Search results for "substrate"

showing 10 items of 1018 documents

Effects of irradiation damage on the back-scattering of electrons: silicon-implanted silicon

2007

Radiation damage in an (initially crystalline) silicon wafer was generated by microbeam implantation with 600 keV Si+ ions (fluence 5 x 1014 ions/cm²). To produce micro-areas with different degrees of damage, 14 implantations at different temperatures (between 23 and 225 °C) were done. The structural state of irradiated areas was characterized using Raman spectroscopy and electron back-scatter diffraction. All irradiated areas showed strong structural damage in surficial regions (estimated depth <1 μm), and at implant substrate temperatures of below 130 °C, the treatment has caused complete amorphization. Back-scattered electron (BSE) images exhibited that observed BSE intensities correlate…

Materials scienceSiliconAnalytical chemistrychemistry.chemical_element02 engineering and technologySubstrate (electronics)010502 geochemistry & geophysics01 natural sciencesFluencesymbols.namesakeGeochemistry and PetrologyBack-scattered electron imagesRadiation damageIrradiation0105 earth and related environmental sciencessiliconMicrobeam021001 nanoscience & nanotechnologyCrystallographyGeophysicsIon implantationchemistryelectron back-scatter diffractionradiation damageRaman spectroscopysymbols0210 nano-technologyRaman spectroscopy
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Deposition of Pt and Sn doped CeOx layers on silicon substrate

2013

Abstract Radio Frequency Magnetron Sputtering is used to elaborate CeO x layers doped with platinum and/or tin on a SiO 2 /Si substrate. Morphology, chemical composition and crystallographic structures were investigated by Transmission Electron Microscopy. The presence of nanoparticles of mainly ceria and metallic platinum is exhibited.

Materials scienceSiliconInorganic chemistryDopingchemistry.chemical_elementSurfaces and InterfacesGeneral ChemistrySubstrate (electronics)Sputter depositionCondensed Matter PhysicsSurfaces Coatings and FilmschemistryChemical engineeringTransmission electron microscopyMaterials ChemistryThin filmTinPlatinumSurface and Coatings Technology
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One-step formation of nanostructures on silicon surfaces using pure hydrogen-radical-initiated reactions

2013

One-step formation of silicon nanowires, sheets, and texture surface on a silicon substrate has been achieved using hydrogen-radical etching reactions. Metallic tungsten and for comparison purposes a tungsten hot wire, were used as catalysts for the hydrogen-molecular cracking. It was shown that a variety of surface structures on silicon such as inverted pyramid texture, V-groove texture, dense silicon nanowire growth over texture, and nanosheet structure can be obtained by controlling the process conditions. The obtained results suggested that the formation of nanotungsten silicide particle is an essential prerequisite to obtain these structures. The particles work as an etching mask again…

Materials scienceSiliconNanowireNanocrystalline siliconchemistry.chemical_elementNanotechnologySurfaces and InterfacesSubstrate (electronics)TungstenCondensed Matter Physics7. Clean energySurfaces Coatings and FilmsElectronic Optical and Magnetic Materialschemistry.chemical_compoundchemistryEtching (microfabrication)SilicideMaterials ChemistryTexture (crystalline)Electrical and Electronic Engineeringphysica status solidi (a)
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Electron-phonon heat transport and electronic thermal conductivity in heavily doped silicon-on-insulator film

2003

Electron–phonon interaction and electronic thermal conductivity have been investigated in heavily doped silicon at subKelvin temperatures. The heat flow between electron and phonon systems is found to be proportional to T6. Utilization of a superconductor–semiconductor–superconductor thermometer enables a precise measurement of electron and substrate temperatures. The electronic thermal conductivity is consistent with the Wiedemann–Franz law. Peer reviewed

Materials scienceSiliconPhononphononsGeneral Physics and AstronomySilicon on insulatorchemistry.chemical_elementSubstrate (electronics)dopingsuperconductorsCondensed Matter::Materials ScienceThermal conductivityCondensed Matter::Superconductivitythermal conductivitySOICondensed matter physicsPhysicsDopingelectronsThermal conductionCondensed Matter::Mesoscopic Systems and Quantum Hall EffectWiedemann-Franz lawsilicon-on-insulatorchemistryelectron-phonon interactionssilicon dopingelemental semiconductorsWiedemann–Franz lawheat transportheavily doped semiconductors
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Effect of germanium addition on the properties of reactively sputtered ZrN films

2005

For the first time, Zr-Ge-N films were deposited on silicon and steel substrates by sputtering a Zr-Ge composite target in reactive Ar-N2 mixture. The films were characterised by electron probe microanalysis, X-ray diffraction, micro-Raman spectroscopy and depth-sensing indentation. The effects of the Ge content and substrate bias voltage on the films' structure, internal stress, hardness and oxidation resistance were investigated. Substrate bias strongly influenced the chemical composition of the films being observed by means of a steep decrease in the Ge content for negative bias voltages higher than -80 V. In these cases, a significant hardness improvement was registered. For -100 V bias…

Materials scienceSiliconReactive sputteringMetals and Alloyschemistry.chemical_elementMineralogyGermaniumSurfaces and InterfacesSubstrate (electronics)Surfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsAmorphous solidTetragonal crystal systemchemistryHardnessSputteringOxidationCavity magnetronMaterials ChemistryCubic zirconiaComposite materialThin Solid Films
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Changes in Amorphous Hydrogenated Carbon Films by Ultraviolet and Infrared Laser Irradiation

