Search results for "Flicker"

showing 10 items of 51 documents

A Method for Accurate Measurements of Optimum Noise Parameters of Microwave Transistors

1985

A method for measuring losses of the tuner network used as noise source admittance transformer in transistor noise parameter test-set is presented. Since the method is based on noise figure measurements, tuner losses can be determined on-line while performing measurements for determining transistor noise parameters. As experimental verifications the optimum noise parameters of a GaAs FET in the 4 - 12 GHz frequency range, measured through a computer-assisted measuring system, are reported.

Noise temperatureEngineeringNoise measurementNoise-figure meterbusiness.industryAcousticsY-factorTunerCondensed Matter::Mesoscopic Systems and Quantum Hall EffectNoise figureNoise generatorHardware_INTEGRATEDCIRCUITSElectronic engineeringFlicker noisebusiness15th European Microwave Conference, 1985
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Influence Of The Model Parameters On The Noise Performance Of Double-polysilicon BJTs For Microwave LNA's

1997

In the recent post we have measured the noise and the scattering parameters of several series of double polysilicon BJT's over the 2-6 GHz frequency range at different collector current values, according to their emitter finger number. From the experimental data, a noisy circuit model has been extracted based on a T-equivalent network. By means of the correlation matrix techniques, novel analytical expressions of the noise parameters have been derived. As a second step, a sensitivity analysis has been performed for evaluating the influence of each model element on the noise performance. The results show how to improve the characteristics of such devices for a better performance when employe…

Noise temperatureEngineeringNoise measurementbusiness.industryDouble polysilicon bipolar junction transistors Low noise amplifiers (LNA) noise modelsY-factorLow noise amplifiers (LNA)Noise figureNoise (electronics)noise modelsDouble polysilicon bipolar junction transistorsNoise generatorPhase noiseElectronic engineeringFlicker noisebusiness27th European Microwave Conference and Exhibition
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Comparison between two measuring methods for complete characterization of low-noise HEMTs at microwaves

1996

The good performances of a set-up for the complete characterization of HEMTs up to 40 Ghz in terms of noise and scattering parameters through noise figure measurements only are shown by many experimental results. Because of some inconveniences in practice the use of the method is suggested for research laboratories only. For industrial applications an alternative symplified method is proposed whose performances are shown to be in surprising agreement with the ones of the standard method.

Noise temperatureEngineeringNoiseNoise-figure meterNoise generatorNoise measurementbusiness.industryElectronic engineeringY-factorFlicker noiseNoise figurebusiness26th European Microwave Conference, 1996
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ACCURATE MEASUREMENTS OF OPTIMUM NOISE PARAMETERS OF MICROWAVE TRANSISTORS

1986

A method for measuring losses of the tuner network used as noise source admittance transformer in transistor noise parameter test-set is presented. Since the method is based on noise figure measurements, tuner losses can be determined on-line while performing measurements for determining transistor noise parameters. As experimental verifications the optimum noise parameters of a GaAs FET in the 4 - 12 GHz frequency range, measured through a computer-assisted measuring system, are reported.

Noise temperatureEngineeringNoise-figure meterbusiness.industryAcousticsY-factorCondensed Matter::Mesoscopic Systems and Quantum Hall EffectNoise figureLow-noise amplifierNoise generatorHardware_INTEGRATEDCIRCUITSElectronic engineeringEffective input noise temperatureFlicker noisebusiness
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Noise parameters of HEMTs: analysis of their properties from a circuit model approach

1996

Noise parameters of high electron mobility transistors (HEMT) at microwave frequencies are a subject of active research since the knowledge of their performance is of key importance for the use of these devices for designing low‐noise amplifiers. Employs a simple noise model to derive the analytical expressions for the device noise parameters F0, Γ0 and N in terms of the electrical elements associated with the basic equivalent circuit of an HEMT. Analyses such expressions to establish some fundamental relationships, as well as the expected noise performance of the device when the parasitic elements representing package effects are included.

