependence

2017

International audience; Heavy-ion-induced degradation in the reverse leakage current of SiC Schottky power diodes exhibits a strong dependence on the ion angle of incidence. This effect is studied experimentally for several different bias voltages applied during heavy-ion exposure. In addition, TCAD simulations are used to give insight on the physical mechanisms involved.

Nuclear and High Energy PhysicsMaterials scienceSchottky barrierschottky diodesmodelling (creation related to information)01 natural sciencesElectronic mailIonpower semiconductor devicesReverse leakage currentchemistry.chemical_compoundsilicon carbide0103 physical sciencesSilicon carbideElectrical and Electronic Engineering[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsDiode010302 applied physicsta114010308 nuclear & particles physicsbusiness.industrydiodesSchottky diodesiliconmodelingradiationNuclear Energy and EngineeringchemistryionsOptoelectronicsbusinession radiation effectsVoltageIEEE Transactions on Nuclear Science
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