Search results for "backscattering"

showing 10 items of 42 documents

Characterization of alpha sources by Rutherford backscattering spectrometry

1996

Radioactive sources for alpha spectrometry are usually prepared by electrodeposition onto stainless steel backings (and sometimes heated). In earlier work, using the conventional method with passivated implanted planar silicon detectors for the measurements, several sources had been characterized in terms of various parameters by fitting the data of each spectrum to a certain mathematical function. In the present work, the Rutherford Backscattering Spectrometry (RBS) technique with a 1.6 MeV He+ beam was used to study the influence of those factors on the surface distribution and depth profiles of the thin radionuclide layers. Simulations of the measurements using the RUMP computer code wer…

PhysicsNuclear and High Energy PhysicsPlanarSiliconchemistryAlpha spectrometryDetectorchemistry.chemical_elementAtomic physicsRutherford backscattering spectrometryInstrumentationBeam (structure)Characterization (materials science)Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
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A semi-empirical approach for surface soil water content estimation from radar data without a-priori information on surface roughness

2006

Abstract In this study, the spatial distribution of soil water content in an agricultural area of 30 km 2 in Southern Italy has been estimated by using high-resolution space-borne Synthetic Aperture Radar data. Multi-polarised SAR images acquired during the SIR-C mission in April 1994 have been analysed by using the semi-empirical surface backscattering model derived by Oh, Y., Sarabandi K., Ulaby F.T., 1992. An empirical model and an inversion technique for radar scattering from bare soil surface. IEEE Trans. Geosci. Remote Sensing, 30(2), 370381. A site-specific calibration procedure of the cited model has been proposed to derive soil dielectric constant values without a-priori informatio…

Synthetic aperture radarHydrological modellingRadar backscatteringSurface finishSoil water contentlaw.inventionlawSoil waterSurface roughnessSettore AGR/08 - Idraulica Agraria E Sistemazioni Idraulico-ForestaliEnvironmental scienceSpatial variabilityHydrological modelRadarWater contentWater Science and TechnologyRemote sensingJournal of Hydrology
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Ion beam analysis and alpha spectrometry of sources electrodeposited on several backings

1998

Abstract Alpha sources of several activities were prepared by electrodeposition of natural uranium onto four different backings: stainless steel, Ni, Mo and Ti. The influence of the activity, the type of backing, and the process of heating the source on the energy resolution of the spectra were investigated using alpha spectrometry and Rutherford Backscattering Spectrometry (RBS) techniques. Diffusion profiles of the radioactive deposits in the backings were obtained from RBS and related to the results using alpha spectrometry

Nuclear and High Energy PhysicsIon beam analysisMaterials scienceAlpha spectrometryResolution (mass spectrometry)Radiochemistrytechnology industry and agricultureAnalytical chemistryNatural uraniumRutherford backscattering spectrometryInstrumentation
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Atomic layer deposition of Ti-Nb-O thin films onto electrospun fibers for fibrous and tubular catalyst support structures

2018

Here, the authors report on the preparation of core-shell carbon-ceramic fibrous as well as ceramic tubular catalyst supports utilizing electrospinning and atomic layer deposition (ALD). In this paper, ALD of Ti-Nb-O thin films using TiCl4, Nb(OEt)5, and H2O as precursors is demonstrated. According to the time-of-flight-elastic recoil detection analysis and Rutherford backscattering spectrometry, carbon and hydrogen impurities were relatively low, but depend on the pulsing ratio of the precursors. Optimized ALD process was used for coating of sacrificial electrospun polyvinyl alcohol (PVA) template fibers to yield tubular Ti-Nb-O structures after thermal or solution based PVA removal. Anoth…

Materials scienceCatalyst supportelectrospun fibers02 engineering and technologyThermal treatmentengineering.materialsupport structures010402 general chemistry01 natural scienceschemistry.chemical_compoundAtomic layer depositionCoatingThin filmta216ta114PolyacrylonitrileSurfaces and Interfacesatomikerroskasvatus021001 nanoscience & nanotechnologyCondensed Matter PhysicsRutherford backscattering spectrometryElectrospinningfibrous and tubular catalyst0104 chemical sciencesSurfaces Coatings and Filmsthin filmschemistryChemical engineeringatomic layer depositionengineeringohutkalvot0210 nano-technologyJournal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
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Application of non-invasive technologies in dry-cured ham: An overview

2019

Background: Dry-cured ham is one of the most valued food products by Mediterranean consumers. In this sense, the appropriate development of its different production stages is essential to ensure the quality requirements. For this reason, non-invasive technologies have gained popularity and have been reported as useful not only to ensure the food safety of different products, but also to monitor fundamental stages in the production process, such as the salting stage, to analyze the content of different compounds without sample losses, and to correct possible defects in the final product. Scope and approach: This work has been focused on summarizing the studies that describe and have successf…

Time domain reflectometry microwaveCuring (food preservation)Computer scienceDry-cured ham0404 agricultural biotechnologyLaser backscattering imagingUltrasoundAdded valueNon-invasive technologiesProcess engineeringInfrared spectroscopyData miningDry cured2. Zero hungerbusiness.industryFinal productNon invasive0402 animal and dairy scienceSalting04 agricultural and veterinary sciencesFood safety040401 food science040201 dairy & animal sciencePulse electric fieldsHigh pressureMagnetic resonanceHigh pressurebusinessFood ScienceBiotechnologyTrends in Food Science & Technology
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Broadband stimulated Raman backscattering

2016

International audience; Broadband amplification employing stimulated Raman backscattering is demonstrated. Using seed pulses with a bandwidth of about 200 nm, we study the amplification in a wide spectral range in a single laser shot. With chirped pump pulses and a Ne gas jet, we observed under optimized conditions, amplification in a range of about 80 nm, which is sufficient to support the amplification of sub-20 fs pulses. This broad amplification range is also in excellent agreement with PIC simulations. The conversion efficiency is at certain wavelengths as high as 1.2% and was measured to be better than 6×10 −3 on average.