Noise temperatureEngineeringbusiness.industryApplied MathematicsElectrical engineeringShot noiseY-factorComputer Science ApplicationsNoiseComputational Theory and MathematicsNoise generatorElectronic engineeringEquivalent circuitEffective input noise temperatureFlicker noiseElectrical and Electronic EngineeringbusinessElectricity; Mathematics; Models; Noise; TheoryCOMPEL - The international journal for computation and mathematics in electrical and electronic engineering
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Influence of the temperature on the equivalent noise resistance of HEMTs at microwave frequencies

1998

Abstract This paper is focused on the performance of the noise resistance Rn of HEMTs at microwave frequencies as a function of temperature. A sensitivity analysis has been performed on several noisy circuit models of low-noise devices that we had previously characterized in terms of scattering and noise parameters. Such a study has been aimed at pointing out the role played by either the electrical elements and the noise temperatures of the resistors of the equivalent circuit on the typically observed U-shaped behavior of Rn.

Noise temperatureMaterials scienceAcousticsGeneral EngineeringY-factorNoise figurelaw.inventionNoise generatorlawElectronic engineeringEquivalent circuitFlicker noiseResistorNoise (radio)
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Complete characterization of low-noise devices at microwave frequencies: two alternative procedures for HEMTs

1995

Noise temperatureMaterials scienceNoise generatorNoise measurementNoise spectral densityElectronic engineeringFlicker noiseY-factorNoise figureNoise (radio)46th ARFTG Conference Digest
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Signal to Noise Ratio of Silicon Photomultipliers measured in the Continuous Wave Regime

2014

We performed a Signal to Noise Ratio characterization, in the continuous wave regime, at different bias voltages, frequencies and temperatures, on a novel class of silicon photomultipliers fabricated in planar technology on silicon p-type substrate. Signal to Noise Ratio has been measured as the ratio of the photogenerated current, filtered and averaged by a lock-in amplifier, and the Root Mean Square deviation of the overall current flowing to the device. The measured noise takes into account the shot noise, resulting from the photocurrent and the dark current. We have also performed a comparison between our SiPMs and a photomultiplier tube in terms of Signal to Noise Ratio, as a function …

Noise temperatureMaterials sciencePhysics::Instrumentation and Detectorsbusiness.industryphotomultipliers sipm snr detector siliconNoise spectral densityElectrical engineeringShot noiseSettore ING-INF/02 - Campi ElettromagneticiNoise figureNoise (electronics)Settore ING-INF/01 - ElettronicaSignal-to-noise ratioOpticsNoise generatorFlicker noisebusiness
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Neuropharmacology of vision in goldfish: A review

2009

AbstractThe goldfish is one of the few animals exceptionally well analyzed in behavioral experiments and also in electrophysiological and neuroanatomical investigations of the retina. To get insight into the functional organization of the retina we studied color vision, motion detection and temporal resolution before and after intra-ocular injection of neuropharmaca with known effects on retinal neurons. Bicuculline, strychnine, curare, atropine, and dopamine D1- and D2-receptor antagonists were used. The results reviewed here indicate separate and parallel processing of L-cone contribution to different visual functions, and the influence of several neurotransmitters (dopamine, acetylcholin…

Parallel processing (psychology)genetic structuresColor visionDopamineMotion PerceptionGlycineColorRetinachemistry.chemical_compoundMotionGABADopamineGoldfishmedicineElectroretinographyParallel processingAnimalsNeurotransmitterNeuropharmacologyVision Oculargamma-Aminobutyric AcidRetinaNeurotransmitter AgentsColor VisionDose-Response Relationship DrugFlickerStrychnineBicucullineSensory Systemseye diseasesAcetylcholineOphthalmologymedicine.anatomical_structurechemistryTime Perceptionsense organsPsychologyNeurosciencemedicine.drugVision Research
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Noise features in InP crystals operating under static, periodic or fluctuating electric fields

2014

The results of a study concerning the intrinsic noise in low-doped n-type InP crystals operating under static, periodic or fluctuating electric fields are shown. To simulate the dynamics of electrons in the bulk, we employ a Monte Carlo approach, by taking into account the main details of band structure, scattering processes, as well as heating effects. The noise features are investigated by computing the velocity fluctuations correlation function, its spectral density and the total noise power, for different values of amplitude and frequency of the driving field. We show how the noise spectra are affected by the electric field frequency and compare their peculiarities with those exhibited …

PhysicsCondensed matter physicshot-carrier noiseAcousticsElectric fieldInPShot noiseFlicker noisecorrelated noise source.Monte Carlo simulationSettore FIS/03 - Fisica Della MateriaSettore FIS/07 - Fisica Applicata(Beni Culturali Ambientali Biol.e Medicin)Noise (radio)2014 International Workshop on Computational Electronics (IWCE)
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