Search results for "Deposit"

showing 10 items of 1447 documents

Fault rate controls on carbonate gravity-flow deposits of the Liassic of Central High Atlas (Morocco).

2013

21 pages; International audience; The aim of this work is to describe and to explore linkages between fault activity and gravity-related sedimentary deposits during the early rifting of a carbonate depositional system. The study area, located at the southern edge of Central High Atlas (Morocco), hosts 900 m thick Liassic gravity-related sedimentary deposits, preserved at the hanging wall of one of the possibly inherited, reactivated Hercynian faults (Tizi n'Firest fault). This study documents gravity-flow deposits constrained by a highresolution biostratigraphic framework (ca. 100 ka). These gravity-flow deposits evolve over time. Unstratified conglomerate beds are limited to the Sinemurian…

Depositional mechanisms010506 paleontologyBouma sequenceStratigraphyFault (geology)010502 geochemistry & geophysicsOceanography[ SDU.STU.ST ] Sciences of the Universe [physics]/Earth Sciences/Stratigraphy01 natural sciencesConglomerateSedimentary depositional environmentDepositional environmentsLiassicPaleontologyPhanerozoic0105 earth and related environmental sciencesgeographygeography.geographical_feature_categoryGeologyTurbiditeMoroccoGeophysicsFault rate[SDU.STU.ST]Sciences of the Universe [physics]/Earth Sciences/StratigraphyClastic rockCarbonate gravity-flow depositsEconomic GeologySedimentary rockCentral High AtlasGeology
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Growth of nanometric CuGaxOystructures on copper substrates

2005

This paper presents an alternative method based on the metal–organic chemical vapour deposition technique to obtain new nanowire structures. Here, the metal–organic precursor acts as a catalyst and interacts with a metallic substrate to produce 3D structures such as nanowires. In the present case, trimethyl gallium interacts with a copper metallic substrate to build a single-crystalline CuGaxOy wire structure. Electronic microscopy techniques on image or diffraction modes have provided the structural and chemical characterization of the obtained nanowires.

DiffractionAlternative methodsMaterials scienceMechanical EngineeringNanowirechemistry.chemical_elementBioengineeringNanotechnologyGeneral ChemistryChemical vapor depositionCopperCatalysisCharacterization (materials science)chemistryMechanics of MaterialsGeneral Materials ScienceElectrical and Electronic EngineeringGalliumNanotechnology
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Structure determination of thin CoFe films by anomalous x-ray diffraction

2012

This work reports on the investigation of structure-property relationships in thin CoFe films grown on MgO. Because of the very similar scattering factors of Fe and Co, it is not possible to distinguish the random A2 (W-type) structure from the ordered B2 (CsCl-type) structure with commonly used x-ray sources. Synchrotron radiation based anomalous x-ray diffraction overcomes this problem. It is shown that as grown thin films and 300 K post annealed films exhibit the A2 structure with a random distribution of Co and Fe. In contrast, films annealed at 400 K adopt the ordered B2 structure.

DiffractionCrystallographyMaterials scienceAnnealing (metallurgy)ScatteringX-ray crystallographyAnalytical chemistryGeneral Physics and AstronomySynchrotron radiationCrystal structureSputter depositionThin filmJournal of Applied Physics
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A comparative study of heterostructured CuO/CuWO4 nanowires and thin films

2017

Authors are grateful to Reinis Ignatans for XRD measurements.

DiffractionMaterials scienceAnnealing (metallurgy)NanowireNanotechnology02 engineering and technology010402 general chemistry01 natural sciences7. Clean energyInorganic ChemistryA1. Nanostructures:NATURAL SCIENCES:Physics [Research Subject Categories]Materials ChemistryThin filmSpectroscopyA1. Crystal morphologyB1. OxidesB1. TungstatesHeterojunctionA1. CharacterizationSputter deposition021001 nanoscience & nanotechnologyCondensed Matter Physics0104 chemical sciencesAmorphous solidChemical engineering0210 nano-technologyJournal of Crystal Growth
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RF magnetron-sputtered coatings deposited from biphasic calcium phosphate targets for biomedical implant applications

2017

Bioactive calcium phosphate coatings were deposited by radio-frequency magnetron sputtering from biphasic targets of hydroxyapatite and tricalcium phosphate, sintered at different mass % ratios. According to Raman scattering and X-ray diffraction data, the deposited hydroxyapatite coatings have a disordered structure. High-temperature treatment of the coatings in air leads to a transformation of the quasi-amorphous structure into a crystalline one. A correlation has been observed between the increase in the Ca content in the coatings and a subsequent decrease in Ca in the biphasic targets after a series of deposition processes. It was proposed that the addition of tricalcium phosphate to th…

DiffractionMaterials scienceBiocompatibilityBiomedical Engineeringchemistry.chemical_elementBiphasic hydroxyapatite-tricalcium02 engineering and technologyCalciumengineering.material010402 general chemistryPlasma coatings01 natural sciencesArticleBiomaterialssymbols.namesakeCoatinglcsh:TA401-492Biphasic hydroxyapatite-tricalcium phosphate targetsThin hydroxyapatite coatingslcsh:QH301-705.5Deposition (law)phosphate targetsMetallurgySputter deposition021001 nanoscience & nanotechnology0104 chemical scienceschemistryChemical engineeringlcsh:Biology (General)Cavity magnetronsymbolsengineeringBiocompatibilitylcsh:Materials of engineering and construction. Mechanics of materialsRF-magnetron sputtering0210 nano-technologyRaman scatteringBiotechnologyBioactive Materials
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Epitaxial growth and thermoelectric properties of TiNiSn and Zr0.5Hf0.5NiSn thin films