SRBSPhysics::OpticsGeneral Physics and Astronomychemistry.chemical_element7. Clean energy01 natural sciencesElectromagnetic radiation010305 fluids & plasmaslaw.inventionNeonsymbols.namesakeOpticslaw0103 physical sciencesBroadband010306 general physicsplasmaPhysics[PHYS]Physics [physics]business.industryScatteringEnergy conversion efficiencyLaserlaserWavelengthchemistrysymbolsstimulated Raman backscatteringbusinessRaman scattering
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Vegetation index retrieval by coupling optical and SAR images

2012

Monitoring spatial and temporal variability of Vegetation Indices (VIs) is important to manage land and water resources, with significant impact on the sustainability of modern agriculture Although algorithms based on optical data give accurate products, cloud cover dramatically reduces the temporal resolution of these outputs. The launch of new Synthetic Aperture Radar (SAR) constellations such as COSMO-Skymed opened new opportunities to develop agro-hydrological applications. Indeed, these satellites may represent a suitable source of data for operational applications due to their high spatial and temporal resolutions (10 m in StripMap PingPong acquisition mode, best revisit time with 4 s…

Synthetic aperture radarMeteorologyBackscatterCloud coverSettore ICAR/02 - Costruzioni Idrauliche E Marittime E IdrologiaX bandLand coverNormalized Difference Vegetation IndexGeographyTemporal resolutionSettore AGR/08 - Idraulica Agraria E Sistemazioni Idraulico-ForestaliImage resolutionSettore ICAR/06 - Topografia E CartografiaRemote sensingNDVI crossed-polarized backscattering DEIMOS COSMO-Skymed
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Ion irradiation of AZO thin films for flexible electronics

2017

Aluminum doped Zinc oxide (AZO) is a promising transparent conductor for solar cells, displays and touch-screen technologies. The resistivity of AZO is typically improved by thermal annealing at temperatures not suitable for plastic substrates. Here we present a non-thermal route to improve the electrical and structural properties of AZO by irradiating the TCO films with O+ or Ar+ ion beams (30–350 keV, 3 × 1015–3 × 1016 ions/cm2) after the deposition on glass and flexible polyethylene naphthalate (PEN). X-ray diffraction, optical absorption, electrical measurements, Rutherford Backscattering Spectrometry and Atomic Force Microscopy evidenced an increase of the crystalline grain size and a …

Nuclear and High Energy PhysicsMaterials science02 engineering and technology01 natural sciencesSettore ING-INF/01 - ElettronicaSettore FIS/03 - Fisica Della MateriaOpticsTransparent conductive oxideElectrical resistivity and conductivity0103 physical sciencesAZO ; Transparent conductive oxide ; Ion implantationElectrical measurementsThin filmPolyethylene naphthalateFlexible and transparent electronicInstrumentationTransparent conducting filmNuclear and High Energy Physic010302 applied physicsbusiness.industryAZO021001 nanoscience & nanotechnologyRutherford backscattering spectrometryIon implantationIon implantationOptoelectronicsCrystallite0210 nano-technologybusinessPhotovoltaic
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Hydrogen influence on the structure and properties of amorphous hydrogenated carbon films deposited by direct ion beam

2008

Abstract The present work provides results for amorphous hydrogenated carbon (a-C:H) films grown by direct ion beam deposition method. Acetylene and its mixtures with hydrogen were used. The films were characterized by Rutherford backscattering spectrometry, elastic recoil detection, Raman spectroscopy, ellipsometry, infrared spectroscopy, and microhardness measurements. These techniques indicated that an admixture of hydrogen yields a lower deposition rate, a higher content of total and bounded hydrogen in the a-C:H films, and a lower film density. The optical and mechanical properties depend on both, hydrogen concentrations in the gas phase and in the films, and show a strong diamond-like…

HydrogenChemistryMetals and AlloysAnalytical chemistrychemistry.chemical_elementSurfaces and InterfacesRutherford backscattering spectrometrySurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsAmorphous solidElastic recoil detectionCondensed Matter::Materials ScienceIon beam depositionCarbon filmAmorphous carbonMaterials ChemistryPhysics::Atomic PhysicsThin filmThin Solid Films
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Influence of surface topography on depth profiles obtained by Rutherford backscattering spectrometry

2000

A method for determining correct depth profiles from samples with rough surfaces is presented. The method combines Rutherford backscattering spectrometry with atomic force microscopy. The topographical information obtained by atomic force microscopy is used to calculate the effect of the surface roughness on the backscattering spectrum. As an example, annealed Au/ZnSe heterostructures are studied. Gold grains were observed on the surfaces of the annealed samples. The annealing also caused diffusion of gold into the ZnSe. Backscattering spectra of the samples were measured with a 2 MeV 4He+ ion beam. A scanning nuclear microprobe was used to verify the results by measuring backscattering fro…

010302 applied physicsMicroprobeMaterials scienceIon beamAnnealing (metallurgy)Analytical chemistryGeneral Physics and AstronomyHeterojunction02 engineering and technologyCondensed Matter::Mesoscopic Systems and Quantum Hall Effect021001 nanoscience & nanotechnologyRutherford backscattering spectrometry01 natural sciencesSpectral lineCondensed Matter::Materials Science0103 physical sciencesSurface roughness0210 nano-technologySpectroscopyJournal of Applied Physics
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