6533b7d9fe1ef96bd126d4e9

RESEARCH PRODUCT

Retention of Pb isotopes in glass surfaces for retrospective assessment of radon exposure

Ari VirtanenJussi HuikariKai ArstilaPasi JalkanenJuha ÄYstöIain MooreI. RiihimäkiL. KarlssonV. TouboltsevJyrki RäisänenHeikki PenttiläHarry J. WhitlowHarry J. WhitlowJörgen EkmanMasoud MohsenpourHeikki KettunenA. NieminenJ Helgesson

subject

Arrhenius equationNuclear and High Energy PhysicsIsotopeAnnealing (metallurgy)Radiochemistrychemistry.chemical_elementRadon01 natural sciences030218 nuclear medicine & medical imagingRadon exposureIon03 medical and health sciencessymbols.namesake0302 clinical medicineRecoilchemistrySputtering0103 physical sciencessymbols010306 general physicsInstrumentation

description

Abstract In recent years there has been increasing interest in radio-epidemiological techniques to retrospectively measure the radon dose exposure by determining the activity of 210Pb, the longest-lived 222Rn progeny, in glass surface layers. In this study the diffusion of 39 keV 209Pb+ ions implanted into glass using the IGISOL facility has been studied under conditions that mimic the recoil implantation of 210Pb from 222Rn. The resulting depth distributions of 209Pb were then measured after heat treatment in vacuum at different temperatures by a sputter erosion technique. The diffusion coefficient could be described by an Arrhenius equation D = D0exp(−H/kT) where D 0 = 0.30 - 0.24 + 1.14 m 2 s - 1 and H = 2.81 ± 0.11 eV. No statistically significant loss of 209Pb from the sample was observed for annealing between 470 and 600 °C.

https://doi.org/10.1016/j.nimb.2006.03.049