Search results for "Gate"

showing 10 items of 1811 documents

Impact of Electrical Stress and Neutron Irradiation on Reliability of Silicon Carbide Power MOSFET

2020

International audience; The combined effects of electrical stress and neutron irradiation of the last generation of commercial discrete silicon carbide power MOSFETs are studied. The single-event burnout (SEB) sensitivity during neutron irradiation is analyzed for unstressed and electrically stressed devices. For surviving devices, a comprehensive study of the breakdown voltage degradation is performed by coupling the electrical stress and irradiation effects. In addition, mutual influences between electrical stress and radiative constraints are investigated through TCAD modeling.

Nuclear and High Energy PhysicsMaterials scienceRadiation effectsSilicon carbide[PHYS.NEXP]Physics [physics]/Nuclear Experiment [nucl-ex]Stress01 natural sciencesNeutron effectsSilicon carbide (SiC)Stress (mechanics)Semiconductor device modelschemistry.chemical_compoundMOSFETReliability (semiconductor)0103 physical sciencesMOSFETSilicon carbideBreakdown voltageSemiconductor device breakdownSilicon compoundsSingle Event BurnoutNeutronIrradiationElectrical and Electronic EngineeringPower MOSFETPower MOSFETComputingMilieux_MISCELLANEOUSElectric breakdownNeutrons[PHYS]Physics [physics]010308 nuclear & particles physicsbusiness.industryLogic gatesWide band gap semiconductorsSemiconductor device reliability[SPI.TRON]Engineering Sciences [physics]/ElectronicsNuclear Energy and Engineeringchemistry13. Climate actionSingle-event burnout (SEB)Atmospheric neutronsOptoelectronicsbusinessTechnology CAD (electronics)
researchProduct

Current Transport Mechanism for Heavy-Ion Degraded SiC MOSFETs

2019

IEEE Transactions on Nuclear Science, 66 (7)

Nuclear and High Energy PhysicsMaterials scienceSiC power MOSFETsheavy ion irradiationComputerApplications_COMPUTERSINOTHERSYSTEMS01 natural scienceselektroniikkakomponentitchemistry.chemical_compoundMOSFETgate leakageGate oxidesilicon carbide0103 physical sciencesMOSFETSilicon carbideIrradiationElectrical and Electronic EngineeringPower MOSFETLeakage (electronics)leakage currentsionit010308 nuclear & particles physicsbusiness.industryionisoiva säteilysingle event effectspilaantuminenNuclear Energy and EngineeringchemistrysäteilyfysiikkaLogic gatelogic gatesradiation effectstransistoritOptoelectronicsbusinessAND gate
researchProduct

Impact of Terrestrial Neutrons on the Reliability of SiC VD-MOSFET Technologies

2021

Accelerated terrestrial neutron irradiations were performed on different commercial SiC power MOSFETs with planar, trench and double-trench architectures. The results were used to calculate the failure cross-sections and the failure in time (FIT) rates at sea level. Enhanced gate and drain leakage were observed in some devices which did not exhibit a destructive failure during the exposure. In particular, a different mechanism was observed for planar and trench gate MOSFETs, the first showing a partial gate rupture with a leakage path mostly between drain and gate, similar to what was previously observed with heavy-ions, while the second exhibiting a complete gate rupture. The observed fail…

Nuclear and High Energy PhysicsMaterials sciencepower MOSFETs01 natural sciences7. Clean energyelektroniikkakomponentitStress (mechanics)chemistry.chemical_compoundReliability (semiconductor)silicon carbidepuolijohteet0103 physical sciencesMOSFETSilicon carbideElectrical and Electronic EngineeringPower MOSFETSilicon Carbide; Power MOSFETs; neutrons; Single Event Effects; Single Event Burnout; gate damagesingle event burnoutLeakage (electronics)010308 nuclear & particles physicsbusiness.industrygate damageneutronsneutronitsingle event effectssäteilyfysiikkaNuclear Energy and EngineeringchemistryLogic gateTrenchtransistoritOptoelectronicsOtherbusinessIEEE Transactions on Nuclear Science
researchProduct