2013

Amorphous hydrogenated carbon lms were formed on the Si (100) wafers by a direct-ion beam deposition method from pure acetylene and acetylene hydrogen gas mixtures. The lms were irradiated with a nanosecond Nd:YAG laser working at the rst harmonics (λ1 = 1064 nm), the fourth harmonics (λ4 = 266 nm) or with a Nd:YVO4 laser working at the third harmonic (λ3 = 355 nm). The lms were studied by the Raman scattering, micro-Fourier transform infrared and Fourier transform infrared spectroscopies, null-ellipsometry, optical and scanning electron microscope, and Vickers hardness method. Irradiation by the wavelength λ1 = 1064 nm leads to graphitization and formation of the silicon carbide, because o…

Materials scienceSiliconScanning electron microscopebusiness.industryFar-infrared laserGeneral Physics and Astronomychemistry.chemical_elementSubstrate (electronics)Laserlaw.inventionAmorphous solidchemistry.chemical_compoundCarbon filmchemistrylawSilicon carbideOptoelectronicsbusinessActa Physica Polonica A
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Nanostructural depth-profile and field-effect properties of poly(alkoxyphenylene-thienylene) Langmuir-Schäfer thin-films

2008

The correlations between morphological features and field-effect properties of poly(alkoxyphenylene-thiophene) thin Langmuir–Schafer film deposited on differently terminated gate dielectric surfaces, namely bare and methyl functionalized thermal silicon dioxide (t-SiO2), have been systematically studied. The film morphology has been investigated at different film thickness by Scanning Force Microscopy. Films thicker than a few layers show comparable morphology on both dielectric surfaces while differences are seen for the ultra-thin polymer deposit in close proximity to the substrate. Such deposit is notably more heterogeneous on bare t-SiO2, while a more compact and uniform nanogranular st…

Materials scienceSiliconSilicon dioxideGate dielectricField effectchemistry.chemical_elementConducting polymersNanotechnologySubstrate (electronics)Dielectricchemistry.chemical_compoundMaterials ChemistryComposite materialThin filmConductive polymerLangmuir-Schäfer organic thin-filmsOrganic–inorganic interfaceConducting polymers; Langmuir-Schäfer organic thin-films; Organic field effect transistors; Organic-inorganic interfaceOrganic-inorganic interfaceConducting polymerLangmuir–Schäfer filmMetals and AlloysSurfaces and InterfacesSurfaces Coatings and FilmsElectronic Optical and Magnetic Materialstransistors thin films nanotechnology Langmuir-ShaeferchemistryOrganic field effect transistorsOrganic field effect transistor
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Silicon Single Electron Transistors with Single and Multi Dot Characteristics

2000

AbstractSilicon single electron transistors (SET) with side gate have been fabricated on a heavily doped silicon-on-insulator (SOI) substrate. Samples demonstrate two types of characteristics: some of them demonstrate multiple dot behavior and one demonstrates single dot behavior in a wide temperature range. SETs demonstrate oscillations of drain-source current and changes in the width of the Coulomb blockade region with change of gate voltage at least up to 100 K. At temperature below 20 K long-term oscillations (relaxation) of source-drain current after switching the gate voltage has been observed in both multiple dot and single dot samples. Illumination affects both the characteristics o…

Materials scienceSiliconbusiness.industryTransistorCoulomb blockadechemistry.chemical_elementSilicon on insulatorSubstrate (electronics)Condensed Matter::Mesoscopic Systems and Quantum Hall EffectNoise (electronics)law.inventionchemistrylawOptoelectronicsbusinessAND gateVoltageMRS Proceedings
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Single electron transistor fabricated on heavily doped silicon-on-insulator substrate

2001

Experiments on side-gated silicon single electron transistors (SET) fabricated on a heavily doped thin silicon-on-insulator substrate are reported. Some of the devices showed single-island-like and some multi-island-like behaviour, but the properties of individual samples changed with time. Single-electron gate modulation was observable up to T=100 K, at least. A slow response of SET current to a large change in gate voltage was observed, but the process speeded up under illumination.

Materials scienceSiliconbusiness.industryTransistorDopingGeneral EngineeringGeneral Physics and AstronomySilicon on insulatorCoulomb blockadechemistry.chemical_elementNanotechnologySubstrate (electronics)Hardware_PERFORMANCEANDRELIABILITYGate voltagelaw.inventionchemistryModulationlawHardware_INTEGRATEDCIRCUITSOptoelectronicsbusinessHardware_LOGICDESIGNJapanese Journal of Applied Physics
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The synthesis of matrices of embedded semiconducting nanowires.

2004

In this work we report how single crystal nanowires can be assembled into regular arrays using mesoporous thin films to define the architecture. Mesoporous thin films were prepared by a sol-gel method. These provide films of very regular structure and dimensions. The films produced in this way have almost single crystal like structures and can also exhibit strong epitaxy to the underlying silicon substrate. The films are subjected to a supercritical fluid (SCF) environment in which a precursor is decomposed to yield nanowires of metals, semiconductors or oxides. Using these SCF conditions, pore filling is complete and the products are nanowires which are single crystals and structurally ali…

Materials scienceSiliconchemistryNanowirechemistry.chemical_elementNanotechnologySubstrate (electronics)Physical and Theoretical ChemistryThin filmVapor–liquid–solid methodEpitaxyMesoporous materialSingle crystalFaraday discussions
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