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RESEARCH PRODUCT

Direct Ionization Impact on Accelerator Mixed-Field Soft-Error Rate

Luigi Salvatore EspositoSalvatore DanzecaPedro Martin-holgadoDan AlexandrescuR. GaillardArto JavanainenGiuseppe LernerHeikki KettunenHelmut PuchnerNourdine KerboubMaximilien GlorieuxMaria KastriotouVanessa WyrwollMarkus BruggerCesar BoatellaFrédéric WrobelMatteo CecchettoPablo Fernandez-martinezYolanda MorillaFrancesco CeruttiAndrea CononettiMaris TaliRuben Garcia AliaAngelo InfantinoSimone GilardoniVeronique Ferlet-cavroisCarlo Cazzaniga

subject

PhysicsNuclear and High Energy PhysicsRange (particle radiation)Large Hadron ColliderField (physics)010308 nuclear & particles physicsMonte Carlo methodAccelerators and Storage Rings01 natural sciences7. Clean energyComputational physicsSoft errorNuclear Energy and EngineeringIonization0103 physical sciencesNeutronLimit (mathematics)Electrical and Electronic Engineering

description

We investigate, through measurements and simulations, the possible direct ionization impact on the accelerator soft-error rate (SER), not considered in standard qualification approaches. Results show that, for a broad variety of state-of-the-art commercial components considered in the 65-16-nm technological range, indirect ionization is still expected to dominate the overall SER in the accelerator mixed-field. However, the derived critical charges of the most sensitive parts, corresponding to ~0.7 fC, are expected to be at the limit of rapid direct ionization dominance and soft-error increase.

yearjournalcountryeditionlanguage
2020-01-01IEEE Transactions on Nuclear Science
https://doi.org/10.1109/tns.2019.2951307