The Mu3e Data Acquisition

2020

The Mu3e experiment aims to find or exclude the lepton flavour violating decay $\mu^+\to e^+e^-e^+$ with a sensitivity of one in 10$^{16}$ muon decays. The first phase of the experiment is currently under construction at the Paul Scherrer Institute (PSI, Switzerland), where beams with up to 10$^8$ muons per second are available. The detector will consist of an ultra-thin pixel tracker made from High-Voltage Monolithic Active Pixel Sensors (HV-MAPS), complemented by scintillating tiles and fibres for precise timing measurements. The experiment produces about 100 Gbit/s of zero-suppressed data which are transported to a filter farm using a network of FPGAs and fast optical links. On the filte…

Nuclear and High Energy PhysicsParticle physicsPhysics - Instrumentation and DetectorsMesonPhysics::Instrumentation and Detectorsdata acquisitionfibre: opticalFOS: Physical scienceshigh energy physics instrumentationprinted circuits7. Clean energycomputer: networkOptical fiber communicationData acquisitionsemiconductor detector: pixelOptical switchesmultiprocessor: graphicshardwareSensitivity (control systems)muon+: decay[PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det]Electrical and Electronic EngineeringGeneralLiterature_REFERENCE(e.g.dictionariesencyclopediasglossaries)scintillation counterFPGAClocksPhysicsData acquisition (DAQ)MuonPixelMesonsDetectorlepton: flavor: violationField programmable gate arraysDetectorsInstrumentation and Detectors (physics.ins-det)sensitivityNuclear Energy and EngineeringFilter (video)field programmable gate arrays (FPGAs)Data acquisition (DAQ); field programmable gate arrays (FPGAs); high energy physics instrumentation; printed circuitselectronics: readoutHigh Energy Physics::ExperimentLeptonelectronics: design
researchProduct

Statistical Analysis of Heavy-Ion Induced Gate Rupture in Power MOSFETs—Methodology for Radiation Hardness Assurance

2012

A methodology for power MOSFET radiation hardness assurance is proposed. It is based on the statistical analysis of destructive events, such as gate oxide rupture. Examples of failure rate calculations are performed.

Nuclear and High Energy PhysicsSpace technologyMaterials scienceta114Dielectric strengthbusiness.industryElectrical engineeringFailure rateHardware_PERFORMANCEANDRELIABILITYlaw.inventionCapacitorNuclear Energy and EngineeringlawGate oxideMOSFETHardware_INTEGRATEDCIRCUITSOptoelectronicsElectrical and Electronic EngineeringPower MOSFETbusinessRadiation hardeningHardware_LOGICDESIGNIEEE Transactions on Nuclear Science
researchProduct

Effect of 20 MeV Electron Radiation on Long Term Reliability of SiC Power MOSFETs

2023

The effect of 20 MeV electron radiation on the lifetime of the silicon carbide power MOSFETs was investigated. Accelerated constant voltage stress (CVS) was applied on the pristine and irradiated devices and time-to-breakdown ( T BD ) and charge-to-breakdown ( Q BD ) of gate oxide were extracted and compared. The effect of electron radiation on the device lifetime reduction can be observed at lower stress gate-to-source voltage ( V GS ) levels. The models of T BD and Q BD dependence on the initial gate current ( I G0 ) are proposed which can be used to describe the device breakdown behaviour. peerReviewed

Nuclear and High Energy Physicsionisoiva säteilyelektronitelektroniikkakomponentitstressMOSFETNuclear Energy and Engineeringelectric breakdownsäteilyfysiikkasilicon carbidelogic gatesradiation effectstransistoritElectrical and Electronic Engineeringdegradation
researchProduct

First observation and branching fraction and decay parameter measurements of the weak radiative decay Xi0 -> Lambda e+ e-

2007

The weak radiative decay Xi0 --> Lambda e+e- has been detected for the first time. We find 412 candidates in the signal region, with an estimated background of 15 +/- 5 events. We determine the branching fraction B(Xi0 --> Lambda e+e-) = [7.6 +/- 0.4(stat) +/- 0.4(syst) +/- 0.2(norm)] x 10^{-6}, consistent with an internal bremsstrahlung process, and the decay asymmetry parameter alpha_{XiLambdaee} = -0.8 +/- 0.2, consistent with that of Xi0 --> Lambda gamma. The charge conjugate reaction Xi0_bar --> Lambda_bar e+e- has also been observed.

