Search results for "Wafer"
showing 10 items of 73 documents
Particle Detectors made of High Resistivity Czochralski Grown Silicon
2004
We describe the fabrication process of fullsize silicon microstrip detectors processed on silicon wafers grown by magnetic Czochralski method. Defect analysis by DLTS spectroscopy as well as minority carrier lifetime measurements by µPCD method are presented. The electrical and detection properties of the Czochralski silicon detectors are comparable to those of leading commercial detector manufacturers. The radiation hardness of the Czochralski silicon detectors was proved to be superior to the devices made of traditional Float Zone silicon material.
Planar Array Technology for the Fabrication of Germanium X-Ray Microcalorimeters
2008
Several technologies are presently competing for measuring the temperature increase in cryogenic micro-calorimeters used as high resolution energy-dispersive X-ray detectors. Doped germanium, whose resistivity depends on temperature, is a promising material for this purpose, because of its comparatively low specific heat and the possibility of making wafers with high doping uniformity by neutron transmutation. Presently, Ge-based microcalorimeters are still micro-machined and manually assembled. Here we present a planar approach to the fabrication of 2-D arrays of microcalorimeters and show the preliminary technological results.
Crystallization of silica opals onto patterned silicon wafer
2006
We report on fabrication of high quality opaline photonic crystals from large silica spheres, self-assembled in hydrophilic trenches of silicon wafers by using a drawing apparatus with a combination of stirring. The achievements here reported comprise a spatial selectivity of opal crystallization without special treatment of the wafer surface, a filling of the trenches up to the top, leading to a spatially uniform film thickness, particularly an absence of cracks within the size of the trenches, and finally a good three-dimensional order of the opal lattice even in trenches with a complex confined geometry, verified using optical measurements. The opal lattice was found to match the pattern…
Flexible MgO-Based Magnetic Tunnel Junctions on Silicon Substrate
2018
Flexible electronic devices are emerging in many areas, providing novel features and creating new applications [1]. Due to their ubiquitous utilization, flexible magnetic sensors [2] play a critical part in this development. In particular, magnetic tunnel junctions (MTJs) are of great interest, because of advantages like low power consumption or high sensitivity. We report the development of flexible MTJs on a silicon substrate fabricated by a low-cost batch process [3]. Thereby, conventionally fabricated MTJ devices are transformed into flexible ones by thinning down the silicon wafer from 500 μm to 5 μm. This process leads to thin, bendable silicon devices, while maintaining their origina…
Planar Technology for NDT-Ge X-Ray Microcalorimeters: Absorber Fabrication
2009
We have investigated the electroplating process to deposit thick uniform films of tin on a Ge wafer coated with Spin‐On Glass, in order to fabricate the absorbers for Ge microcalorimeter arrays. Here we discuss some technological details and propose two alternative metal bilayer to be used as seed for the electroplating.
Z+/Z− lithium niobate optical waveguide sensitivity related to pyroelectric effect
2020
Lithium niobate crystal is widely used for the design and fabrication of integrated electro-optic modulators. As a ferroelectric material, one sees its spontaneous polarization change with temperature variations. This phenomenon, known as the pyroelectric effect, induces strong waveguide transmission variations for waveguides realized on Z -cut wafers. Waveguides made by titanium in-diffusion either on the Z + or Z − side of the crystal show a significant difference in temperature behavior. Experimental data, enlightened by numerical simulations, help to show why Z − waveguides are more immune to temperature changes than Z + ones.
The Joining of LiNbO3, Quartz, TlBr-TlI and Other Optical Materials by the Use of Thin Metal Films as Bonding Agents
2000
A method of joining ferroelectric, optical and other non-metallic materials, such as lithium niobate, quartz, TlBr-TlI, glass, etc., at room temperature under a pressure of 0.1÷0.5 MPa is described. The surfaces to be joined are prepared to optical flatness, and indium or lead coatings as bonding agents are used. To obtain clean surfaces, procedures of the coating deposition and sample joining are performed in situ in a vacuum of l0-4 Pa. The strength of the obtained joints is about 20MPa for indium coatings and about 30MPa for lead coatings. It is supposed that attractive surface forces play a decisive role in the contact formation and bonding of the wafers. The method has been applied for…
Polarized neutron reflectivity from monolayers of self-assembled magnetic nanoparticles
2015
We prepared monolayers of iron oxide nanoparticles via self-assembly on a bare silicon wafer and on a vanadium film sputter deposited onto a plane sapphire substrate. The magnetic configuration of nanoparticles in such a dense assembly was investigated by polarized neutron reflectivity. A theoretical model fit shows that the magnetic moments of nanoparticles form quasi domain-like configurations at remanence. This is attributed to the dipolar coupling amongst the nanoparticles.
Real-time measurements of sliding friction and elastic properties of ZnO nanowires inside a scanning electron microscope
2011
Abstract A real-time nanomanipulation technique inside a scanning electron microscope (SEM) has been used to investigate the elastic and frictional (tribological) properties of zinc oxide nanowires (NWs). A NW was translated over a surface of an oxidised silicon wafer using a nanomanipulator with a glued atomic-force microscopic tip. The shape of the NW elastically deformed during the translation was used to determine the distributed kinetic friction force. The same NW was then positioned half-suspended on edges of trenches cut by a focused ion beam through a silicon wafer. In order to measure Young’s modulus, the NW was bent by pushing it at the free end with the tip, and the interaction f…
Synthesis and characterization of ZnO/ZnS/MoS2 core-shell nanowires
2017
The present research was supported by the Latvian National Research Program IMIS2 . Authors are grateful for Dr. Robert Kalendarev and Martins Zubkins for assistance in magnetron sputtering, Dr. Krisjanis Smits for TEM measurements, Dr. Roberts Zabels for AFM measurements and Reinis Ignatans for XRD measurements.