2011

Abstract Due to their exceptional thermoelectric properties Half-Heusler alloys like MNiSn (M = Ti,Zr,Hf) have moved into focus. The growth of single crystalline thin film TiNiSn and Zr 0.5 Hf 0.5 NiSn by dc magnetron sputtering is reported. Seebeck and resistivity measurements were performed and their dependence on epitaxial quality is shown. Seebeck coefficient, specific resistivity and power factor for Zr 0.5 Hf 0.5 NiSn at room temperature were measured to be 63 μV K − 1 , 14.1 μΩ m and 0.28 mW K − 2  m − 1 , respectively. Multilayers of TiNiSn and Zr 0.5 Hf 0.5 NiSn are promising candidates to increase the thermoelectric figure-of-merit by decreasing thermal conductivity perpendicular …

DiffractionMaterials scienceCondensed matter physicsMetals and AlloysSurfaces and InterfacesSputter depositionEpitaxySurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsThermal conductivityElectrical resistivity and conductivitySeebeck coefficientThermoelectric effectMaterials ChemistryThin filmThin Solid Films
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Growth and characterization of Mg 1‐x Cd x O thin films

2016

In this paper, we study the growth of thin films of the Mg1–xCdxO alloy in the Mg-rich range of compositions by using the metal organic chemical vapour deposition (MOCVD) method at low pressure. X-ray diffraction (XRD) has been used to analyse the compound formation and the progressive incorporation of Cd2+ ions into the cubic MgO lattice. Both, layers with a single-cubic phase of Mg1–xCdxO and layers with a phase separation, where Cd1–xMgxO and Mg1–xCdxO coexist, have been studied. Finally, a morphological study of the layers has been carried out by using scanning electron microscopy (SEM) and the layers' composition has been measured by energy dispersive X-ray analysis (EDX). (© 2016 WILE…

DiffractionMaterials scienceScanning electron microscopeAlloyAnalytical chemistry02 engineering and technologyChemical vapor depositionengineering.material010402 general chemistry021001 nanoscience & nanotechnologyCondensed Matter Physics01 natural sciences0104 chemical sciencesMetalvisual_artPhase (matter)visual_art.visual_art_mediumengineeringMetalorganic vapour phase epitaxyThin film0210 nano-technologyphysica status solidi c
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Structural characterization of TiNxOy/TiO2 single crystalline and nanometric multilayers grown by LP-MOCVD on (110)TiO2

2001

TiO2/TiNxOy superlattices were grown by Low Pressure-Metal-Organic Vapor Phase Epitaxy (LP-MOVPE) technique at deposition temperatures ranking from 650 to 750°C. The growth was performed on top of TiO2(110) rutile substrates. Intense peaks observed in the X-rays rocking curves and θ-2θ diffraction patterns show the presence of crystalline epilayers. The TiNxOy layers were grown in a (200) cubic structure on the (110) quadratic TiO2 epilayer structure. Transmission electron microscopy confirmed the XRD results and showed the formation of periodic and well structured epilayers.

DiffractionMaterials scienceSuperlatticeMetals and AlloysAnalytical chemistryMineralogySurfaces and InterfacesEpitaxySurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsCharacterization (materials science)Transmission electron microscopyRutileMaterials ChemistryMetalorganic vapour phase epitaxyDeposition (law)Thin Solid Films
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Preparation and Characterization of Tin Tungstate Thin Films

2015

Tin tungstate thin films were prepared by dc magnetron sputtering method and studied by x-ray diffraction, confocal microscopy and Raman spectroscopy. It is shown that the films are composed mainly of nanocrystalline α-SnWO4 phase. The possibility to use these films as write-once optical recording media is demonstrated.

DiffractionMaterials sciencebusiness.industrySputter depositionCondensed Matter PhysicsNanocrystalline materialElectronic Optical and Magnetic MaterialsCharacterization (materials science)symbols.namesakePhase (matter)Optical recordingsymbolsOptoelectronicsThin filmRaman spectroscopybusinessFerroelectrics
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Thermal conductivity of half-Heusler superlattices

2014

Thin films and superlattices (SLs) of TiNiSn and ZrHfNiSn layers have been grown by dc magnetron sputtering on MgO (100) substrates to reduce the thermal conductivity, aiming for improvement of the thermoelectric figure of merit ZT. The thermal conductivity of 1 Wm−1K−1 was measured by the differential 3ω method for an SL with a periodicity of 8.8 nm. In addition to x-ray diffraction analysis of the SL crystal structure, smooth interfaces were confirmed by scanning/transmission electron microscopy.

DiffractionMaterials sciencebusiness.industrySuperlatticeCrystal structureSputter depositionCondensed Matter PhysicsElectronic Optical and Magnetic MaterialsThermoelectric figure of meritThermal conductivityTransmission electron microscopyMaterials ChemistryOptoelectronicsElectrical and Electronic EngineeringThin filmbusinessSemiconductor Science and Technology
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