Nuclear and High Energy Physicsmedia_common.quotation_subjectSignal regionRadiative decayXi0 hyperonAstrophysics::Cosmology and Extragalactic Astrophysics01 natural sciencesAsymmetryiperoniacceleratori di particelleNOHigh Energy Physics - Experimentmesoni K0103 physical sciences010306 general physicsXi0 hyperon; radiative decayparticelle elementarimedia_commonPhysicsdecadimenti010308 nuclear & particles physicsBranching fractionradiative decayHigh Energy Physics::PhenomenologyBremsstrahlungmesoni K; iperoni; decadimenti; particelle elementari; acceleratori di particelleHigh Energy Physics::ExperimentAtomic physicsParticle Physics - ExperimentConjugate
researchProduct

Proton irradiation-induced reliability degradation of SiC power MOSFET

2023

The effect of 53 MeV proton irradiation on the reliability of silicon carbide power MOSFETs was investigated. Post-irradiation gate voltage stress was applied and early failures in time-dependent dielectric breakdown (TDDB) test were observed for irradiated devices. The applied drain voltage during irradiation affects the degradation probability observed by TDDB tests. Proton-induced single event burnouts (SEB) were observed for devices which were biased close to their maximum rated voltage. The secondary particle production as a result of primary proton interaction with the device material was simulated with the Geant4-based toolkit. peerReviewed

Nuclear and High Energy Physicsprotonitreliabilityprotonsionisoiva säteilyelektroniikkakomponentitstressNuclear Energy and Engineeringsäteilyfysiikkasilicon carbidelogic gatesradiation effectstransistoritElectrical and Electronic Engineering
researchProduct

Probing the gateway to superheavy nuclei in cranked relativistic Hartree-Bogoliubov theory

2003

The cranked relativistic Hartree+Bogoliubov theory has been applied for a systematic study of the nuclei around 254No, the heaviest nuclei for which detailed spectroscopic data are available. The deformation, rotational response, pairing correlations, quasi-particle and other properties of these nuclei have been studied with different relativistic mean field (RMF) parametrizations. For the first time, the quasi-particle spectra of odd deformed nuclei have been calculated in a fully self-consistent way within the framework of the RMF theory. The energies of the spherical subshells, from which active deformed states of these nuclei emerge, are described with an accuracy better than 0.5 MeV fo…

Nuclear physicsPhysicsNuclear Theory (nucl-th)Mean field theoryNuclear TheoryPairingNuclear TheoryFOS: Physical sciencesGateway (computer program)HartreeDeformation (meteorology)Nuclear ExperimentSpectral line
researchProduct

A general overview of the organocatalytic intramolecular aza-Michael reaction

2014

The organocatalytic intramolecular aza-Michael reaction gives access to enantiomerically enriched nitrogen-containing heterocycles in a very simple manner. Enals, enones, conjugated esters and nitro olefins have been employed as Michael acceptors, while moderate nitrogen nucleophiles such as sulphonamides, carbamates and amides have been shown to be appropriate Michael donors in this type of reaction. Additionally, the process has been performed under both covalent and non-covalent catalysis, with diaryl prolinols, imidazolidinones, thioureas and chiral binol phosphoric acids being the most frequently used catalysts. The level of efficiency reached with this protocol is demonstrated by the …

NucleophileCovalent bondChemistryIntramolecular forceMichael reactionNitroOrganic chemistryTotal synthesisGeneral ChemistryConjugated systemCatalysisChem. Soc. Rev.
researchProduct